• Title/Summary/Keyword: Accelerated Failure Time

Search Result 162, Processing Time 0.027 seconds

Optimum failure-censored step-stress partially accelerated life test for the truncated logistic life distribution

  • Srivastava, P.W.;Mittal, N.
    • International Journal of Reliability and Applications
    • /
    • v.13 no.1
    • /
    • pp.19-35
    • /
    • 2012
  • This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.

  • PDF

An Accelerated Degradation Test of Nuclear Power Plants Communication Cable Jacket (원자력 발전소용 통신케이블 자켓의 가속열화시험)

  • Jung, Jae Han;Kim, Yong Soo
    • Journal of Korean Society for Quality Management
    • /
    • v.45 no.4
    • /
    • pp.969-980
    • /
    • 2017
  • Purpose: The purpose of this study was to estimate the lifetime, and verify the target lifetime at steady state temperature, of communication cable jackets used in nuclear power plants. Method: This study was completed according to test and analysis methods required by international standards. After measuring the residual elongation(%) of specimens at specific points in time with the accelerated degradation test, average failure time of each temperature was computed. Thus, the activation energy could be derived by applying the temperature-Arrhenius law to estimate cable jacket lifetime at steady state temperature. Results: The cable jacket lifetime was estimated as 363.8 years assuming a normal nuclear power plant operating temperature of $90^{\circ}C$. Conclusion: To ascertain stable operating conditions for a nuclear power plant, accelerated degradation tests were performed according to the Arrhenius law for components of the nuclear power plants. The lifetime was estimated from the degradation data collected during the accelerated degradation test.

Optimal Plan for Fully Accelerated Life Tests with Three-Step Stress Under Type I Censoring

  • Moon, Kyoung-Ae;Shin, Im-Hee
    • Journal of the Korean Data and Information Science Society
    • /
    • v.7 no.2
    • /
    • pp.295-299
    • /
    • 1996
  • In this paper, optimal change times are determined for fully three-step stress accelerated life tests, which minimize the asymptotic variance for maximum likelihood estimator of logarithm of the failure rate at the usual condition and exponential distribution is given for life time data.

  • PDF

Design of ramp-stress accelerated life test plans for a parallel system with two independent components using masked data

  • Srivastava, P.W.;Savita, Savita
    • International Journal of Reliability and Applications
    • /
    • v.18 no.2
    • /
    • pp.45-63
    • /
    • 2017
  • In this paper, we have formulated optimum Accelerated Life Test (ALT) plan for a parallel system with two independent components using masked data with ramp-stress loading scheme and Type-I censoring. Consider a system of two independent and non-identical components connected in parallel. Such a system fails whenever all of its components has failed. The exact component that causes the system to fail is often unknown due to cost and time constraint. For each parallel system at test, we observe its system's failure time and a set of component that includes the component actually causing the system to fail. The stress-life relationship is modelled using inverse power law, and cumulative exposure model is assumed to model the effect of changing stress. The optimal plan consists in finding out the optimum stress rate using D-optimality criterion. The method developed has been explained using a numerical example and sensitivity analysis carried out.

  • PDF

A Study on Accelerated Life Test of Halogen Lamps for Medical Device (의료용 할로겐램프의 가속수명시험에 관한 연구)

  • Jung, Jae Han;Kim, Myung Soo;Lim, Heonsang;Kim, Yong Soo
    • Journal of Korean Society for Quality Management
    • /
    • v.41 no.4
    • /
    • pp.659-672
    • /
    • 2013
  • Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test. Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models. Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively. Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.

Efficient Process Control Through Research on Storage Lifetime of a White Smoke Hand Grenade, KM8 (저장수명 연구를 통한 백색 연막수류탄(KM8)의 공정관리 효율화)

  • Chang, Il-Ho;Hong, Suk-Hwan;Back, Seung-Jun;Son, Young-Kap
    • Journal of the Korea Institute of Military Science and Technology
    • /
    • v.14 no.5
    • /
    • pp.888-896
    • /
    • 2011
  • A white smoke hand grenade, KM8 is used to make smoke screen in order to provide visual field interceptions or signals. The grenade fails when its time to emit smoke is longer than the specified emission time so that the smoke concentration becomes lighter. This paper considered failure in smoke emission time, and evaluated its storage lifetime. The main objective of this paper is to modify the present specification limits of smoke emission time for the efficient process control in manufacturing, through analyzing effect of its specification change on the storage lifetime, based on the lifetime evaluation results. Accelerated degradation test was performed and then failure in smoke emission time was reproduced from the test. And estimated storage lifetimes from the accelerated test results was compared to evaluated lifetimes of grenades using the ASRP data. Past process testing results of the grenade in manufacturing were analyzed in this paper. Then, each storage lifetime for the specifications, ${\pm}3$ and ${\pm}5$ in seconds, extended from the current specification in manufacturing were estimated using the past testing results, and compared to one another.

