• 한국안전학회지
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• 제34권5호
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• pp.31-36
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• 2019

This study made a testing device to evaluate the distribution board management system. Power was supplied to the testing device using a loading-back method and the voltage applied to it was 440 V at the same turn ratio. When the human body electric shock current is 30 mA, the breaking time is set to be less than 240 ms while 30~45 mA current is flowing. The test result shows that in the case of the R-phase it was measured to be 5.19 Hz (193 ms). And the S-phase and T-phase were perfectly cut off at 5.39 Hz (186 ms) and 5.71 Hz (175 ms), respectively. When the human body electric shock current is 60mA, the breaking time is set to be less than 120 ms while 45~75 mA current is flowing. The test result shows that the R-phase, S-phase, and T-phase were accurately cut off at 8.39 Hz (11 ms), 8.87Hz (113 ms) and 9.69 Hz (103 ms), respectively. When the human body electric shock current is 90 mA, the breaking time is set to be less than 48 ms while 75 mA current is flowing. The test result shows that the R-phase, S-phase, and T-phase were accurately cut off at 19.8 Hz (50.4 ms), 16.9 Hz (59.2 ms), and 17.9 Hz (56.0 ms), respectively. That is, the developed testing device satisfied all the requirements of the distribution board evaluation criteria, and it becomes available for the performance evaluation of the distribution board management system.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 학술회의 논문집 정보 및 제어부문 A
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• pp.271-274
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• 2003

This paper presents a Built-in Current Sensor that detect defects in CMOS integrated circuits using the current testing technique. This scheme employs a cross-coupled connected PMOS transistors, it is used as a current comparator. Our proposed scheme is a negligible impart on the performance of the circuit undo. test (CUT). In addition, in the normal mode of the CUT not dissipation extra power, high speed detection time and applicable deep submicron process. The validity and effectiveness are verified through the HSPICE simulation on circuits with defects. The entire area of the test chip is $116{\times}65{\mu}m^2$. The BICS occupies only $41{\times}17{\mu}m^2$ of area in the test chip. The area overhead of a BICS versus the entire chip is about 9.2%. The chip was fabricated with Hynix $0.35{\mu}m$ 2-poly 4-metal N-well CMOS technology.

• 한국컴퓨터정보학회논문지
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• 제6권1호
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• pp.7-13
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• 2001

VLSI의 집적도가 증가함에 따라 설계와 제조과정에서 기존의 논리 테스트 방법으로는 검출하기 어려운 고장들이 발생하고 있다. 최근에는 이러한 고장을 검출하기 위한IDDQ 테스팅 방법의 중요성이 증대되고 있다. 본 논문에서는 CMOS 회로내에서 IDDQ 값을 검사하여 고장의 유무를 검사하는 전류 테스팅 기법에 사용될 수 있는 새로운 전류감지기를 제안한다. 본 논문에서 제안된 전류감지기는 자기저항 소자 MR 전류감지기, 레벨변환기, 비교기로 구성되어 있으며 자동으로 고장을 검출할 수 있다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 A
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• pp.466-467
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• 2006

Several synthetic testing methods have widely been used for the performance evaluation of ultra high-voltage circuit breaker. Among these synthetic method, in the paper, capacitance switching testing method which can meet the test requirements and increase the testing capacity has been proposed. This method is made up of two separated sources of short-circuit generator for current source and L-C resonance circuit for voltage source. By using this method, KERI will perform the performance evaluation of capacitive current switching performance for the 800kV GCB(Gas Circuit Breaker).

• 대한전기학회:학술대회논문집
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• 대한전기학회 2002년도 추계학술대회 논문집 전기기기 및 에너지변환시스템부문
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• pp.154-156
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• 2002

본 논문은 저압 차단기에 적용되는 IEC 60947-2 (Circuit breakers)와 전류고조파(Current harmonic) 내성시험 규격인 IEC 61000-3-2. IEC 61000-3-4에 대한 규격의 적용범위, 시험범위, 고조파에 대한 개념, 차단기의 고조파에 대한 영향 및 시험설비의 요구조건을 고찰하고, 16A 초과 전류 고조파 시험적용 방법과 시험결과를 고찰하고자 한다.

