• 제목/요약/키워드: Compound failure

검색결과 141건 처리시간 0.024초

Concrete-filled rectangular hollow section X joint with Perfobond Leister rib structural performance study: Ultimate and fatigue experimental Investigation

  • Liu, Yongjian;Xiong, Zhihua;Feng, Yuncheng;Jiang, Lei
    • Steel and Composite Structures
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    • 제24권4호
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    • pp.455-465
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    • 2017
  • This paper presents a series of ultimate and fatigue experimental investigation on concrete-filled rectangular hollow section (CRHS) X joints with Perfobond Leister rib (PBR) under tension. A total of 15 specimens were fabricated, in which 12 specimens were tested under ultimate tension and 3 specimens were investigated in fatigue test. Different parameters including PBR stiffening, brace-to-chord ratio (${\beta}$) and inclined angle (${\theta}$) were considered in the test. Each joint was tested to failure under tension load. Obtained from test result, PBR was found to improve the tension strength and fatigue durability of CRHS joint substantially. Concrete dowel consisted by PBR and concrete inside the chord stiffened the joint, which leaded to a combination failure mode of punching shear and chord plastification of CRHS joint under tension. Finite element analysis validated the compound failure mode. Stress concentration on typical spot of CRHS joint was mitigated by PBR which was observed from fatigue test. Initial fatigue crack presented in CRHS joint with PBR also differentiated with the counterpart without PBR.

Critical Care Paper Review 2012

  • Sohn, Jang Won
    • Tuberculosis and Respiratory Diseases
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    • 제73권1호
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    • pp.1-10
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    • 2012
  • Care of patients with sepsis has improved over the last decade. However, in the recent two years, there was no significant progress in the development of a new drug for critically ill patients. In January 2011, it was announced that the worldwide phase 3 randomized trial of a novel anti-Toll-like receptor-4 compound, eritoran tetrasodium, had failed to demonstrate an improvement in the mortality of patients with severe sepsis. In October 2011, Xigris (drotrecogin alfa, a recombinant activated protein C) was withdrawn from the market following the failure of its worldwide trial that had attempted to demonstrate improved outcome. These announcements were disappointing. The recent failure of 2 promising drugs to further reduce mortality suggests that new approaches are needed. A study was published showing that sepsis can be associated to a state of immunosuppression and loss of immune function in human. However, the timing, incidence, and nature of the immunosuppression remain poorly characterized, especially in humans. This emphasizes the need for a better understanding of sepsis as well as new therapeutic strategies. Many clinical experiences of the extracorporeal membrane oxygenator (ECMO) treatment for adult acute respiratory distress syndrome (ARDS) patients, which is caused by the H1N1 influenza A virus, were reported. The use of ECMO in severe respiratory failure, particularly in the treatment of adult ARDS, is occurring more commonly.

혼합기체 sputtering 법으로 증착된 Cu 확산방지막으로의 Ti-Si-N 박막의 특성 연구 (A Study of Reactively Sputtered Ti-Si-N Diffusion Barrier for Cu Metallization)

  • 박상기;이재갑
    • 한국재료학회지
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    • 제9권5호
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    • pp.503-508
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    • 1999
  • We have investigated the physical and diffusion barrier property of Ti-Si-N film for Cu metallization. The ternary compound was deposited by using reactive rf magnetron sputtering of a TiSi$_2$target in an Ar/$N_2$gas mixture. Resistivities of the films were in range of 358$\mu$$\Omega$-cm, to 307941$\mu$$\Omega$-cm, and tended to increase with increasing the $N_2$/Ar flow rate ratio. The crystallization of the Ti-Si-N compound started to occur at 100$0^{\circ}C$ with the phases of TiN and Si$_3$N$_4$identified by using XRD(X-ray Diffractometer). The degree of the crystallization was influenced by the $N_2$/Ar flow ratio. The diffusion barrier property of Ti-Si-N film for Cu metallization was determined by AES, XRD and etch pit by secco etching, revealing the failure temperature of 90$0^{\circ}C$ in 43~45at% of nitrogen content. In addition, the very thin compound (10nm) with 43~45at% nitrogen content remained stable up to $700^{\circ}C$. Furthermore, thermal treatment in vacuum at $600^{\circ}C$ improved the barrier property of the Ti-Si-N film deposited at the $N_2$(Ar+$N_2$) ratio of 0.05. The addition of Ti interlayer between Ti-Si-N films caused the drastic decrease of the resistivity with slight degradation of diffusion barrier properties of the compound.

