• Title/Summary/Keyword: Ac-Bias

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Contactless Electroreflectance Spectroscopy of In0.5(Ga1-xAlx)0.5P/GaAs Double Heterostructures (In0.5(Ga1-xAlx)0.5P/GaAs 이중 이종접합 구조의 Contactless Electroreflectance에 관한 연구)

  • Kim, Jeong-Hwa;Jo, Hyun-Jun;Bae, In-Ho
    • Journal of the Korean Vacuum Society
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    • v.19 no.2
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    • pp.134-140
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    • 2010
  • We have investigated the contactless electroreflectance (CER) properties of $In_{0.5}(Ga_{1-x}Al_x)_{0.5}P$/GaAs double heterostructures grown by metal-organic chemical vapour deposition (MOCVD). The CER measurements on the sample were studied as a function of temperature, modulation voltage ($V_{ac}$), and dc bias voltage ($V_{bias}$). Five signals observed at room temperature are related to the GaAs, $In_{0.5}Ga_{0.5}P$, $In_{0.5}(Ga_{0.73}Al_{0.27})_{0.5}P$, $In_{0.5}(Ga_{0.5}Al_{0.5})_{0.5}P$, and $In_{0.5}(Ga_{0.2}Al_{0.8})_{0.5}P$ transitions, respectively. From the temperature dependence of CER spectrum, the Varshni coefficients and broadening parameters were determined and discussed. In addition, we found that the behavior of the CER amplitude for the reverse bias is larger than that of the forward.

Who Can Perform Adjuvant Chemotherapy Treatment for Gastric Cancer? A Multicenter Retrospective Overview of the Current Status in Korea

  • Min, Jae-Seok;Lee, Chang Min;Choi, Sung Il;Seo, Kyung Won;Park, Do Joong;Baik, Yong Hae;Son, Myoung-Won;Choi, Won Hyuk;Kim, Sungsoo;Pak, Kyung Ho;Kim, Min Gyu;Park, Joong-Min;Jeong, Sang Ho;Lee, Moon-Soo;Park, Sungsoo
    • Journal of Gastric Cancer
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    • v.18 no.3
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    • pp.264-273
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    • 2018
  • Purpose: To investigate the current status of adjuvant chemotherapy (AC) regimens in Korea and the difference in efficacy of AC administered by surgical and medical oncologists in patients with stage II or III gastric cancers. Materials and Methods: We performed a retrospective observational study among 1,049 patients who underwent curative resection and received AC for stage II and III gastric cancers between February 2012 and December 2013 at 29 tertiary referral university hospitals in Korea. To minimize the influence of potential confounders on selection bias, propensity score matching (PSM) was used based on binary logistic regression analysis. The 3-year disease-free survival (DFS) rates were compared between patients who received AC administered by medical oncologists or surgical oncologists. Results: Between February 2012 and December 2013 in Korea, the most commonly prescribed AC by medical oncologists was tegafur/gimeracil/oteracil (S-1, 47.72%), followed by capecitabine with oxaliplatin (XELOX, 16.33%). After performing PSM, surgical oncologists (82.74%) completed AC as planned more often than medical oncologists (75.9%), with statistical significance (P=0.036). No difference in the 3-year DFS rates of stage II (P=0.567) or stage III (P=0.545) gastric cancer was found between the medical and surgical oncologist groups. Conclusions: S-1 monotherapy and XELOX are a main stay of AC, regardless of whether the prescribing physician is a medical or surgical oncologist. The better compliance with AC by surgical oncologists is a valid reason to advocate that surgical oncologists perform the treatment of AC for stage II or III gastric cancers.

The Electrical Properties of Gate Oxide due to the Variation of Thickness (두께 변화에 따른 Gate Oxide의 전기적 특성)

  • Park, Jung-Goo;Hong, Nung-Pyo;Lee, Yong-Woo;Kim, Wang-Gon;Hong, Jin-Woong
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1931-1933
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    • 1999
  • In this paper, the current and voltage properties on the gate oxide film due to the variation of thickness are studied. The specimen is used for n-ch power MOSFET. It is shows the leakage current and current density characteristics due to the applied electric field when the oxide thickness is each $600[\AA],\;800[\AA]$ and $1000[\AA]$, respectively. We known that the leakage current is a little higher when the voltage as reverse bias contrast with forward bias in poly gate is applied. In order to experiment for AC properties is measured for capacitance characteristics. It is confirmed that the value of input capacitance have been a lot of influenced on $SiO_2$ thickness contrast with the value of output capacitance.