• 센서학회지
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• 제7권3호
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• pp.203-210
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• 1998

An experimental study of an eddy current nondestructive testing system to measure dimensions of cylindrical metallic rods, such as cross-sectional area or diameter, is presented. Impedance characteristics of a solenoid sensor, which are generally based on Maxwell's equations in electromagnetic field, are briefly discussed for inspecting geometrical parameters of the coil sensor and testing materials. A measurement system for detecting the diameter of the metallic rod is implemented. This instrument has capabilities for detecting the sensor output signals and estimating demensions of the testing material, continuously. As a result, it was shown that the eddy current sensor with an encircling coil could estimate the diameter of metallic rod. The implemented measurement system gives accurate information for inspecting the dimension of conducting rod with good sensitivity.

• 비파괴검사학회지
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• 제36권6호
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• pp.490-495
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• 2016

펄스와전류탐상에서 탐상 신호는 주로 센서코일에 유도되는 기전력의 시간에 따른 변화를 측정하여 사용되었는데, 최근에는 홀센서(Hall sensor)로 측정한 신호를 사용하는 경우도 많아지고 있다. 본 논문에서는 펄스와전류탐상에서 나타나는 홀센서 신호를 수치적으로 모델링하여 예측하였다. 이를 위해 두께 측정을 위한 탐촉자를 설계하고 먼저 계단입력전류를 사용한 수치해석을 수행하여 홀센서를 사용하였을 경우의 신호를 예측하였다. 또한, 코일을 센서로 사용하였을 경우의 신호도 동시에 계산하였다. 수치모델링 결과로 예측된 홀센서 신호들은 실험 연구를 통해 보고된 신호들과 유사한 형태를 가지고 있음을 확인할 수 있었다. 그리고 피검사체의 두께 변화에 따른 두 신호들의 특성을 분석하고 비교해 본 결과, 홀센서 신호에서는 코일센서 신호에 비해 두께 변화를 판별하기 위한 정보가 더 적게 제공된다는 것을 알 수 있었다. 펄스입력전류를 사용한 경우의 탐상 신호들도 계산해 본 결과, 두 신호 모두 사용된 펄스의 폭이 지난 시간에는 계단입력전류를 사용한 경우의 응답이 반대가 되어 감소하는 형태로 나타난다는 것을 확인할 수 있었다.

• Journal of Electrical Engineering and Technology
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• 제7권5호
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• pp.778-783
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• 2012

The synthetic short-circuit making test to adequately stress the circuit breaker has been specified as the mandatory test duty in the IEC 62271-100. The purpose of this test is to give the maximum pre-arcing energy during making operation. And this requires the making operation with symmetrical short-circuit current that is established when the breakdown between contact gap occurs near the crest of the applied voltage. Also, if the interrupting chamber of circuit breakers is designed as the type of common enclosure or the operation is made by the gang operated mechanism that three-phase contacts are operated by one common mechanism, three-phase synthetic making test is basically required. Therefore, several testing laboratories have developed and proposed their own test circuits to properly evaluate the breaker performance. With these technical backgrounds, we have developed the new alternative three-phase making circuit.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1990년도 하계학술대회 논문집
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• pp.247-249
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• 1990

Nondestructive eddy current testing has been used for measuring the electromagnetic properties of metals. It is well known that the conventional eddy current sensors are not effective to measure multi-layer properties. In this paper, the mutual inductance type sensor is studied and transformed fractions of metals are measured. Characteristic factors in eddy current testing are considered and their influences on the testing results are investigated.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2002년도 ITC-CSCC -3
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• pp.1972-1975
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• 2002

A new test approach based on a supply current test method is proposed for testing open faults in bipolar logic circuits. In the approach, only the open faults are detected by the supply current test method, which are difficult to be detected by functional test methods. The effectiveness of the approach is examined experimentally on open fault detection in TTL combinational circuits. The results shows that higher fault coverage can be established by applying a small number of test input vectors of the supply current test method after test vectors of functional test methods based on stuck-at models.