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Sn-40Pb/Cu 및 Sn-3.0Ag-0.5Cu/Cu 솔더 접합계면의 금속간화합물 형성에 필요한 활성화에너지 (Activation Energy for Intermetallic Compound Formation of Sn-40Pb/Cu and Sn-3.0Ag-0.5Cu/Cu Solder Joints)

  • 홍원식;김휘성;박노창;김광배
    • Journal of Welding and Joining
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    • 제25권2호
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    • pp.82-88
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    • 2007
  • Sn-3.0Ag-0.5Cu lead fee solder was generally utilized in electronics assemblies. But it is insufficient to research about activation energy(Q) that is applying to evaluate the solder joint reliability of environmental friendly electronics assemblies. Therefore this study investigated Q values which are needed to IMC formation and growth of Sn-3.0Ag-0.5Cu/Cu and Sn-40pb/Cu solder joints during aging treatment. We bonded Sn-3.0Ag-0.5Cu and Sn-40Pb solders on FR-4 PCB with Cu pad$(t=80{\mu}m)$. After reflow soldering, to observe the IMC formation and growth of the solder joints, test specimens were aged at 70, 150 and $170^{\circ}C$ for 1, 2, 5, 20, 60, 240, 960, 15840, 28800 and 43200 min, respectively. SEM and EDS were utilized to analysis the IMCS. From these results, we measured the total IMC$(Cu_6Sn_5+Cu_3Sn)$ thickness of Sn-3.0Ag-0.5Cu/Cu and Sn-40Pb/Cu interface, and then obtained Q values for the IMC$(Cu_6Sn_5,\;Cu_3Sn)$ growth of the solder joints.

NCF Trap이 Cu/Ni/Sn-Ag 미세범프의 Electromigration 특성에 미치는 영향 분석 (Effect of NCF Trap on Electromigration Characteristics of Cu/Ni/Sn-Ag Microbumps)

  • 류효동;이병록;김준범;박영배
    • 마이크로전자및패키징학회지
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    • 제25권4호
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    • pp.83-88
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    • 2018
  • Cu/Ni/Sn-Ag 미세범프 접합 공정후 Ni/Sn-Ag접합계면에 잔류한 비전도성 필름(non-conductive film, NCF) trap 형성이 전기적 신뢰성에 미치는 영향을 분석하기 위해 온도 $150^{\circ}C$, 전류밀도 $1.5{\times}10^5A/cm^2$ 조건에서 electromigration (EM) 신뢰성 실험을 진행하였다. EM 신뢰성 실험 결과, NCF trap이 거의 없는 Cu/Ni/Sn-Ag 미세범프가 NCF trap이 형성된 미세범프 보다 약 8배 긴 EM 수명을 보여주고 있다. 저항 변화 및 손상계면에 대한 미세구조 분석결과, Ni/Sn-Ag접합계면에 공정 이슈에 의해 형성된 NCF trap이 Ni-Sn 금속간화합물/Sn-Ag솔더계면에 보이드를 유발하여 EM 원자 확산을 방해하기 때문에 빠른 보이드 성장에 의한 전기적 손상이 일찍 발생하는 것으로 판단된다.

LTCC기판과 BGA 솔더접합부의 계면반응 및 기계적 특성 (Interfacial Reaction and Mechanical Property of BGA Solder Joints with LTCC Substrate)

  • 유충식;하상수;김배균;장진규;서원찬;정승부
    • 대한금속재료학회지
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    • 제47권3호
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    • pp.202-208
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    • 2009
  • The effects of aging time on the microstructure and shear strength of the Low Temperature Co-fired Ceramic (LTCC)/Ag pad/Electroless Nickel Immersion Gold (ENIG)/BGA solder joints were investigated through isothermal aging at $150^{\circ}C$ for 1000 h with conventional Sn-37Pb and Sn-3Ag-0.5Cu. $Ni_3Sn_4$ intermetallic compound (IMC) layers was formed at the interface between Sn-37Pb solder and LTCC substrate as-reflowed state, while $(Ni,Cu)_3Sn_4$ IMC layer was formed between Sn-3Ag-0.5Cu solder and LTCC substrate. Additional $(Cu,Ni)_6Sn_5$ layer was found at the interface between the $(Ni,Cu)_3Sn_4$ layer and Sn-3Ag-0.5Cu solder after aging at $150^{\circ}C$ for 500 h. Thickness of the IMC layers increased and coarsened with increasing aging time. Shear strength of both solder joints increased with increasing aging time. Failure mode of BGA solder joints with LTCC substrate after shear testing revealed that shear strength of the joints depended on the adhesion between Ag metallization and LTCC. Fracture mechanism of Sn-37Pb solder joint was a mixture of ductile and pad lift, while that of Sn-3Ag-0.5Cu solder joint was a mixture of ductile and brittle $(Ni,Cu)_3Sn_4$ IMC fracture morphology. Failure mechanisms of LTCC/Ag pad/ENIG/BGA solder joints were also interpreted by finite element analyses.

이종재 Al5083-O/DP590 마찰교반점용접시 툴의 삽입깊이(Plunge Depth)가 용접성에 미치는 영향 (Effect of Tool Plunge Depth on Weldability of Dissimilar Al5083-O/DP590 Friction Spot Joint)

  • 정수옥;방한서;방희선
    • Journal of Welding and Joining
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    • 제34권3호
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    • pp.17-22
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    • 2016
  • In terms of mechanical and metallurgical characteristics, the effect of tool plunge depths(0.2, 0.5, 0.7, 1.0, 1.5mm) on weldability in dissimilar Al5083-O/DP590 friction spot joint has been clarified. From the results, it is found that the stirred nugget was stably formed at a plunge depth of more than 0.7mm, which is caused by improved stirring action against each other material. With increasing a plunge depth, the thickness of intermetallic compound(IMC) layer in Al5083-O/DP590 joint has a tendency to increase. The tensile shear strength reaches to the maximum failure load of 6.5kN at a plunge depth of 0.7mm due to relatively small decrease in the thickness of Al5083-O sheet and relatively minute thickness of IMC layer, compared with those of other plunge depth conditions.

