• Title/Summary/Keyword: Analog-to-Digital(A/D)

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Simulations and Circuit Layouts of HTS Rapid Single Flux Quantum 1-bit A/D Converter by using XIC Tools (XIC tools을 사용한 고온 초전도 Rapid Single Flux Quantum 1-bit A/D Converter의 Simulation과 회로 Layout)

  • 남두우;홍희송;정구락;강준희
    • Proceedings of the Korea Institute of Applied Superconductivity and Cryogenics Conference
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    • 2002.02a
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    • pp.131-134
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    • 2002
  • In this work, we have developed a systematic way of utilizing the basic design tools for superconductive electronics. This include WRSPICE, XIC, margin program, and L-meter. Since the high performance analog-to- digital converter can be built with Rapid Single Flux Quantum (RSFQ) logic circuits the development of superconductive analog-to-digital converter has attracted a lot of interests as one of the most prospective area of the application of Josephson Junction technology. One of the main advantages in using Rapid Single Flux Quantum logic in the analog-to-digital converter is the low voltage output from the Josephson junction switching, and hence the high resolution. To design an 1-bit analog-digital converter, first we have used XIC tool to compose a circuit schematic, and then studied the operational principle of the circuit with WRSPICE tool. Through this process, we obtained the proper circuit diagram of an 1-bit analog-digital converter circuit. Based on this circuit we performed margin calculations of the designed circuits and optimized circuit parameters. The optimized circuit was laid out as a mask drawing. Inductance values of the circuit layout were calculated with L-meter. Circuit inductors were adjusted according to these calculations and the final layout was obtained.

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A CMOS Image Sensor with Analog Gamma Correction using a Nonlinear Single Slope ADC (비선형 단일 기울기 ADC를 사용하여 아날로그 감마 보정을 적용한 CMOS 이미지 센서)

  • Ham Seog-Heon;Han Gunhee
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.1 s.343
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    • pp.65-70
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    • 2006
  • An image sensor has limited dynamic range while the human eye has logarithmic response over wide range of light intensity. Although the sensor gain can be set high to identify details in darker area on the image, this results in saturation in brighter area. The gamma correction is essential to fit the human eye response. However, the digital gamma correction degrades image quality especially for darker area on the image due to the limited ADC resolution and the dynamic range. This Paper proposes a CMOS image sensor (CIS) with a nonlinear analog-to-digital converter (AU) which performs analog gamma correction. The CIS with the proposed nonlinear analog-to-digital conversion scheme was fabricated with a $0.35{\mu}m$ CMOS process. The analog gamma correction using the proposed nonlinear ADC CIS provides the 2.2dB peak-signal-to-noise-ratio(PSM) improved image qualify than conventional digital gamma correction. The PSNR of the image obtain from the digital gamma correction is 25.6dB while it is 27.8dB for analog gamma correction. The PSNR improvement over digital gamma correction is about $28.8\%$.

A Design of CMOS Analog-Digital Converter for High-Speed . Low-power Applications (고속 . 저전력 CMOS 아날로그-디지탈 변환기 설계)

  • Lee, Seong-Dae;Hong, Guk-Tae;Jeong, Gang-Min
    • The Transactions of the Korea Information Processing Society
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    • v.2 no.1
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    • pp.66-74
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    • 1995
  • A 8-bit 15MHz CMOS subranging Analog-to-Digital converter for high-speed, low-power consumption applications is described. Subranging, 2 step flash, A/D converter used a new resistor string and a simple comparator architecture for the low power consumption and small chip area. Comparator exhibites 80dB loop gain, 50MHz conversion speed, 0.5mV offset and maximum error of voltage divider was 1mV. This Analog-to-Digital converter has been designed and fabricated in 1.2 m N-well CMOS technology. It consumed 150mW power at +5/-5V supply and delayed 65ns. The proposed Analog-to-Digital converter seems suitable for high- speed, low-power consumption, small area applications and one-chip mixed Analog- Digital system. Simulations are performed with PSPICE and a fabricated chip is tested.