Conditional Confidence Interval for Parameters in Accelerated Life Testing

  • Park, Byung-Gu;Yoon, Sang-Chul
    • Journal of the Korean Data and Information Science Society
    • /
    • v.7 no.1
    • /
    • pp.21-35
    • /
    • 1996
  • In this paper, estimation and prediction procedures are discussed for grneral situation in which the failure time follows the independent density $f_{i}({\varepsilon}_{i})$ for the accelerated life testing under Type II censoring. In the context of accelerated life test experiment, procedures are given for estimating the parameters in the Eyring model, and for estimating mean life at a given future stress level. The procedures given are conditional confidence interval procedures, obtained by conditioning on ancillary statistics. A comparison is made of these procedures and procedures based on asymptotic properties of the maximum, likelihood estimates.

  • PDF

Comparison to Automobile Pilot Lamp by Accelerated Life Test (가속수명시험을 통한 자동차용 파일럿램프의 비교평가)

  • Shin, Min-Gyung;Wei, Shin-Hwan;Kim, Hyung-Min
    • Journal of Applied Reliability
    • /
    • v.8 no.2
    • /
    • pp.75-85
    • /
    • 2008
  • In this paper, we compared domestic with foreign pilot lamps installed on the instrument board or electronic modules (car audio, air-conditional system, etc.) of an automotive vehicle by an accelerated life test in order to estimate the life of domestic pilot lamps. An accelerated life test method was developed and the relation of the life and voltage stress was analyzed. The main results are as follows; i) $B_{10}$ life of pilot lamp is above 5,000 hours, vehicle travel time for 10 years. ii) the life of domestic pilot lamp is longer than that of foreign thing. iii) the life distribution of domestic pilot lamp is wider than that of foreign thing. iv) it is possible to promote import replacement of automobile pilot lamp.

  • PDF

Accelerated Life Test Selection Study for Life Evaluation of Engine Type Drive Axle for Forklift (지게차용 엔진식 드라이브 액슬 수명평가를 위한 가속수명시험 선정 연구)

  • Jun-Young Kim;Yeong Jun Yu;Chul-Hee Lee
    • Journal of Drive and Control
    • /
    • v.20 no.3
    • /
    • pp.9-14
    • /
    • 2023
  • In this paper, the selection of a reliable accelerated life test code for a 2-ton forklift was accomplished by choosing the driving resistance coefficient failure-free test time based on a 10,000-hour B10 life. The overall life and average equivalent load of the vehicle were then calculated based on actual driving test conditions using the selected driving resistance coefficient. The gear train's accelerated life test code was selected by adjusting the equivalent load to a torque and rotation speed that did not exceed 125%(about 75HP) of the vehicle rated power. The safety of the test standards was validated by conducting an actual accelerated life test utilizing the proposed test method in this study and comparing the test result with the corresponding theoretical value. It is anticipated that the reliability of the accelerated life test in this paper will be enhanced, by incorporating actual driving performance data collected directly from the forklift and adjusting the conditions used in developing the accelerated life test code.

The study on Accelerated Life-Time Reliability Test Methods of Ni-Mn-B ternary alloy Plating(electrodeposit) (Ni-Mn-B 삼원합금도금 가속수명 및 신뢰성 평가에 대한 연구)

  • Ma, Seung-hwan;Noh, young-tai;Jang, gun-ik
    • Journal of the Korea Academia-Industrial cooperation Society
    • /
    • v.16 no.5
    • /
    • pp.2993-2999
    • /
    • 2015
  • Steel companies are applying Ni-B or Ni-Co alloy plating to protect the surface of Continuous casting mold, and they are using saccharin polish which causes crack on plating layer due to sulfur in saccharin. It is considered that the Ni-S compound causes the cracking and additional tensile stresses. The Ni-Mn-B ternary alloy plating was developed for suppression of crack by forming Mn-S compound before Ni-S compound is formed, but there were no domestic or international standard on the Ni-Mn-B alloy plating. Therefore, reliability evaluation standard was established to evaluate the newly developed Ni-Mn-B plating. To develop accelerating life testing method, FMEA(Failure Mode & Effective analysis) was used to analyze the cause of the main failure in plating. The Ni-Mn-B reliability standard included accelerating life test method, and it was categorized by the fundamental performance test, environment test, and accelerated life test, and was designed to guarantee 1 000 hours of B10 life with 80 % reliable level.