• Title/Summary/Keyword: Ambipolar

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The modulation of an ambipolar silicon nanowire FET through illumination (빛을 이용한 Ambipolar 실리콘 나노와이어 FET의 모듈래이션)

  • Lee, Kyoung-Gun;Lee, Kook-Nyung;Lee, Min-Ho;Jung, Suk-Won
    • Proceedings of the KIEE Conference
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    • 2011.07a
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    • pp.1708-1709
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    • 2011
  • 본 논문에서는 Ambipolar 실리콘 나노와이어 FET (SiNW FET)의 빛을 통한 모듈래이션을 분석하였다. Ambipolar SiNW FET를 얻기 위해서는 나노와이어가 저농도로 도핑된 실리콘이어야 한다. 실리콘의 비등방성 습식식각 이후, 산화 공정을 통한 나노와이어 제작을 통해 보론의 확산을 통해 저농도로 도핑된 실리콘 나노와이어를 제작하였다. 빛이 조사될 시에 생기는 Ambipolar SiNW FET의 모듈래이션 특성에 관해 분석하고 간단한 응용 실험을 통하여 검증하였다. 응용 실험 결과 pH 센싱의 감도는 빛을 10000 lux 조사할 경우 8.84 배 증가하였다.

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High performance ambipolar organic transistors

  • Lee, Mi-Jung;Chen, Zhuoying;Sirringhaus, Henning
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2012.05a
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    • pp.54.1-54.1
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    • 2012
  • Recent significant development of organic electronics is worthy of notice for its practical application as well as fundamental understandings. Complementary-like logic circuit is a key factor to realize actual operating organic electronic devices since its advantages of low power dissipation, good noise margin and stable operations. In this reason, studies on ambipolar properties of organic materials which can act as either n-type or p-type are getting more attentions. Performances of ambipolar transistors vary a lot along its molecular structures and film properties. When properly fabricated, balanced hole and electron mobilities over 1 cm2/Vs were observed recently. Study of charge transport in ambipolar organic transistors to understand this high performance was carried out through charge modulation spectroscopy.

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Ambipoalr light-emitting organic field-effect transistor using a wide-band-gap blue-emitting molecule

  • Sakanoue, Tomo;Yahiro, Masayuki;Adachi, Chihaya
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.137-140
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    • 2007
  • We prepared ambipolar organic field-effect transistors and observed blue emission when both hole and electron accumulation layers were in the channel. We found that the reduction of carrier traps and controlling devices' preparation and measurement conditions were crucial for ambipolar operation.

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Assessment of Ambipolar Behavior of a Tunnel FET and Influence of Structural Modifications

  • Narang, Rakhi;Saxena, Manoj;Gupta, R.S.;Gupta, Mridula
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.12 no.4
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    • pp.482-491
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    • 2012
  • In the present work, comprehensive investigation of the ambipolar characteristics of two silicon (Si) tunnel field-effect transistor (TFET) architectures (i.e. p-i-n and p-n-p-n) has been carried out. The impact of architectural modifications such as heterogeneous gate (HG) dielectric, gate drain underlap (GDU) and asymmetric source/drain doping on the ambipolar behavior is quantified in terms of physical parameters proposed for ambipolarity characterization. Moreover, the impact on the miller capacitance is also taken into consideration since ambipolarity is directly related to reliable logic circuit operation and miller capacitance is related to circuit performance.

Annealing Effects on Ambipolar Characteristics of Diketopyrrolopyrrole-Based Polymer Thin-Film Transistors (Annealing 효과가 Diketopyrrolopyrrole 기반 고분자 박막 트랜지스터의 양극성 특성에 미치는 영향)

  • Yoon, Gyu Bok;Lee, Jiyoul
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.30 no.3
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    • pp.180-184
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    • 2017
  • In this study, we examine the electrical properties of diketopyrrolopyrrole (DPP) containing polymer semiconductors that have been reported to show high performance with ambipolar characteristics. We prepared three different DPP based polymer semiconductors (PDPPTPT, PDPP3T, and PDPP2T-TT) and fabricated organic thin film transistors (OTFTs) with ambipolar polymer semiconductors as an active layer. All three DPP polymers showed only p-type properties at initial measurements. However, after annealing in vacuum oven for 24 hours, it was found that the DPP based polymers have both p-type and n-type properties. It is speculated that the residual impurities supposedly regarded as a strong electron trap source were eliminated during the vacuum process.

