• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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• pp.88-91
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• 2003

Crystalline carbon nitride films have been attempted for an application of humidity sensors. The films were deposited on $Al_2O_3$ substrate having interdigitated electrodes by reactive RF magnetron sputtering system. The film revealed a good humidity-resistance characteristics as well as humidity-capacitance ones in the humidity range of $10\;{\sim}\;95\;RH(%)$. Temperature dependence was also investigated. These results suggest that carbon nitride film have a possibility for a new humidity-sensitive materials.

• 한국세라믹학회지
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• 제41권11호
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• pp.812-818
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• 2004

무수붕산(B$_2$O$_3$)과 활성탄소를 사용하여 질소 분위기에서 육방정 질화붕소(h-BN)을 합성할 때 그 생성조건 및 반응과정을 검토하였다. 육방정 질화붕소의 생성조건은 140$0^{\circ}C$ 이상에서 질화붕소가 합성되기 시작하여 155$0^{\circ}C$에서는 대부분의 합성이 이루어졌고, 그 이상의 온도에서는 생성이 크지 않았음이 확인되었다. 합성된 질화붕소의 입자 형상은 미세한 판상 결정을 나타내었다. 반응 과정은 무수붕산이 탄소에 의하여 환원되어 붕소로 기화됨과 동시에 공존하는 질소 가스와 반응하여 육방정 질화붕소로 합성되는 반응 경로를 따를 것으로 사료된다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.1
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• pp.164-167
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• 2003

Carbon nitride films with ${\beta}-C_3N_4$ crystals were grown by rf reactive magnetron sputtering system with negative DC bias. Chamber baking system to supply whole chamber with activation energy was used to reduce the contamination of H and O atoms. XRD peaks showed the existence of crystalline ${\beta}-C_3N_4$(200) and lonsdaleite structures. FTIR spectroscopy studies revealed that the film contain ${\alpha}-C_3N_4$ and ${\beta}-C_3N_4$ with $1011\;cm^{-1},\;1257\;cm^{-1}\;and\;1529\;cm^{-1}$ peaks. We could also find the grain growth of hexagonal structure from SEM photograph, which is coincident with the theoretical carbon nitride unit cell. ${\alpha}$-step was used to make the thickness profile of the grown films.

• Transactions on Electrical and Electronic Materials
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• 제3권3호
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• pp.29-33
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• 2002

A procedure was developed for preparing bulk carbon nitride crystals from a polymeric $\alpha$ -C$_3$N$\_$4.2/ at high pressure and temperature in the presence of seeds of crystalline carbon nitride films prepared by a high voltage discharge plasma combined with pulsed laser ablation of graphite target. The samples were evaluated by x-ray photoelectron spectroscopy (XPS), infrared (IR) spectroscopy, Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), scanning electron microscopy (SEM) and x-ray diffraction (XRD). Notably, XPS studies of the film composition before and after thermobaric treatments demonstrate that the nitrogen composition in $\alpha$ -C$_3$N$\_$4.2/ material initially containing more than 58% nitrogen decreases during the annealing process and reaches a common, stable composition of ~45%. The thermobaric experiments were performed at 10-77 kbar and 350-1200 $\^{C}$.

• 한국진공학회지
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• 제14권3호
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• pp.165-170
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• 2005

의료용 임플랜트의 혈액적합성 개선을 위하여 박막코팅에 대한 관심이 증대하고 있다. 특히 diamond-like carbon(DLC)과 titanium nitride(TiN) 박막은 우수한 화학, 물리적 성질은 물론 생체적합 특성까지 갖추고 있다. 따라서 이들 박막의 혈액 적합성과 물리적 특성과의 관개를 연구하기 위하여 박막표면의 모폴로지 및 젖음성과 fibrinogen흡착 특성을 비교 분석하였다. 혈액응고 원인이 되는 fibrinogen의 흡착량은 DLC보다 TiN의 경우가 적어, 보다 우수한 특성을 보였으며, 이것은 TiN박막 표면의 높은 친수성으로 인한 것으로 판단된다. 박막표면의 fibrinogen 흡착을 줄이기 위해 플라즈마 처리 및 노(爐) 열처리를 각각 수행하였다. 산소 플라즈마 및 열처리를 하였을 경우 DLC 박막은 큰 효과가 없는 반면 TiN 박막의 경우 fibrinogen 흡착량이 크게 줄어 보다 개선된 결과를 보였다.

