• Title/Summary/Keyword: Capacitance Voltage Characteristics

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Characteristics of $SnO_2$/a-Se/AI sample ($SnO_2$/a-Se/AI 소자의 특성)

  • 박계춘;정운조;유용택
    • Electrical & Electronic Materials
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    • v.7 no.1
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    • pp.7-14
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    • 1994
  • Structural and optical characteristics in $SnO_2$/a-Se/Al sample by aging variation and applying constant voltage had been investigated. a-Se was varied with monoclinic structure and its surface was greatly exchanged. Its capacitance was first decreased and then increased and its photo-current, photo-voltage and photo-capacitance were increased gradually with day and applying voltage. From the results, crystallization of a-Se and dopant trap level formation had been identified. Also, it was acknowledged $SnO_2$/a-Se/Al sample is useful in photovoltaic and solid thin film cell.

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Comparison of Electrical Properties between Sputter Deposited Au and Cu Schottky Contacts to n-type Ge

  • Kim, Hogyoung;Kim, Min Kyung;Kim, Yeon Jin
    • Korean Journal of Materials Research
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    • v.26 no.10
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    • pp.556-560
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    • 2016
  • Using current-voltage (I-V) and capacitance-voltage (C-V) measurements, the electrical properties of Au and Cu Schottky contacts to n-Ge were comparatively investigated. Lower values of barrier height, ideality factor and series resistance were obtained for the Au contact as compared to the Cu contact. The values of capacitance showed strong dependence on the bias voltage and the frequency. The presence of an inversion layer at the interface might reduce the intercept voltage at the voltage axis, lowering the barrier height for C-V measurements, especially at lower frequencies. In addition, a higher interface state density was observed for the Au contact. The generation of sputter deposition-induced defects might occur more severely for the Au contact; these defects affected both the I-V and C-V characteristics.

Characteristics of Insulation Aging in High Voltage Cables (고압케이블의 절연열화 특성)

  • Kim, Kyeong-Yeol
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.88-88
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    • 2010
  • High Voltage cross-linked polyethylene (XLPE) cables are widely used in a thermal power plant. These cables had been in service for 26 years. The insulation condition of six 6 kV XLPE cables was estimated by insulation diagnostic analyzer (IDA) with voltage amplifier. IDA was measured dissipation factor and capacitance of the whole cable as a function of frequency and voltage. This system measures in the frequency range from 0.1 to 10 Hz at each voltage level. Six XLPE cables are judged good condition, but three cables are analyzed at an aged condition.

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Analysis and Design of a High Voltage Flyback Converter with Resonant Elements

  • Hong, Sung-Soo;Ji, Sang-Keun;Jung, Young-Jin;Roh, Chung-Wook
    • Journal of Power Electronics
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    • v.10 no.2
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    • pp.107-114
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    • 2010
  • This paper presents the operational characteristics of a high voltage flyback converter with resonant elements. In high voltage low power applications, the effect of a transformer’s stray capacitance might be the most important factor that influences the overall performance of the circuit. A detailed mode analysis and the design procedure are presented in designing the high voltage flyback converter. To verify and confirm the validities of the presented analysis and design procedure, a computer simulation and experiments have been performed.

Electrical Characteristics of Oxide due to High Temperature Diffusion. (고온 확산공정에 따른 산화막의 전기적 특성)

  • Hong, N.P.;Choi, D.J.;Ko, K.Y.;Lee, T.S.;Choi, B.H.;Hong, J.W.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07a
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    • pp.63-66
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    • 2003
  • In this paper, the electrical characteristics of single oxide layer due to high temperature diffusion process, wafer resistivity and thickness of poly backseat was researched. The oxide quality was examined through capacitance-voltage characteristics, and besides, it will be describe the capacitance-voltage characteristics of the single oxide layer by semiconductor device simulation.

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Electrical Properties of F16CuPC Single Layer FET and F16CuPc/CuPc Double Layer FET

  • Lee, Ho-Shik;Park, Yong-Pil;Cheon, Min-Woo
    • Transactions on Electrical and Electronic Materials
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    • v.8 no.4
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    • pp.174-177
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    • 2007
  • We fabricated organic field-effect transistors (OFETs) based a fluorinated copper phthalocyanine ($F_{16}CuPC$) and copper phthalocyanine (CuPc) as an active layer. And we observed the surface morphology of the $F_{16}CuPC$ thin film. The $F_{16}CuPC$ thin film thickness was 40 nm, and the channel length was $50{\mu}m$, channel width was 3 mm. And we also fabricated the $F_{16}CuPc/CuPc$ double layer FET and with different $F_{16}CuPc$ film thickness devices. We observed the typical current-voltage (I-V) characteristics and capacitance-voltage (C-V) in $F_{16}CuPc$ FET and we calculated the effective mobility. From the double layer FET devices, we observed the higher drain current more than single layer FET devices.

