• 제목/요약/키워드: Bit Error

검색결과 2,257건 처리시간 0.03초

터보 부호의 오류 취약 비트 보완 알고리듬 (Protection Algorithm for Error Prone Bit Positions of Turbo Codes)

  • Wangrok Oh;Kyungwhoon Cheun;Kim, Jinwoo;Kyeongcheol Yang
    • 한국통신학회논문지
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    • 제29권7A호
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    • pp.775-780
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    • 2004
  • In this paper, we propose a simple protection scheme for error prone bit positions of turbo codes using the error detection capability of the CRC, which is almost always employed in practical systems. The proposed scheme based on bit flipping with CRC offers flexibility on selecting the level of protection. Also, not having send additional parity bits or discarding useful bit positions, it offers the best error performance for a given level of protection.

Improved Method of Characteristics for Two way Subscriber Transmission Systems

  • Phetsomphou, Douangsamone;Tsuchiya, Naosuke;Tanaka, Kimio
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2004년도 ICCAS
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    • pp.1355-1359
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    • 2004
  • The two way subscriber transmission systems have tendency to spread its carrier frequency bandwidth or information bit rate and average bit error rate according to popularization of high speed information through the digital communication system, transmission medium and the Internet. This fact is an important incentive to realize new systems. These two way subscriber transmission systems usually use same cable or same carrier frequency bandwidth for up stream channel and down stream channel. In the systems, the disturbances of noise, crosstalk or fading affect the characteristics. Specifically, these disturbances cause the decrease of information bit rate and degradation of transmission quality. This paper proposes the improved method of their degradations using the particular feature of two way subscriber transmission systems and it makes clear proposed method is effective by theoretically and some numerical examples.

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Co60 Gamma-Ray Effects on the DAC-7512E 12-Bit Serial Digital to Analog Converter for Space Power Applications

  • Shin, Goo-Hwan
    • Journal of Electrical Engineering and Technology
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    • 제9권6호
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    • pp.2065-2069
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    • 2014
  • The DAC-7512E is a 12-bit digital to analog converter that is low power and a single package with internal buffers. The DAC-7512E takes up minimal PCB area for applications of space power electronics design. The spacecraft mass is a crucial point considering spacecraft launch into space. Therefore, we have performed a TID test for the DAC-7512E 12-bit serial input digital to analog converter to reduce the spacecraft mass by using a low-level Gamma-ray irradiator with $Co^{60}$ gamma-ray sources. The irradiation with $Co^{60}$ gamma-rays was carried out at doses from 0 krad to 100 krad to check the error status of the device in terms of current, voltage and bit error status during conversion. The DAC-7512E 12-bit serial digital to analog converter should work properly from 0 krad to 30 krad without any error.

Exact Bit Error Probability of Orthogonal Space-Time Block Codes with Quadrature Amplitude Modulation

  • Kim, Sang-Hyo;Yang, Jae-Dong;No, Jong-Seon
    • Journal of Communications and Networks
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    • 제10권3호
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    • pp.253-257
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    • 2008
  • In this paper, the performance of generic orthogonal space-time block codes (OSTBCs) introduced by Alamouti [2], Tarokh [3], and Su and Xia [11] is analyzed. We first define one-dimensional component symbol error function (ODSEF) from the exact expression of the pairwise error probability of an OSTBC. Utilizing the ODSEF and the bit error probability (BEP) expression for quadrature amplitude modulation (QAM) introduced by Cho and Yoon [9], the exact closed-form expressions for the BEP of linear OSTBCs with QAM in quasi-static Rayleigh fading channel are derived. We also derive the exact closed-form of the BEP for some OSTBCs which have at least one message symbol transmitted with unequal power via all transmit antennas.