Electrical Characteristics of Ambipolar Thin Film Transistor Depending on Gate Insulators (게이트 절연특성에 의존하는 양방향성 박막 트랜지스터의 동작특성)

  • Oh, Teresa
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.18 no.5
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    • pp.1149-1154
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    • 2014
  • To observe the tunneling phenomenon of oxide semiconductor transistor, The Indium-gallum-zinc-oxide thin film transistors deposited on SiOC as a gate insulator was prepared. The interface characteristics between a dielectric and channel were changed in according to the properties of SiOC dielectric materials. The transfer characteristics of a drain-source current ($I_{DS}$) and gate-source voltage ($V_{GS}$) showed the ambipolar or unipolar features according to the Schottky or Ohmic contacts. The ambipolar transfer characteristics was obtained at a transistor with Schottky contact in a range of ${\pm}1V$ bias voltage. However, the unipolar transfer characteristics was shown in a transistor with Ohmic contact by the electron trapping conduction. Moreover, it was improved the on/off switching in a ambipolar transistor by the tunneling phenomenon.

Design of Double-Independent-Gate Ambipolar Silicon-Nanowire Field Effect Transistor (양극성 이중 독립 게이트 실리콘 나노와이어 전계 효과 트랜지스터 설계)

  • Hong, Seong-Hyeon;Yu, YunSeop
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.19 no.12
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    • pp.2892-2898
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    • 2015
  • We propose a new Double-Independent-Gate Ambipolar Silicon-Nanowire Field Effect Transistor(DIG Ambi-SiNWFET). The proposed transistor has two types of gate such as polarity gate and control gate. The polarity gate determines the operation that the gate bias controls NMOSFET or PMOSFET. The voltage of control gate controls the current characteristic of the transistor. We investigated systematically work functions of the two gates and source/drain to operate ambipolar current-voltage characteristics using 2D device simulator. When the work functions of polarity gate, control gate and source/drain are 4.75eV, 4.5eV, and 4.8eV, respectively, it showed the obvious ambipolar characteristics.

Ambipolarity Factor of Tunneling Field-Effect Transistors (TFETs)

  • Jang, Jung-Shik;Choi, Woo-Young
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.11 no.4
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    • pp.272-277
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    • 2011
  • The ambipolar behavior of tunneling field-effect transistors (TFETs) has been investigated quantitatively by introducing a novel parameter: ambipolarity factor (${\nu}$). It has been found that the malfunction of TFET can result from the ambipolar state which is not on- or off- state. Therefore, the effect of ambipolar behavior on the device performance should be parameterized quantitatively, and this has been successfully evaluated as a function of device structure, gate oxide thickness, supply voltage, drain doping concentration and body doping concentration by using ${\nu}$.

High-Mobility Ambipolar Polymer Semiconductors by Incorporation of Ionic Additives for Organic Field-Effect Transistors and Printed Electronic Circuits (이온성 첨가제 도입을 통한 고이동도 고분자 반도체 특성 구현과 유기전계효과트랜지스터 및 유연전자회로 응용 연구)

  • Lee, Dong-Hyeon;Moon, Ji-Hoon;Park, Jun-Gu;Jung, Ji Yun;Cho, Il-Young;Kim, Dong Eun;Baeg, Kang-Jun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.31 no.3
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    • pp.129-134
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    • 2018
  • Herein, we report the manufacture of high-performance, ambipolar organic field-effect transistors (OFETs) and complementary-like electronic circuitry based on a blended, polymeric, semiconducting film. Relatively high and well-balanced electron and hole mobilities were achieved by incorporating a small amount of ionic additives. The equivalent P-channel and N-channel properties of the ambipolar OFETs enabled the manufacture of complementary-like inverter circuits with a near-ideal switching point, high gain, and good noise margins, via a simple blanket spin-coating process with no additional patterning of each active P-type and N-type semiconductor layer.