Characteristics of C-V for Double gate MOSFET (Double gate MOSFET의 C-V 특성)

  • 나영일;김근호;고석웅;정학기;이재형
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2003.10a
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    • pp.777-779
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    • 2003
  • In this paper, we have investigated Characteristics of C-V for Double gate MOSFET with main gate and side gate. DG MOSFET has the main gate length of 50nm and the side gate length of 70nm. We have investigated characteristics of C-V and main gate voltage is changed from -5V to +5V. Also we have investigated characteristics of C-V for DG MOSFET when the side gate length is changed from 40nm to 90nm. As the side gate length is reduced, the transconductance is increased and the capacitance is reduced. When the side gate voltage is 3V, we know that C-V curves are bending at near the main gate voltage of 1.8V. We have simulated using ISE-TCAD tool for characteristics analysis of device.

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Electrical Properties with Varying CuPc Thickness and Channel Length of the Field-effect Transistor (CuPc 두께 변화 및 채널 길이 변화에 따른 전계 효과 트랜지스터의 전기적 특성 연구)

  • Lee, Ho-Shik
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.20 no.1
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    • pp.47-52
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    • 2007
  • Organic field-effect transistors (OFETS) are of interest for use in widely area electronic applications. We fabricated a copper phthalocyanine (CuPc) based field-effect transistor with varying channel length. The CuPc FET device was made a top-contact type and the channel length was a $100\;{\mu}m,\;50\;{\mu}m,\;40\;{\mu}m,\;and\;30\;{\mu}m$ and the channel width was a fixed at 3 mm. We observed a typical current-voltage (I-V) characteristics in CuPc FET with varying channel length (L) and we calculated the effective mobility. Also, we measured a capacitance-voltage (C-V) by applied bias voltage with varying frequency at 43, 100, 1000 Hz.

Design and Fabrication of Wide-band Transient Voltage Blocking Device (광대역 과도전압 차단장치의 설계 및 제작)

  • 송재용;이종혁;길경석
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 1999.05a
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    • pp.330-334
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    • 1999
  • This paper presents a new transient voltage blocking device (TBD) for commucation facilities with low power and high frequency bandwidth. Conventional protection devices have some problems such as low frequency bandwidth, low energy capacity and high remnant voltage. In order to improve these limitations, the new TBD, which consists of a gas tube, avalanche diodes and junction type field effect transistors (JFETs), was designed and fabricated JFETs were used as an active non-linear element and a high speed switching diode with low capacitance limits high current. Therefore the avalanche diodes with low energy capacity are protected from the high current, and the TBD has a very small input capacitance. From the performance test using surge generator, which can produce 1.2/50${\mu}\textrm{s}$ 4.2 k$V_{max}$, 8/20${\mu}\textrm{s}$ 2.1 kA$\sub$max/, it is confirmed that the proposed TBD has an excellent protection performance in tight clamping voltage and limiting current characteristics.

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A Characteristics on Impedance of Degraded Thyristor with Heat and Voltage Stress (열화된 사이리스터 소자의 임피던스 특성)

  • Seo, Kil-Soo;Kim, Hyung-Woo;Kim, Ki-Hyun;Kim, Nam-Kyun
    • Proceedings of the KIEE Conference
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    • 2006.07c
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    • pp.1351-1352
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    • 2006
  • In this paper, the impedance properties of degraded thyristor with heat and voltage were presented. As degraded thyristor, 8 thyristors with each other different reverse blocking voltage used. Its impedance and resistance properties were measured from frequency 100Hz to 10MHz applied with bias voltage from 0V to 40V. As a result, at low frequency region, that is, at the frequency 100-10kHz, the abrupt increasement of its capacitance was confirmed. And also, at high frequency region, the capacitance peak move toward low frequency in the region of frequency 4 - 6MHz as degradation of thyristor.

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