• 대한기계학회:학술대회논문집
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• 대한기계학회 2000년도 춘계학술대회논문집A
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• pp.873-878
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• 2000

Semiconductor packaging technology is changed rapidly according to the trends of the micro miniaturization of multimedia and information equipment. For I/O limitation and fine pitch limitation, DIP and SOP/QFP are replaced by BGA/CSP. This is one of the surface mount technology(SMT). Solder ball is bumped n the die pad and connected onto mounting board. In ball bump formation, vacuum suction type ball alignment process is widely used, However this type has some problems such as ionization, static electricity and difficulty of fifo(first-input first-out) of solder balls. Seesaw type is reducing these problems and has a structural simplicity and economic efficiency. Ball cartridge velocity and ball aligned plate angle are Important variables to improve the ball alignment Process. In this paper, seesaw-type CSP solder ball loader is developed and the optimal velocity and plate angle are proposed.

• 한국재료학회지
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• 제21권12호
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• pp.650-654
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• 2011

In this paper, the effects of conventional and newly developed elastomer modified underfill materials on the mechanical shock reliability of BGA board assembly were studied for application in mobile electronics. The mechanical shock reliability was evaluated through a three point dynamic bending test proposed by Motorola. The thermal properties of the underfills were measured by a DSC machine. Through the DSC results, the curing condition of the underfills was selected. Two types of underfills showed similar curing behavior. During the dynamic bending reliability test, the strain of the PCB was step increased from 0.2% to 1.5% until the failure circuit was detected at a 50 kHz sampling rate. The dynamic bending reliability of BGA board assembly using elastomer modified underfill was found to be superior to that of conventional underfill. From mechanical and microstructure analyses, the disturbance of crack propagation by the presence of submicron elastomer particles was considered to be mainly responsible for that result rather than the shear strength or elastic modulus of underfill joint.

• 조명전기설비학회논문지
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• 제19권7호
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• pp.53-59
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• 2005

본 논문에서는 비젼 시스템을 사용하여 마이크로 BGA 소자의 2차원 결함을 검사하는 알고리즘을 제안하였다. 제안한 방법은 정밀도를 높이기 위해 부화소 알고리즘을 사용하였으며, 입력된 영상에서 패키지 영역을 추출하고, 추출된 영역에서 볼 탐색창 방법을 사용하여 볼 영역을 추출한다. 이렇게 추출된 볼 영역에 대해 결함검사에 필요한 파라미터들을 추출하고, 이들을 사용하여 소자의 불량 유무를 판정한다. 모의실험을 통해 볼 검사 정밀도의 평균 오차가 17[${\mu}m$]가 됨을 확인하였다.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2006년도 춘계 학술대회 개요집
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• pp.206-208
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• 2006

The reliability of BGA (ball grid array) package with OSP (organic surface preservative) surface finish under thermal cycle was investigated by using SEM (scanning electron microscopy), EDS(energy dispersive spectroscopy), image tool and ball shear test. The IMCs (intermetallic compounds) were increased with increasing number of thermal cycles. However, the shear strengths of solder ball were decreased with increasing number of thermal cycles. The order of solders which had the highest shear strength as follow: Sn-3.5wt%Ag-0.7wt%Cu, Sn-0.7wt%Cu, Sn-37wt%Pb.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2000년도 하계종합학술대회 논문집(4)
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• pp.139-142
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• 2000

$\mu$BGA(Ball Grid Array) is growing in response to a great demand for smaller and lighter packages for the use in laptop, mobile phones and other evolving products. However it is not easy to find its defect by human visual due to in very small dimension. From this point of view, we are interested its development of a vision based automated inspection algorithm. For this, first a 2D view of $\mu$BGA is described under a special blue illumination. Second, a notation-invariant 2D inspection algorithm is developed. Finally a 3D inspection algorithm is proposed for the case of stereo vision system. As a simulation result, it is shown that 3D defect not easy to find by 2D algorithm can be detected by the proposed inspection algorithm.

• 마이크로전자및패키징학회지
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• 제24권2호
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• pp.55-59
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• 2017

본 논문은 마이크로 BGA(Ball Grid Array)의 3차원 형상 검사를 위한 광학적 방법에 관한 것으로, 특히, LED를 공간적으로 배치한 광원과 경면반사특성을 이용하였다. 이를 위해 비전시스템을 구성하여 BGA의 반사영상을 취득한 후, 영상처리를 통하여 반사된 LED 점광원의 위치를 추출하여 형상검사에 이용하였다. 또한, 영상에 포함된 복수개의 BGA에 대한 상대적 위치의 통계치를 이용하여 BGA 3차원 형상의 결함을 판단하는 방법을 제안하였고, 실험을 통하여 제안된 방법의 효용성을 보였다.