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Simultaneous Static Testing of A/D and D/A Converters Using a Built-in Structure

  • Kim, Incheol;Jang, Jaewon;Son, HyeonUk;Park, Jaeseok;Kang, Sungho
    • ETRI Journal
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    • v.35 no.1
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    • pp.109-119
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    • 2013
  • Static testing of analog-to-digital (A/D) and digital-to-analog (D/A) converters becomes more difficult when they are embedded in a system on chip. Built-in self-test (BIST) reduces the need for external support for testing. This paper proposes a new static BIST structure for testing both A/D and D/A converters. By sharing test circuitry, the proposed BIST reduces the hardware overhead. Furthermore, test time can also be reduced using the simultaneous test strategy of the proposed BIST. The proposed method can be applied in various A/D and D/A converter resolutions and analog signal swing ranges. Simulation results are presented to validate the proposed method by showing how linearity errors are detected in different situations.

Digital Transofrmation and Leapfrogging of a Catching-up Country: the Case of Korean Digital TV Industry (디지털 전환기의 후발국 기술추격 패턴 분석 : 디지털 TV 사례)

  • Song, Wi-Chin;Lee, Geun;Lim, Chai-Sung
    • Journal of Technology Innovation
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    • v.12 no.3
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    • pp.205-227
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    • 2004
  • This paper examined the leapfrogging of Korean Digital TV Industry in the midst of digital Revolution. Despite the lack of sufficient capability and core knowledge base, the Korean firms succeeded in the catching up forerunner firms in the Digital TV industry. The reasons of the success of Korean firms were as follows. Firstly, the Korean firms had some complementary asset, such as the experience of producing analog TV, and were able to develop the prototype digital TV given the accesses to the foreign knowledge via overseas R&D posts and acquisition of a foreign company. Secondly, the Korean firms were not locked in the analog technologies. As a follower, they had little sunk cost on the existing analog technologies. Thirdly, New mode of innovation, such as National R&D program for the development of HDTV and ASIC, were used as a tool for the mobilization of scarce knowledge base of digital technologies and the sharing the risks of development of path-breaking new technologies.

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A 1-8V 8-bit 300MSPS CMOS Analog to Digital Converter with high input frequence (네트워크 인터페이스를 위한 1-8V 8-bit 300MSPS 고속 CMOS ADC)

  • 주상훈;송민규
    • Proceedings of the IEEK Conference
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    • 2002.06b
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    • pp.197-200
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    • 2002
  • In this paper, presents a 1.8V 8-bit 300MSPS CMOS Subranging Analog to Digital Converter (ADC) with a novel reference multiplex is described. The proposed hか converter is composed of Sub A/D Converter block, MUX (Multiplexer) block and digital block. In order to obtain a high-speed operation, further, a novel dynamic latch, an encoder of novel algorithm and a MUX block are proposed. As a result, this A/D Converter is operated 100MHz input frequence by 300MHz sampling rate.

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Design of 3V a Low-Power CMOS Analog-to-Digital Converter (3V 저전력 CMOS 아날로그-디지털 변환기 설계)

  • 조성익;최경진;신홍규
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.36C no.11
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    • pp.10-17
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    • 1999
  • In this paper, CMOS IADC(Current-mode Analog-to-Digital Converter) which consists of only CMOS transistors is proposed. Each stages is made up 1.5-bit bit cells composed of CSH(Current-mode Sample-and-Hold) and CCMP(Current Comparator). The differential CSH which designed to eliminate CFT(Clock Feedthrough), to meet at least 9-bit resolution, is placed at the front-end of each bit cells, and each stages of bit cell ADSC (Analog-to-Digital Subconverter) is made up two latch CCMPs. With the HYUNDAI TEX>$0.65\mu\textrm{m}$ CMOS parameter, the ACAD simulation results show that the proposed IADC can be operated with 47 dB of SINAD(Signal to Noise- Plus-Distortion), 50dB(8-bit) of SNR(Signal-to-Noise) and 37.7 mW of power consumption for input signal of 100 KHz at 20 Ms/s.