• 한국재료학회지
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• 제13권3호
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• pp.150-154
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• 2003

Amorphous carbon nitride films were deposited on Si(001) substrates by a plasma enhanced chemical vapor deposition technique (PECVD) using $CH_4$and $N_2$as reaction gases. The growth and film properties were investigated while the gas ratio and the working pressure were changed systematically. At 1 Torr working pressure, an increase in the $N_2$partial pressure results in a significant increase of the deposition rate as well as an apparent presence of C ≡N bonding, while little affecting the microstructure and amorphus nature of the films. In the case of changing the working pressure at a fixed $N_2$partial pressure of 98%, a film grown at a medium pressure of $1${\times}$10^{-2}$ Torr shows the most prominent C=N bonding nature and photoluminescent property.

• 센서학회지
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• 제9권3호
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• pp.248-255
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• 2000

타겟을 상하 2개 설치한 페닝소스 스퍼터링 장치를 구현하였다. 이 시스템을 이용하여 결정성 질화탄소막을 성장하고 그 물리적 특성을 조사하였다. RBS 측정을 통해 스퍼터링가스 중 Ar의 비율을 감소시키고 질소의 비율을 증가시키면 철의 스퍼터링이 감소되는 것을 알 수 있었다. 성장된 질화탄소막의 결정립 크기는 약 $150{\AA}$에서 $250{\AA}$의 분포를 이루고 있었다. 스퍼터링가스 중 질소의 분압이 증가할수록 증착율 및 성장된 질화탄소막 중 질소량은 증가하였다.

• 한국전기전자재료학회논문지
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• 제14권10호
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• pp.835-844
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• 2001

In this paper, we report the successful growth of crystalline carbon nitride films in Si(100) by a laser-electric discharge method. The laser ablation of the target leads to vapor plume plasma expending into the ambient nitrogen arc discharge area. X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy(AES) were used to identify the binding structure and the content of the nitrogen species in the deposited films. The surface morphology of the films with a deposition time of 2 hours is studied using a scanning electron microscopy (SEM). In order to determine the structural crystalline parameters, X-ray diffraction (XRD) was used to analysis the grown films.

• 한국재료학회지
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• 제13권5호
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• pp.303-308
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• 2003

Amorphous carbon nitride films deposited on Si(001) substrates by a plasma enhanced chemical vapor deposition (PECVD) technique using CH$_4$and $N_2$as reaction gases were thermally annealed at various temperatures under$ N_2$atmosphere, then their physical properties were investigated particularly as a function of annealing temperature. Above $600^{\circ}C$ a small amount of crystalline $\beta$-$C_3$$N_4$ phase evolves, while the film surface becomes very rough due to agglomeration of fine grains on the surface. As the annealing temperature increases, both the hardness and the $sp^3$ bonding nature are enhanced. In contrast to our expectation, higher annealing temperature results in a relatively higher friction mainly due to big increase in roughness at that temperature.

• 센서학회지
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• 제14권5호
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• pp.343-349
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• 2005

Carbon nitride films were deposited on various substrates for humidity sensors with meshed electrode by reactive RF magnetron sputtering system. As the ratio of injected nitrogen was decreased, the sensitivity of sensor was increased. When the ratio of injected nitrogen was $50{\sim}70%$, the sample showed the best linearity. The sensor impedance changed from $95.4{\;}k{\Omega}$ to $2.1{\;}k{\Omega}$ in a relative humidity range of 5 % to 95 %. The humidity sensors based on silicon wafer revealed higher lineality and faster response than those of alumina or quartz substrates. The adsorption saturation time of the sample was about 80 sec, and its desorption time was about 90 sec.