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Characterization of YBCO do SQUID fabricated on sapphire substrate for biomagnetic applications (생체자기 응용을 위한 사파이어 기판 위에 제작된 YBCO dc SQUID 의 특성)

  • Lim, Hae-Ryong;Kim, In-Seon;Kim, Dong-Ho;Park, Yong-Ki;Park, Jong-Chul
    • 한국초전도학회:학술대회논문집
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    • v.10
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    • pp.155-159
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    • 2000
  • YBCO step-edge dc SQUID magnetometers on sapphire substrates have been fabricated. CeO2 buffer layer and YBCO films were deposited in situ on the low angle (${\sim}$35$^{\circ}$) steps formed on the sapphire substrates. Typical 5-${\mu}$m-wide junction has R$_n$ of 5 ${\omega}$ and I$_c$ of 50 ${\mu}$A with large I$_c$R$_n$ product of 250 ${\mu}$V at 77K. According to applied bias current, depth of voltage modulation was changed and maximum voltage was measured 16 ${\mu}$V. Field noise of do SQUID was measured 100${\sim}$300 fT/${\surd}^{Hz}$ in the 1 $^{kHz}$, and about 1.5 pT/${\surd}^{Hz}$ in the 1/f region. For ac bias reversal method, field noise was decreased in the 1/f region. The QRS peak of magnetocardiogram was measured 50 pT in the magnetically shielded room.

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A Study on the Glow Discharge Characteristics of MgO thin film prepared by Unbalanced Magnetron Sputtering (불평형 마그네트론 스파터링에 의해 형성된 MgO 박막의 글로우 방전특성에 관한 연구)

  • Kim, Young-Kee;Park, Jung-Tae;Ko, Kwang-Sic;Kim, Gyu-Seup;Park, Chung-Hoo;Cho, Jung-Soo
    • Proceedings of the KIEE Conference
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    • 1999.07e
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    • pp.2236-2238
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    • 1999
  • This paper deals with the surface glow discharge characteristics and some physical properties of MgO thin films prepared by RF unbalanced magnetron sputtering(UBMS) in surface discharge type AC PDP. The minimum discharge voltage is obtained for the sample of substrate holder bias voltage -10V. The main factors that improves the discharge characteristics by applied bias voltage is considered to be due to the morphology changes or crystal structure of the MgO thin film by ion bombardment during deposition process Moreover, the anti-sputtering characteristics of MgO thin film by UBMS is more excellent than that of balanced magnetron sputtering(BMS) and E-beam evaporation method.

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Dynamic Magneto-mechanical Behavior of an Iron-nickel-based Ferromagnetic Alloy with Constant Elasticity

  • Bian, Leixiang;Wen, Yumei;Li, Ping;Gao, Qiuling;Liu, Xianxue
    • Journal of Magnetics
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    • v.14 no.2
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    • pp.66-70
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    • 2009
  • The dynamic magneto-mechanical behaviors in a type of iron-nickel-based ferromagnetic alloy with constant elasticity were investigated as a function of both the DC bias magnetic field ($H_{dc}$) and the frequency. The rectangular plate-like samples were excited to vibrate at a half-wavelength, longitudinal resonance by an AC magnetic field superimposed with various $H_{dc}$. The experimental results found that the strain coefficient at resonance reached 819.34 nm/A and the effective mechanical quality factor ($Q_m$) was greater than 2000. The ratio of the maximum variation of the Young's modulus over $H_{dc}$ to the value of the Young's modulus at a zero bias field was only ${\sim}0.83%o$ because of the so-called constant elasticity. The resonant strain coefficients and $Q_m$ are strongly dependent on $H_{dc}$, which indicates a promising potential for use in DC and quasistatic magnetic field sensing.

The reliability physics of SiGe hetero-junction bipolar transistors (실리콘-게르마늄 이종접합 바이폴라 트랜지스터의 신뢰성 현상)

  • 이승윤;박찬우;김상훈;이상흥;강진영;조경익
    • Journal of the Korean Vacuum Society
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    • v.12 no.4
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    • pp.239-250
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    • 2003
  • The reliability degradation phenomena in the SiGe hetero-junction bipolar transistor (HBT) are investigated in this review. In the case of the SiGe HBT the decrease of the current gain, the degradation of the AC characteristics, and the offset voltage are frequently observed, which are attributed to the emitter-base reverse bias voltage stress, the transient enhanced diffusion, and the deterioration of the base-collector junction due to the fluctuation in fabrication process, respectively. The reverse-bias stress on the emitter-base junction causes the recombination current to rise, increasing the base current and degrading the current gain, because hot carriers formed by the high electric field at the junction periphery generate charged traps at the silicon-oxide interface and within the oxide region. Because of the enhanced diffusion of the dopants in the intrinsic base induced by the extrinsic base implantation, the shorter distance between the emitter-base junction and the extrinsic base than a critical measure leads to the reduction of the cut-off frequency ($f_t$) of the device. If the energy of the extrinsic base implantation is insufficient, the turn-on voltage of the collector-base junction becomes low, in the result, the offset voltage appears on the current-voltage curve.

