• Title/Summary/Keyword: Charge pumping

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A Study on the Spray and Combustion Characteristics of Direct-injection LPG (직접분사식 LPG의 분무 및 연소 특성에 관한 연구)

  • Hwang, Seong-Ill;Chung, Sung-Sik;Yeom, Jeong-Kuk
    • Journal of Power System Engineering
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    • v.19 no.2
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    • pp.40-48
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    • 2015
  • As advantages of LPG-DI engine, LPG is directly injected into combustion chamber during compression stroke to reduce compression temperature, prevent knock and spontaneous combustion, and adjust engine output using the amount of directly injected fuel, thereby reducing pumping loss caused by throttle valve. Stratified charge can be supplied nearby spark plugs to allow for overall lean combustion, which improves thermal efficiency and can cope with problems regarding emission regulations. In addition, it is characterized by free designing of intake manifold. Despite the fact that LPG-DI has many advantages as described above, there is lack of detailed investigation and study on spray characteristics, combustion flame characteristics, and ignition probability. In this study, a visualization experiment system that consists of visualization combustion chamber, air supply control system, emission control system, LPG fuel supply system, electronic control system and image data acquisition system was designed and manufactured. For supply of stratified charge in the combustion chamber, alignment of injector and spark plugs was made linear.

Design and Implementation of Fully Automated Solar Powered Irrigation System

  • Mohammad Fawzi Al Ajlouni;Essam Ali Al-Nuaimy;Salman Abdul-Rassak Sultan;Ali Hammod AbdulHussein Twaij;Al Smadi Takialddin
    • International Journal of Computer Science & Network Security
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    • v.24 no.4
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    • pp.197-205
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    • 2024
  • This paper presents a fully automated stand-alone irrigation system with GSM (Global System for Mobile Communication) module. Solar energy is utilized to power the system and it is aimed to conserve water by reducing water losses. The system is based on a DC water pump that draws energy from solar panels along with automated water flow control using a moisture sensor. It is also fitted with alert and protection system that consists of an ultrasonic sensor and GSM messages sender that transmits signals showing the levels of the water in the reservoir and the battery charge. The control system is designed to stop the water pump from pumping water either when the battery level drops to equal or less than 10% of its full charge, or when the water level becomes less than 10 cm high in the reservoir. The experimental results revealed that the system is appropriate to use in remote areas with water scarcity and away from the national grid.

Design of Small-Area MTP Memory Based on a BCD Process (BCD 공정 기반 저면적 MTP 설계)

  • Soonwoo Kwon;Li Longhua;Dohoon Kim;Panbong Ha;Younghee Kim
    • Journal of IKEEE
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    • v.28 no.1
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    • pp.78-89
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    • 2024
  • PMIC chips based on a BCD process used in automotive semiconductors require multi-time programmable (MTP) intellectual property (IP) that does not require additional masks to trim analog circuits. In this paper, MTP cell size was reduced by about 18.4% by using MTP cells using PMOS capacitors (PCAPs) instead of NMOS capacitors (NCAPs) in MTP cells, which are single poly EEPROM cells with two transistors and one MOS capacitor for small-area MTP IP design. In addition, from the perspective of MTP IP circuit design, the two-stage voltage shifter circuit is applied to the CG drive circuit and TG drive circuit of MTP IP design, and in order to reduce the area of the DC-DC converter circuit, the VPP (=7.75V), VNN (=-7.75V) and VNNL (=-2.5V) charge pump circuits using the charge pumping method are placed separately for each charge pump.

Characterization of Hot Carrier Mechanism of Nano-Scale CMOSFETs (나노급 소자의 핫캐리어 특성 분석)

  • Na Jun-Hee;Choi Seo-Yun;Kim Yong-Goo;Lee Hi-Deok
    • Proceedings of the IEEK Conference
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    • 2004.06b
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    • pp.327-330
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    • 2004
  • It is shown that the hot carrier degradation due to enhanced hot holes trapping dominates PMOSFETs lifetime both in thin and thick devices. Moreover, it is found that in 0.13 ${\mu}m$ CMOSFET the PMOS lifetime under CHC (Channel Hot Carrier) stress is lower than the NMOSFET lifetime under DAHC (Drain Avalanche Hot Carrier) stress. Therefore. the interface trap generation due to enhanced hot hole injection will become a dominant degradation factor. In case of thick MOSFET, the degradation by hot carrier is confirmed using charge pumping current method and highly necessary to enhance overall device lifetime or circuit lifetime in upcoming nano-scale CMOS technology.

