• 생명과학회지
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• 제12권2호
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• pp.208-212
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• 2002

온도 기울기 전기영동장치를 이용하여 d(CXG)와 d(GXC) 염기의 열 안정성을 결정하는데 사람의 $\varepsilon$-글로빈 DNA조각을 사용하였다. 염기 쌍의 안정성은 이웃하는 염기서열에 의한 수소결합과 base stocking 상호작용에 의존한다. 염기 쌍의 안정성은 d(CXG) d(CYG)의 경우에 T.AG.A = A.G>C.T>T.C>C.A>A.C이다.

• 한국정보과학회논문지:시스템및이론
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• 제36권5호
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• pp.344-350
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• 2009

본 논문에서는 오드 연결망을 기반으로 하는 새로운 상호연결망, 계층적 오드 연결망 HON($C_d,C_d$)을 제안한다. 그리고 HON($C_d,C_d$)의 여러 가지 망성질(연결도, 라우팅 알고리즘, 지름, 방송 등)을 분석한다. 본 논문에서 제안한 HON($C_d,C_d$)가 오드 연결망과 HCN(m,m), HFN(m,m)보다 우수한 연결망임을 보인다.

• Journal of applied mathematics & informatics
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• 제42권3호
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• pp.511-520
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• 2024

In this paper, we introduce the concept of split and non-split tree (D, C)- set of a connected graph G and its associated color variable, namely split tree (D, C) number and non-split tree (D, C) number of G. A subset S ⊆ V of vertices in G is said to be a split tree (D, C) set of G if S is a tree (D, C) set and ⟨V - S⟩ is disconnected. The minimum size of the split tree (D, C) set of G is the split tree (D, C) number of G, γ_χST (G) = min{|S| : S is a split tree (D, C) set}. A subset S ⊆ V of vertices of G is said to be a non-split tree (D, C) set of G if S is a tree (D, C) set and ⟨V - S⟩ is connected and non-split tree (D, C) number of G is γ_χST (G) = min{|S| : S is a non-split tree (D, C) set of G}. The split and non-split tree (D, C) number of some standard graphs and its compliments are identified.

• 대한수학회지
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• 제45권1호
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• pp.249-271
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• 2008

We prove the Hyers-Ulam stability of linear d-isometries in linear d-normed Banach modules over a unital $C^*-algebra$ and of linear isometries in Banach modules over a unital $C^*-algebra$. The main purpose of this paper is to investigate d-isometric $C^*-algebra$ isomor-phisms between linear d-normed $C^*-algebras$ and isometric $C^*-algebra$ isomorphisms between $C^*-algebras$, and d-isometric Poisson $C^*-algebra$ isomorphisms between linear d-normed Poisson $C^*-algebras$ and isometric Poisson $C^*-algebra$ isomorphisms between Poisson $C^*-algebras$. We moreover prove the Hyers-Ulam stability of their d-isometric homomorphisms and of their isometric homomorphisms.

• 대한수학회보
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• 제37권4호
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• pp.803-810
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• 2000

Let N($d_1,...,{\;}d_n;c_1,...,{\;}c_n$) be the number of solutions $(x_1,...,{\;}x_n){\in}F^{n}_p$ of the diagonal equation $c_lx_1^{d_1}+c_2x_2^{d_2}+{\cdots}+c_nx_n^{d_n}{\;}={\;}0{\;}n{\geq},{\;}c_j{\;}{\in}{\;}F^{*}_q,{\;}j=1,2,...,{\;}n$ where $d_j{\;}>{\;}1{\;}and{\;}d_j{\;}$\mid${\;}q{\;}-{\;}1$ for all j = 1,2,..., n. In this paper, we find all n-tuples ($d_1,...,{\;}d_n$) such that the reduced form of ($d_1,...,{\;}d_n$) and N($d_1,...,{\;}d_n;c_1,...,{\;}c_n$) are the same as in the theorem obtained by Sun Qi [3]. Improving this, we also get an explicit formula for the number of solutions of the diagonal equation, unver a certain natural restriction on the exponents.

• Korean Journal of Mathematics
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• 제27권2호
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• pp.437-444
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• 2019

For c > -1, let ${\nu}_c$ denote a weighted radial measure on ${\mathbb{C}}$ normalized so that ${\nu}_c(D)=1$. For $c_1,c_2>-1$ and $f{\in}L^1(D^2,\;{\nu}_{c_1}{\times}{\nu}_{c_2})$, we define the weighted Berezin transform $B_{c_1,c_2}f$ on $D^2$ by $$(B_{c_1,c_2})f(z,w)={\displaystyle{\smashmargin2{\int\nolimits_D}{\int\nolimits_D}}}f({\varphi}_z(x),\;{\varphi}_w(y))\;d{\nu}_{c_1}(x)d{\upsilon}_{c_2}(y)$$. This paper is about the space $M^p_{c_1,c_2}$ of function $f{\in}L^p(D^2,\;{\nu}_{c_1}{\times}{\nu}_{c_2})$ ) satisfying $B_{c_1,c_2}f=f$ for $1{\leq}p<{\infty}$. We find the identity operator on $M^p_{c_1,c_2}$ by using invariant Laplacians and we characterize some special type of functions in $M^p_{c_1,c_2}$.