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Digital Calibration Technique for Cyclic ADC based on Digital-Domain Averaging of A/D Transfer Functions (아날로그-디지털 전달함수 평균화기법 기반의 Cyclic ADC의 디지털 보정 기법)

  • Um, Ji-Yong
    • Journal of the Institute of Electronics and Information Engineers
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    • v.54 no.6
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    • pp.30-39
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    • 2017
  • A digital calibration technique based on digital-domain averaging for cyclic ADC is proposed. The proposed calibration compensates for nonlinearity of ADC due to capacitance mismatch of capacitors in 1.5-bit/stage MDAC. A 1.5-bit/stage MDAC with non-matched capacitors has symmetric residue plots with respect to the ideal residue plot. This intrinsic characteristic of residue plot of MDAC is reflected as symmetric A/D transfer functions. A corrected A/D transfer function can be acquired by averaging two transfer functions with non-linearity, which are symmetric with respect to the ideal analog-digital transfer function. In order to implement the aforementioned averaging operation of analog-digital transfer functions, a 12-bit cyclic ADC of this work defines two operational modes of 1.5-bit/stage MDAC. By operating MDAC as the first operational mode, the cyclic ADC acquires 12.5-bits output code with nonlinearity. For the same sampled input analog voltage, the cyclic ADC acquires another 12.5-bits output code with nonlinearity by operating MDAC as the second operational mode. Since analog-digital transfer functions from each of operational mode of 1.5-bits/stage MDAC are symmetric with respect to the ideal analog-digital transfer function, a corrected 12-bits output code can be acquired by averaging two non-ideal 12.5-bits codes. The proposed digital calibration and 12-bit cyclic ADC are implemented by using a $0.18-{\mu}m$ CMOS process in the form of full custom. The measured SNDR(ENOB) and SFDR are 65.3dB (10.6bits) and 71.7dB, respectively. INL and DNL are measured to be -0.30/-0.33LSB and -0.63/+0.56LSB, respectively.

Low-power Analog-to-Digital Converter for video signal processing (비디오 신호처리용 저전력 아날로그 디지털 변환기)

  • 조성익;손주호;김동용
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.24 no.8A
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    • pp.1259-1264
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    • 1999
  • In this paper, the High-speed, Low-power Analog-Digital Conversion Archecture is porposed using the Pipelined archecture for High-speed conversion rate and the Successive-Approximation archecture for Low-power consumption. This archecture is the Successive-Approximation archecture using Pipelined Comparator array to change reference voltage during Holding Time. The Analog-to-Digital Converter for video processing is designed using 0.8${\mu}{\textrm}{m}$ CMOS tchnology. When an 6-bit 10MS/s Analog-to-Digital Converter is simulatined, the INL/DNL errors are $\pm$0.5/$\pm$1, respectively. The SNR is 37dB at a sampling rate of 10MHz with 100KHz sine input signal. The power consumption is 1.46mW at 10MS/s. When an 8-bit 10MS/s Analog-to Digital Converter is simulatined, the INL/DNL errors are $\pm$0.5/$\pm$1, respectively. The SNR is 41dB at a sampling rate of 100MHz with 100KHz sine input signal. The power consumption is 4.14m W at 10MS/s.

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Analog Signal Conditioner Using Fuzzy Logic Technique

  • Maipradith, N.;Riewruja, V.;Chaikla, A.;Julsereewong, P.;Ukakimaparn, P.
    • 제어로봇시스템학회:학술대회논문집
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    • 2000.10a
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    • pp.472-472
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    • 2000
  • An analog signal conditioner using fuzzy logic technique, which has multiple-input and multiple-output terminals, is proposed in this paper. The proposed signal conditioner can be employed to linearly translate the level of signals to a standard voltage signal (1-5V) and convert the form of signals to a standard current signal (4-20mA). The implementation method based on the use of a commercial 8-bit microcontroller, the analog-to-digital (A/D) converters, the digital-to-analog (D/A) converters and the voltage-to-current (V/I) converter. The simulation result and the experimental results are presented, which further confirm the feasibility of this approach.

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