• 반도체디스플레이기술학회지
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• 제20권2호
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• pp.126-130
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• 2021

The ball grid array is one of the packaging methods that used in high density printed circuit board. Solder void defects caused by voids in the solder ball during the BGA process do not directly affect the reliability of the product, but it may accelerate the aging of the device on the PCB layer or interface surface depending on its size or location. Void inspection is important because it is related in yields with products. The most important process in the optical inspection of solder void is the segmentation process of solder and void. However, there are several segmentation algorithms for the vision inspection, it is impossible to inspect all of images ideally. When X-Ray images with poor contrast and high level of noise become difficult to perform image processing for vision inspection in terms of software programming. This paper suggests the solution to deal with the suggested problem by means of using Mask R-CNN instead of digital image processing algorithm. Mask R-CNN model can be trained with images pre-processed to increase contrast or alleviate noises. With this process, it provides more efficient system about complex object segmentation than conventional system.

• Journal of Mechanical Science and Technology
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• 제16권7호
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• pp.919-926
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• 2002

In this study, the numerical prediction of the thermal fatigue lie? of a $\mu$BGA (Micro Ball Grid Array) solder joint was focused. Numerical method was performed using the three-dimensional finite element analysis for various solder alloys such as Sn-37%Pb, Sn-3.5%Ag, Sn-3.5%Ag-0.7%Cu and Sn-3.5%Ag-3%In-0.5%Bi during a given thermal cycling. Strain values obtained by the result of mechanical fatigue tests for solder alloys, were used to predict the solder joint fatigue life using the Coffin-Manson equation. The numerical results showed that Sn-3.5%Ag with the 50-degree ball shape geometry had the longest thermal fatigue life in low cycle fatigue. A practical correlation for the prediction of the thermal fatigue life was also suggested by using the dimensionless variable γ. Additionally Sn-3.5Ag-0.75Cu and Sn-2.0Ag-0.5Cu-2.0Bi were applied to 6$\times$8$\mu$BGA obtained from the 63Sn-37Pb Solder. This 6$\times$8$\mu$BGA were tested at different aging conditions at 130$\^{C}$, 150$\^{C}$, 170$\^{C}$ for 300, 600 and 900 hours. Thickness of the intermetallic compound layer was measured thor each condition and the activation energy thor their growth was computed. The fracture surfaces were analyzed using SEM (Scanning Electron Microscope) with EDS ( Energy Dispersive Spectroscopy).

• 마이크로전자및패키징학회지
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• 제30권4호
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• pp.50-60
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• 2023

BGA(ball grid array)는 높은 집적도와 우수한 방열 성능을 갖고 있어 널리 이용되는 방식의 패키지이다. BGA에서 솔더볼은 패키지와 PCB를 전기적으로 연결하는 중요한 역할을 하므로, 다양한 기계적 하중 하에서 솔더볼의 비탄성 변형을 이해하는 것은 반도체 패키지의 강건설계에 필수적이다. 본 연구에서는 공정 중 PCB의 휨, die와 substrate 간의 열팽창 계수 차이 등으로 인해 소성변형이 발생한 솔더볼의 초기 형상이 비탄성 변형과 파단에 미치는 영향을 유한요소 해석으로 분석하였다. 시뮬레이션 결과, shear와 bending 하중에서 tilted, hourglass 형상 모두 파단이 발생한 반면, compression 하중이 작용하는 경우는 모두 파단이 발생하지 않았다. Shear와 bending 하중에 compression이 각각 결합될 경우, 응력삼축비가 0보다 작은 값으로 유지되어 파단이 억제되었다. 또한 변형에 취약한 요소의 Lagrangian-Green 변형률 텐서를 이용해 비교한 결과, 동일한 하중 조건이라도 솔더볼의 형상에 따라 변형의 양상에 유의미한 차이가 있음을 확인하였다.

• Journal of Welding and Joining
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• 제20권2호
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• pp.90-94
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• 2002

FC-BGA has advantages over other interconnection methods including high I/O counts, better electrical performance, high throughput, and low profile. But, FC-BGA has a lot of reliability issues. The 2nd level solder joint reliability of the FC-BGA with large chip on laminate substrate was studied in this paper. The purpose of this study is to discuss solder joint failures of 2nd level thermal cycling test. This work has been done to understand the influence of the structure of package, the properties of underfill, the properties and thickness of bismaleimide tiazine substrate and the temperature range of thermal cycling on 2nd level solder joint reliability. The increase of bismaleimide tiazine substrate thickness applied to low modulus underfill was improve of solder joint reliability. The resistance of solder ball fatigue was increased solder ball size in the solder joints of FC-BGA.