• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2017.10a
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• pp.522-523
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• 2017

Analog-to-Digital converter is designed using a current conveyor circuit and a time-to-digital converter. The analog voltage is sampled using the current conveyor circuit and then the voltage is converted to time information by the discharge of the sampling voltage. The time information is converted to digital value by the counter-type time-to-digital converter. In order to reduce the converted error the clock is synchronized with the time information pulse.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.20 no.3
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• pp.577-582
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• 2016

The synchronous TDC(Time-to-Digital Converter) of counter-type using current-conveyor is designed by $0.18{\mu}m$ CMOS process and the supply voltage is 3 volts. In order to compensate the disadvantage of a asynchronous TDC the clock is generated when the start signal is applied and the clock is synchronized with the start signal. In the asynchronous TDC the error range of digital output is from $-T_{CK}$ to $T_{CK}$. But the error range of digital output is from 0 to $T_{CK}$ in the synchronous TDC. The error range of output is reduced by the synchronization between the start signal and the clock when the timing-interval signal is converted to digital value. Also the structure of the synchronous TDC is simple because there is no the high frequency external clock. The operation of designed TDC is confirmed by the HSPICE simulation.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2017.10a
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• pp.520-521
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• 2017

The converted error is occurred by the time difference between the time interval signal and the clock in a Time-to-Digital Converter of counter-type. If the clock period is $T_{CLOCK}$ the converted error is a maximum $T_{CLOCK}$ by the time difference between the start signal and the clock. And the converted error is a maximum $-T_{CLOCK}$ by the time difference between the stop signal and the clock. However, when the clock is synchronized with the start signal and the colck is generated during the time interval signal the range of converted digital error is from 0 to $(1/2)T_{CLOCK}$.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.21 no.5
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• pp.893-898
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• 2017

A TDC(Time-to-Digital Converter) of counter-type is designed by $0.18{\mu}mCMOS$process and the supply voltage is 1.5 volts. The converted error of maximum $T_{CK}$ is occurred by the time difference between the start signal and the clock when the period of clock is $T_{CK}$ in the conventional TDC. And the converted error of -$T_{CK}$ is occurred by the time difference between the stop signal and the clock. However in order to compensate the disadvantage of the conventional TDC the clock is generated within the TDC circuit and the clock is synchronized with the start and stop signals. In the designed TDC circuit the conversion error is not occurred by the difference between the start signal and the click and the magnitude of conversion error is reduced (1/2)$T_{CK}$ by the time difference between the stop signal and the clock.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.23 no.7
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• pp.816-821
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• 2019

A counter-type time-to-digital converter was designed using a dual edge T flip-flop. The time-to-digital converter was designed with a $0.18{\mu}m$ CMOS process at a supply voltage of 1.5 volts. In a typical time-to-digital converter, when the period of the clock is T, a conversion error corresponding to the period of the clock occurs due to the asynchronism between the input signal and the clock. However, the clock of the time-to-digital converter proposed in this paper is generated in synchronization with the start signal which is the input signal. As a result, conversion errors that may occur due to asynchronization of the start signal and the clock do not occur. The flip-flops constituting the counters are composed of dual-edge flip-flops operating at the positive and negative edges of the clock to improve the resolution.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.8
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• pp.47-55
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• 2010

In this paper, a timing register architecture using demultiplexer and counter is proposed to reduce the area of the high resolution SAR type analog to digital converter. The area and digital power consumption of the conventional timing register based on the shift register is drastically increased, as the resolution is increased. On the other hand, the proposed architecture results in reduction of the area and the power consumption of the error correction logic of the SAR ADC. This chip is implemented with 0.18 um CMOS process. The area is reduced by 5.4 times and the digital power consumption is minimized compared with the conventional one. The 12 bits SAR ADC shows ENOB of 11 bits, power consumption of 2 mW, and conversion speed of 1 MSPS. The die area is $1 mm{\times}1mm$.