• Transactions on Electrical and Electronic Materials
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• v.14 no.2
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• pp.90-93
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• 2013

Al:ZnO thin films were deposited using the radio frequency magnetron sputtering technique at various temperatures and sputtering powers. With the increase in the deposition temperature and the decrease in the radio frequency sputtering power, the crystallinity was increased and the surface roughness was decreased, which lead to the decrease in the electrical resistivity of the film. It is also clearly observed that, the intensity of the (002) XRD peak increases with increasing the substrate temperature [1,2]. The electrical resistivity and optical transmittance of the Al:ZnO thin film were analyzed as a function of the post-annealing temperature. It can be seen that with the annealing temperature set at $400^{\circ}C$, the resistivity decreases to a minimum value of $4.1{\times}10^{-3}{\Omega}cm$ and the transmittance increases to a maximum value of 85% of the Al:ZnO thin film.

• Journal of Surface Science and Engineering
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• v.40 no.5
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• pp.209-213
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• 2007

Change of the plasma volume by pulse frequency in a bipolar pulsed DC unbalanced magnetron sputtering was investigated. As increasing the frequency at off duty 10% and at a constant power, the plasma volume was lengthened in vertical direction from the AZO target. When there is an electrically floated substrate, the vertical length of the plasma area was not affected by the pulse frequency. Instead, the diameter of the plasma volume was increased. We found that the temperature rise of a substrate was affected by the pulse frequency, too. As increasing it, the maximum temperature rise of a glass substrate was decreased from $132^{\circ}C\;to\;108^{\circ}C$.

• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.1349-1350
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• 2007

Epitaxial thin films of aluminum-doped zinc oxide (AZO) have been deposited on commercial corning glass using an Nd:YAG pulsed laser deposition technology. The structural, electrical and optical properties of these films were investigated as a function of oxygen pressure. The experimental results show that the electrical resistivity of films deposited at 5 mTorr with substrate temperature of $300^{\circ}C$ were $4.633{\times}10^{-4}$. The average transmission of AZO thin films in the visible range were over 90%.

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2005.09a
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• pp.97-101
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• 2005

The ZnO:Al thin films were prepared on glass by Facing Target Sputtering (FTS) system. We investigated electrical, optical, and structural properties of AZO thin film with sputter ins current 0.1[A]-0.6[A]. We obtained the lowest resistivity $2.3{\times}\;10^{-4}[{\Omega}-cm]$ at sputtering current 0.6[A] from the 4-point probe and the strong (002) peak at sputtering current 0.3[A] from the X-ray Diffractometer (XRD). The optical transmittance of AZO thin films show a very high transmittance of $80\~95\%$ in the visible range and exhibit the absorpt ion edge of about 350 nm.

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2005.09a
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• pp.129-132
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• 2005

투명전극용 AZO 박막을 RF 마그네트론 스퍼터로 낮은 온도에서 제조하였다. Al을 도핑한 ZnO 박막을 유리위에 증착하였고, AZO의 구조적, 전기적 그리고 광학적 특성을 조사하였다. 증착된 박막은 hexagonal wurtzite 구조를 가진 다결정계이다. 이 박막은 가시광선 영역에서 $90.7\%$ 이상의 투과율을 보였고, 가장 낮은 비저항 값은 $5.86{\times}10^{-4}{\Omega}{\cdot}cm$이었다.

• 한국신재생에너지학회:학술대회논문집
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• 2009.06a
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• pp.90-90
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• 2009

박막 태양전지의 단락전류를 증가시키기 위해서는 투명전도 산화막의 표면 식각을 통한 광포획 특성 극대화가 중요하며, 일반적으로 스퍼터링법으로 제작된 투명전도 산화막의 표면 식각은 HCl solution을 이용한다. 본 연구는 투면전도 산화막 증착시 seed로 작용할 수 있는 colloidal 형태의 nanoparticle을 유리기판에 형성한 뒤 rf-magnetron sputtering 법을 이용하여 ZnO:Al(AZO) 투명전도 산화막을 증착하여 광학 전기적 특성 변화를 분석하였다. Nanoparticle을 사용하여 제조된 AZO 박막은 nanoparticle의 확산에 의한 전자농도의 향상이 보였으나, 이동도의 감소로 인해 전기적 특성에 큰 변화는 없었다. 반면 AZO 박막의 표면형상이 nanoparticle로 인해 변하여 박막의 광 포획을 위한 안개도가 향상됨을 확인 할 수 있었으며, 이로 인해 표면 형상 제어를 통한 박막 태양전지 적용을 위한 투명전도 산화막을 제작할 수 있었다.