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A Study on the Degradation Mechanism due to FN Tunneling Carrier in MOS Device (MOS 소자의 FN 터널링 캐리어에 의한 성능 저하에 관한 연구)

  • 김명섭;박영준;민홍식
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.30A no.2
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    • pp.53-63
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    • 1993
  • Device degradations by the Fowler-Nordheim tunneling have been studide. The changes of device characteristics such as the threshold voltage, subthreshold slope, I-.or. curves have been measured after bidirectionally stressing n-channel MOSFET's and p-channel MOSFET's. Also the interface states have been directly measured by the charge pumping methodIt is shown that the change of interface states is determined by the number of hole carriers tunneling the gate oxide and electrons which are trapped in the gate oxide. Also, in this paper, we propose a model for device lifetime limited by the increase of interface states.

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A Study on the Channel-Width Dependent Hot-Carrier Degradation of nMOSFET with STI (STI구조를 갖는 nMOSFET의 채널 너비에 따른 Hot-Carrier 열화 현상에 관한 연구)

  • 이성원;신형순
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.9
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    • pp.638-643
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    • 2003
  • Channel width dependence of hot-carrier effect in nMOSFET with shallow trench isolation is analyzed. $I_{sub}$- $V_{G}$ and $\Delta$ $I_{ㅇ}$ measurement data show that MOSFETs with narrow channel-width are more susceptible to the hot-carrier degradation than MOSFETs with wide channel-width. By analysing $I_{sub}$/ $I_{D}$, linear $I_{D}$- $V_{G}$ characteristics, thicker oxide-thickness at the STI edge is identified as the reason for the channel-width dependent hot-carrier degradation. Using the charge-pumping method, $N_{it}$ generation due to the drain avalanche hot-carrier (DAHC) and channel hot-electron (CHE) stress are compared. are compared.

A study on the programming conditions suppressing the lateral diffusion of charges for the SONOS two-bit memory (SONOS two-bit 메모리의 측면확산에 영향을 주는 programming 조건 연구)

  • Lee, Myung-Shik;An, Ho-Myung;Seo, Kwang-Yell;Koh, Jung-Hyuk;Kim, Byung-Cheul;Kim, Joo-Yeon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.11a
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    • pp.117-120
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    • 2005
  • The SONOS devices have been fabricated by the conventional $0.35{\mu}m$ complementary metal-oxide-semiconductor (CMOS) process with NOR array. Two-bit operation using conventional process achieve the high density memory compare with other two-bit memory. Lateral diffusion phenomenon in the two-bit operation cause soft error in the memory. In this study, the programming conditions arc investigated in order to reduce lateral diffusion for two-bit operation of CSL-NOR type SONOS flash cell.

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Performance and Emission Characteristics of Liquid-Phase LPG Injection Engine with Different EGR Rate (EGR율 변화에 대한 액상 LPG분사 엔진의 운전 및 배출가스특성)

  • 염기태;우영민;장진영;박용국;배충식
    • Transactions of the Korean Society of Automotive Engineers
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    • v.11 no.5
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    • pp.7-14
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    • 2003
  • Exhaust Gas Recirculation (EGR) system is used to reduce NOx emission, to improve fuel economy, and to suppress knock since it offers the benefits of the inlet charge dilution. The effects of EGR was investigated on the performance and emission to reduce exhaust thermal load with a single cylinder liquid-phase LPG injection engine, in a wide range of EGR rate, engine conditions and LPG proportions. As EGR rate was increased, NOx was reduced while HC was increased. Pumping loss reduction by EGR improved bsfc and increased EGR lowered exhaust gas temperature. And, LPG proportions were made a difference on the performance and emission characteristics.

Effect of Post-Metallization Anneal (PMA) on Interface Trap Density of Si-$SiO_2$ (금속후 어닐링 방법이 Si-$SiO_2$ 계면 전하 농도에 미치는 영향)

  • Jung, Jong-Wan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.11a
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    • pp.157-158
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    • 2007
  • Effects of post-metallization anneal (PMA) on interface trap characteristics of Si-$SiO_2$ are studied. The conventional PMA method utilizes forming gas anneal, where 10% hydrogen in nitrogen atmosphere is used. A new PMA method utilizes hydrogen rich PECVD- silicon nitride $(SiN_x)$ film as a hydrogen diffusion source and a out-diffusion blocking layer. It can be shown through charge pumping current measurement that the new PMA is indeed effective to decrease Si-$SiO_2$ interface trap density.

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Spin-polarization and x-ray magnetic circular dichroism in GaAs

  • Zohar, S.;Ryan, P.J.;Kim, J.W.;Keavney, D.J.
    • Current Applied Physics
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    • v.18 no.11
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    • pp.1182-1184
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    • 2018
  • The combination of angular spin momentum with electronics is a promising successor to charge-based electronics. The conduction bands in GaAs may become spin-polarized via optical spin pumping, doping with magnetic ions, or induction of a moment with an external magnetic field. We investigated the spin populations in GaAs with x-ray magnetic circular dichroism for each of these three cases. We find strong anti-symmetric lineshapes at the Ga $L_3$ edge indicating conduction band spin splitting, with differences in line width and amplitude depending on the source of spin polarization.