Reed-Solomon/Trellis 연접 부호변조 시스템의 비트오율 해석 (An Analysis of Bit Error Probability of Reed-Solomon/Trellis concatenated Coded-Modulation System)

  • 김형락;이상곤;문상재
    • 전자공학회논문지A
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    • 제31A권9호
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    • pp.34-43
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    • 1994
  • The unequal symbol error probability of TCM(trellis coded modulation) is analyzed and applied to the derivation of bit error probability of /RS/Trellis concatenated coded-modulation system. An upper bound of the symbol error probability of TCM concatenated with RS code is obtained by exploiting the unequal symbol error probability of TCM, and it is applied to the derivation of the upper bound of the bit error probability of the RS/Trellis concatenated coded-modulation system. Our upper bounds of the concatenated codes are tighter than the earlier established other upper bounds.

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An Algorithm for Bit Error Rate Monitoring and Adaptive Decision Threshold Optimization Based on Pseudo-error Counting Scheme

  • Kim, Sung-Man
    • Journal of the Optical Society of Korea
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    • 제14권1호
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    • pp.22-27
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    • 2010
  • Bit error rate (BER) monitoring is the ultimate goal of performance monitoring in all digital transmission systems as well as optical fiber transmission systems. To achieve this goal, optimization of the decision threshold must also be considered because BER is dependent on the level of decision threshold. In this paper, we analyze a pseudo-error counting scheme and propose an algorithm to achieve both BER monitoring and adaptive decision threshold optimization in optical fiber transmission systems. To verify the effectiveness of the proposed algorithm, we conduct computer simulations in both Gaussian and non-Gaussian distribution cases. According to the simulation results, BER and the optimum decision threshold can be estimated with the errors of < 20% and < 10 mV, respectively, within 0.1-s processing time in > 40-Gb/s transmission systems.

온칩 메모리 내 다중 비트 이상에 대처하기 위한 오류 정정 부호 (Error correction codes to manage multiple bit upset in on-chip memories)

  • Jun, Hoyoon
    • 한국정보통신학회논문지
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    • 제26권11호
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    • pp.1747-1750
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    • 2022
  • As shrinking the semiconductor process into the deep sub-micron to achieve high-density, low power and high performance integrated circuits, MBU (multiple bit upset) by soft errors is one of the major challenge of on-chip memory systems. To address the MBU, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not resolve mis-correction. We propose the SEC-DED-DAEC-TAED(triple adjacent error detection) code without mis-corrections. The generated H-matrix by the proposed heuristic algorithm to accomplish the proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the 2-stage pipelined decoder can be employed on-chip memory system.

Fuzzy Techniques in Optimal Bit Allocation

  • Kong, Seong-Gon
    • 한국지능시스템학회:학술대회논문집
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    • 한국퍼지및지능시스템학회 1993년도 Fifth International Fuzzy Systems Association World Congress 93
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    • pp.1313-1316
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    • 1993
  • This paper presents a fuzzy system that estimates the optimal bit allocation matrices for the spatially active subimage classes of adaptive transform image coding in noisy channels. Transform image coding is good for image data compression but it requires a transmission error protection scheme to maintain the performance since the channel noise degrades its performance. The fuzzy system provides a simple way of estimating the bit allocation matrices from the optimal bit map computed by the method of minimizing the mean square error between the transform coefficients of the original and the reconstructed images.

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고집적 DRAM 셀에 대한 소프트 에러율 (Soft Error Rate for High Density DRAM Cell)

  • 이경호;신형순
    • 대한전자공학회논문지SD
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    • 제38권2호
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    • pp.87-94
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    • 2001
  • DRAM에서 셀 캐패시터의 누설 전류 영향을 고려하여 소프트 에러율을 예측하였다. DRAM의 동작 과정에서 누설 전류의 영향으로 셀 캐패시터는 전하량이 감소하고, 이에 따른 소프트 에러율을 DRAM의 각 동작 모드에 대하여 계산하였다. 누설 전류가 작을 경우에는 /bit mode가 소프트 에러에 취약했지만, 누설전류가 커질수록 memory 모드가 소프트 에러에 가장 취약함을 보였다. 실제 256M급 DRAM의 구조에 적용하여, 셀 캐패시턴스, bit line 캐패시턴스, sense amplifier의 입력 전압 감도들이 변화할 때 소프트 에러에 미치는 영향을 예측하였고, 이 결과들은 차세대 DARM 연구의 최적 셀 설계에 이용될 수 있다.

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