• Journal of Surface Science and Engineering
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• v.41 no.4
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• pp.142-146
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• 2008

Trivalent ions(Ga, Al, In) doped ZnO films were deposited by DC magnetron sputtering on non-alkali glass substrate at substrate temperature of $300^{\circ}C$. We used the different three types of high density($95%{\sim}$) ceramic sintered disks(doped with $Ga_2O_3$; 6.65 wt%, $Al_2O_3$; 3.0 wt%, $In_2O_3$; 9.54 wt%). This study examined the effect of different dopants(Ga, Al, In) on the electrical, structural, and optical properties of the films. The lowest resistivity of $5.14{\times}10^{-4}{\Omega}cm$ and the highest optical band gap of 3.74 eV were obtained by Ga doped ZnO(GZO) film. All the films had a preferred orientation along the(002) direction, indicating that the growth orientation has a c-axis perpendicular to the substrate surface. The average transmittance of the films was more than 85% in the visible range.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.90-90
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• 2011

Transparent conducting oxide (TCO) films have been intensively utilized in the electric applications, such as, displays, lightings and solar cells due to the good electric conductivity with an excellent transmittance of the visible light. We, herein present an excellent Al-doped ZnO film (AZO), which has been fabricated by co-sputtering method. An as-deposited AZO film had an optical transmittance of 84.78% at 550 nm and a resistivity of $7.8{\times}10^{-3}{\Omega}cm$. A rapid annealing process significantly improved the optical transmittance and electrical resistivity of the AZO film to 99.67% and $1{\times}10^{-3}{\Omega}cm$, respectively. The fabricated AZO film was fabricated for a metal-semiconductor-metal (MSM) structure. The AZO film-embedding MSM device was highly responsive to a UV light.

• Korean Journal of Crystallography
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• v.10 no.2
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• pp.136-144
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• 1999

고주파 마그네트론 스퍼터법을 이용한 Al:ZnO(AZO) 박막 증착시, 증착 조건에 따른 미세구조 변화를 조사하였으며, 이를 전기적 광학적 성질과 상관하여 고찰하였다. 박막은 기판 온도가 증가함에 따라 c축이 기판표면에 수직으로 놓이는 주상구조로 성장하였으며, 스퍼터 파워가 증가함에 따라 증착 속도와 입자의 크기가 증가한 반면 결정성은 저하되었다. 증착된 박막은 가시광선영역에서 85% 이상의 광 투과도를 나타내었으며 Al 첨가에 의해 광학적 밴드갭이 약 0.15 eV 증가하였다. 주상구조로 성장한 입자들은 저각 입계(low angle grain boundary)와 특수 입계(special grain boundary)를 형성하였으며, 특히 Σ=7 [001] (210)A/(110)B 입계의 규칙적인 원자배열 및 원자이완을 HRTEM을 이용하여 고찰하였다.

• Journal of Surface Science and Engineering
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• v.42 no.3
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• pp.122-127
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• 2009

Ga/Al doped ZnO (GAZO) thin films were prepared on non-alkali glass substrate by co-sputtering system using two DC cathodes equipped with AZO ($Al_2O_3$:2.0 wt%) target and GZO ($Ga_2O_3$:6.65 wt%) target. This study examined the influence of Al/Ga concentration and substrate temperature on the electrical, structural and optical properties of GAZO films. The lowest resistivity $1.95{\times}10^{-3}{\Omega}cm$ was obtained at room temperature. With increasing substrate temperature, resistivity of GAZO film decreased to a minimum value of $7.47{\times}10^{-4}{\Omega}cm$ at below $300^{\circ}C$. Furthermore, when 0.05% $H_2$ gas was introduced, resistivity of GAZO film decreased to $6.69{\times}10^{-4}{\Omega}cm$. All the films had a preferred orientation along the (002) direction, indicating that the deposited films have hexagonal wurtzite structure formed by the textured growth along the c-axis. The average transmittance of the films was more than 85% in the visible light range.