연약지반 변형해석을 위한 다목적 Program개발

  • 박병기;정진섭
    • 한국지반공학회:학술대회논문집
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    • 한국지반공학회 1991년도 추계학술발표회 논문집 지반공학에서의 컴퓨터 활용 COMPUTER UTILIZATION IN GEOTECHNICAL ENGINEERING
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    • pp.362-375
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    • 1991
  • Background and Necessity of the study : For more than 20 years, the soil engineering reserach group of Chonnam National University has been performing the deformation analysis of soft clayey foundation, since the University is located near the south-western coast of Korean Peninsulla, along which tide reclamation works have been under proaressing. Associsted with the fact mentioned above, the researchers have been developing a computer program in order to carry out deformation analysis of soft foundation since early 1980. Case-studies : In this research, the Biot's equation was selected as the governing equation coupled with several constitutive models including original and modified Cam-clay models, elasto-viscoplastic model, Lade's model etc. The anisotropy of soi1 can be considered in this program. To validate the accuracy of the computer program developed a couple of case-studies were performed. These include the pilot banking, sand drain considering smear effect and compound foundation reinforced with sheet pile into soft foundation.i) The pilot banking Good results could be acquired by assuming banking load as the body force composed of finite element mesh rather than equivalent concentrated load.ii) The sand drain Due to smear, the delay of consolidation was remarkable at the early stsge. so safety for the failure of foundation should be checked for the initial step of consolidation. iii) The compound foundation Accurate results were obtained by introducing the joint element method for the soft foundation reinforced with sheet pile into soiㅣ.

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Fe, Cr, Mn, Si, Ni의 첨가에 의한 고력황동의 미세조직과 마모특성 (Microstructure and Wear Properties of High Strength Yellow Brass by Addition of Fe, Cr, Mn, Si and Ni)

  • 박재용;강춘식;신윤호;배정찬
    • 한국주조공학회지
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    • 제17권3호
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    • pp.258-266
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    • 1997
  • The purpose of this study is to improve hardness and wear resistance of high strength yellow brass by adding Fe, Cr, Mn, Si and Ni. Results showed that NiO, $FeCr_2O_4$ and intermetallic compound $Mn_5Si_3$ were produced when Ni, Fe-Cr and Mn-Si were added to the yellow brass. The hardness and wear tests showed the best results with the presence of the product precipitates and intermetallic compound. The calculation of relative wear resistance by volume fraction of each phases showed that the relative wear resistance of $Mn_5Si_3$ had the highest value, that of ${\beta}$ phase had the lowest. Observation of the worn surface showed that the main wear mechanism were found to be the abrasive wear, and also showed that the wear is caused by mechanical failure at the early stage.

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Graphene Oxide 첨가에 따른 Sn-3.0Ag-0.5Cu 무연솔더 접합부의 Electromigration 특성 분석 (Effects of Graphene Oxide Addition on the Electromigration Characteristics of Sn-3.0Ag-0.5Cu Pb-free Solder Joints)

  • 손기락;김가희;고용호;박영배
    • 마이크로전자및패키징학회지
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    • 제26권3호
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    • pp.81-88
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    • 2019
  • 본 연구에서는 그래핀 산화(graphene oxide, GO) 분말 첨가가 ball grid array(BGA) 패키지와 printed circuit board(PCB)간 Sn-3.0Ag-0.5Cu(SAC305) 무연솔더 접합부의 electromigration(EM) 수명에 미치는 영향에 대하여 보고 하였다. 솔더 접합 직후, Ni/Au표면처리된 패키지 접합계면에서는 $(Cu,Ni)_6Sn_5$가 생성되었으며 organic solderability preservative(OSP) 표면처리 된 PCB 접합계면에서는 $Cu_6Sn_5$ 금속간화합물(intermetallic compound, IMC)이 생성되었다. $130^{\circ}C$, $1.0{\times}10^3A/cm^2$ 전류밀도 하에서 EM 수명평가 결과, GO를 첨가하지 않은 솔더 접합부의 평균 파괴 시간은 189.9 hrs으로 도출되었고, GO를 첨가한 솔더 접합부의 평균 파괴 시간은 367.1 hrs으로 도출되었다. EM에 의한 손상은 패키지 접합계면에 비하여 pad 직경이 작은 PCB 접합계면에서 전자 유입에 의한 Cu의 소모로 인하여 발생하였다. 한편, 첨가된 GO는 하부계면의 $Cu_6Sn_5$ IMC와 솔더 사이에 분포하는 것을 확인하였다. 따라서, SAC305 무연솔더에 첨가된 GO가 전류 집중 영역에서 Cu의 빠른 확산을 억제하여 우수한 EM 신뢰성을 갖는 것으로 생각된다.