• 한국진공학회지
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• 제5권3호
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• pp.229-238
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• 1996

The electromigration phenomena and the characterizations of the conductor lifetime (Time-To-Failure, TTF) in Al-1%Si thin film interconnections under D.C. and Pulsed D.C. conditions were investigated . Meander type test patterns were fabricated with the dimensions of 21080$mu \textrm{m}$ length, 3$\mu\textrm{m}$ width, 0.7$\mu\textrm{m}$ thickness and the 0.1$\mu\textrm{m}$/0.8$\mu\textrm{m}$($SiO_2$/PSG)dielectric overlayer. The current densities of $2 \times10^6 A/\textrm{cm}^2$ and $1 \times10^7 A/\textrm{cm}^2$ were stressed in Al-1%Si thin film interconnection s under a D.C. condition. The peak current densities of $2 \times10^6 A/\textrm{cm}^2$ and $1 \times10^7 A/\textrm{cm}^2$ were also applied under a Pulsed D.C. condition at frequencies of 200KHz, 800KHz, 1MHz, and 4MHz with the duty factor of 0.5. THe time-to-failure under a Pulsed D.C.($TTF_{pulsed D.C}$) was appeared to be larger than that under a D.C. condition. It was found that the TTF under both a D.C. and a Pulsed D.C. condition. It was found that the TTF under both a D.C. and a Pulsed D.C. condition largely depends upon the appiled current densities respectively . This can be explained by a relaxation mechanism view due to a duty cycle under a Pulsed D.C. related to the wave on off. The relaxation phenomena during the pulsed off period result in the decayof excess vacancies generated in the Al-1%Si thin film interconnections because of the electrical and mechanical stress gradient . Hillocks and voids formed by an electromigration were observed by using a SEM (Scanning Electron Microscopy).

• Korean Journal of Mathematics
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• 제18권4호
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• pp.335-342
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• 2010

Let D be an integral domain with quotient field K,$\mathcal{I}(D)$ be the set of nonzero ideals of D, and $w$ be the star-operation on D defined by $I_w=\{x{\in}K{\mid}xJ{\subseteq}I$ for some $J{\in}\mathcal{I}(D)$ such that J is finitely generated and $J^{-1}=D\}$. The D is called a Pr$\ddot{u}$fer $v$-multiplication domain if $(II^{-1})_w=D$ for all nonzero finitely generated ideals I of D. In this paper, we show that D is a Pr$\ddot{u}$fer $v$-multiplication domain if and only if $(A{\cap}(B+C))_w=((A{\cap}B)+(A{\cap}C))_w$ for all $A,B,C{\in}\mathcal{I}(D)$, if and only if $(A(B{\cap}C))_w=(AB{\cap}AC)_w$ for all $A,B,C{\in}\mathcal{I}(D)$, if and only if $((A+B)(A{\cap}B))_w=(AB)_w$ for all $A,B{\in}\mathcal{I}(D)$, if and only if $((A+B):C)_w=((A:C)+(B:C))_w$ for all $A,B,C{\in}\mathcal{I}(D)$ with C finitely generated, if and only if $((a:b)+(b:a))_w=D$ for all nonzero $a,b{\in}D$, if and only if $(A:(B{\cap}C))_w=((A:B)+(A:C))_w$ for all $A,B,C{\in}\mathcal{I}(D)$ with B, C finitely generated.

• Korean Journal of Mathematics
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• 제19권1호
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• pp.17-24
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• 2011

Let X, Y be vector spaces. It is shown that if an even mapping $f:X{\rightarrow}Y$ satisfies f(0) = 0, and $$2(_{2d-2}C_{d-1}-_{2d-2}C_d)f\({\sum_{j=1}^{2d}}x_j\)+{\sum_{{\iota}(j)=0,1,{{\small\sum}_{j=1}^{2d}}{\iota}(j)=d}}\;f\({\sum_{j=1}^{2d}}(-1)^{{\iota}(j)}x_j\)=2(_{2d-1}C_d+_{2d-2}C_{d-1}-_{2d-2}C_d){\sum_{j=1}^{2d}}f(x_j)$$ for all $x_1$, ${\cdots}$, $x_{2d}{\in}X$, then the even mapping $f:X{\rightarrow}Y$ is quadratic. Furthermore, we prove the Hyers-Ulam stability of the above functional equation in Banach spaces.

• Korean Journal of Mathematics
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• 제20권4호
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• pp.371-379
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• 2012

Let D be an integral domain, $\bar{D}$ be the integral closure of D, * be a star operation of finite character on D, $*_w$ be the so-called $*_w$-operation on D induced by *, X be an indeterminate over D, $N_*=\{f{\in}D[X]{\mid}c(f)^*=D\}$, and $Kr(D,*)=\{0\}{\cup}\{\frac{f}{g}{\mid}0{\neq}f,\;g{\in}D[X]$ and there is an $0{\neq}h{\in}D[X]$ such that $(c(f)c(h))^*{\subseteq}(c(g)c(h))^*$}. In this paper, we show that D is a *-quasi-Pr$\ddot{u}$fer domain if and only if $\bar{D}[X]_{N_*}=Kr(D,*_w)$. As a corollary, we recover Fontana-Jara-Santos's result that D is a Pr$\ddot{u}$fer *-multiplication domain if and only if $D[X]_{N_*} = Kr(D,*_w)$.