DC/AC bias stability of a-IGZO TFT and New AC programmed Shift Register (비정질 IGZO 박막 트랜지스터의 직류/교류 바이어스 신뢰성과 교류 동작하는 시프트 레지스터)

  • Woo, Jong-Seok;Lee, Young-Wook;Kang, Dong-Won;Han, Min-Koo
    • Proceedings of the KIEE Conference
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    • 2011.07a
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    • pp.1420-1421
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    • 2011
  • 비정질 IGZO 박막 트랜지스터에 포지티브 직류/교류 게이트 바이어스를 인가하여 신뢰성을 분석하고 비정질 IGZO 박막 트랜지스터의 신뢰성을 고려한 시프트 레지스터 회로를 설계하였다. 비정질 IGZO 박막 트랜지스터의 문턱전압은 바이어스 스트레스가 인가되었을 때 양의 방향으로 이동하였고, 전류가 감소하였다. 또한 문턱전압은 직류 바이어스 스트레스가 인가되었을 때 교류 바이어스 스트레스가 인가 되었을 때 보다 더 양의 방향으로 이동하였다. 총 8개의 박막 트랜지스터로 구성된 일반적인 시프트 레지스터 회로에서는 특정 박막 트랜지스터에 직류 바이어스 스트레스가 걸리기 때문에 비정질 IGZO 박막 트랜지스터를 이용하여 구동할 때 회로 오동작을 유발할 수 있다. 비정질 IGZO 박막 트랜지스터의 신뢰성 결과를 고려하여 총 9개의 박막 트랜지스터로 구성된 교류 동작하는 시프트 레지스터 회로를 설계하였다. 모든 소자에 직류 바이어스 스트레스가 걸리지 않도록 회로를 설계하였으며, 추가된 트랜지스터의 채널 너비가 매우 작기 때문에 트랜지스터가 하나 추가되어도 회로가 차지하는 면적에는 거의 변화가 없다. 바이어스 스트레스에 따른 소자 열화를 고려하여 시뮬레이션을 해 본 결과 일반적인 회로에서는 회로 오동작이 관측된 반면, 제안한 회로에서는 문제없이 동작하는 것을 확인하였다.

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Integrated Gate Driver Circuit Using a-Si TFT with AC-Driven Dual Pull-down Structure

  • Jang, Yong-Ho;Yoon, Soo-Young;Kim, Binn;Chun, Min-Doo;Cho, Hyung-Nyuck;Cho, Nam-Wook;Sohn, Choong-Yong;Jo, Sung-Hak;Choi, Seung-Chan;Kim, Chang-Dong;Chung, In-Jae
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.944-947
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    • 2005
  • Highly stable gate driver circuit using a-Si TFT has been developed. The circuit has dual-pull down structure, in which bias stress to the TFTs is relieved by alternating applied voltage. The circuit has been successfully integrated in 4-in. QVGA and 14-in. XGA TFT-LCD with a normal a-Si process, which are stable for over 2,000 hours at $60^{\circ}C$. The enhancement of stability of the circuit is attributed to retarded degradation of pull-down TFTs by AC driving.

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Semiconductive Properties of Passivating TiO2 Film as Photoanode (광전극으로서 TiO2 부동태 피막의 반도체 성질에 대한 연구)

  • Kim, Chang-Ha;Pyun, Su-Il
    • Journal of Hydrogen and New Energy
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    • v.1 no.1
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    • pp.48-54
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    • 1989
  • Semiconductive property of the passivating $TiO_2$ film was investigated by measuring the impedance of passivated titanium electrode in a 0.1 N NaOH solution. The passive film was prepared galvanostatically with $10mA/cm^2$ at formation potential of 50 V in a 1 N $H_2SO_4$ solution. The impedance measurement was conducted by superimposing an ac voltage of 5 m V amplitude with the frequency ranging from 5 to 10000 Hz on a dc bias (applied potential). The donor distribution in the film was depicted from the analysis of the non-linear slope of Mott-Schottky plot. The region with nearly constant concentration of donors near the electrolyte/film interface amounts at about 60 percent of the total film thickness and donor concentration increases largely with distance from the surface in an inner region near the film/metal interface. In a region of the film/metal interface the donor concentration showed a frequency dependence greater than in a region of the electrolyte/film interface. The result of donor concentration against frequency suggests a transition from crystalline to amorphous state with distance from the electrolyte/film interface in the passivating $TiO_2$ films. This is also confirmed by the ac conductivity measurement.

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