A Study on Properties of Al:ZnO Thin Films by Used RTP Method |
Yang, Hyeon-Hun
(QNIX Corporation)
Kim, Han-Wool (QNIX Corporation) So, Soon-Youl (Department of Electrical Engineering, Mokpo National University) Park, Gye-Choon (Department of Electrical Engineering, Mokpo National University) Lee, Jin (Department of Electrical Engineering, Mokpo National University) Na, Kil-Ju (Department of Radiation, Mokpo Science College) |
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