• Title/Summary/Keyword: 절연막방전

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Permeation and diffusion of gases through polytetrafluoroethylene membrane (Polytetrafluoroethylene막을 통한 기체의 투과 및 확산)

  • 김형민;김남인;이우태
    • Proceedings of the Membrane Society of Korea Conference
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    • 1994.10a
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    • pp.34-35
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    • 1994
  • 기체혼합물의 분리및 정제기술은 에너지 절약의 관점과 새로운 기능성 고분자의 개발로 고분자막에 의한 분리법이 관심을 끌게되었다. 공기로부터 산소부화, 방사성 크세논 및 크립론의 제거, 제련소 폐가스증의 수소분리, 천연가스로부터 헬륨의 회수분야등은 실제로 산업적으로 실용화되고 있다. 그러나 고분자막은 일반적으로 투과성과 선택성이 서로 상반되는 경향을 나타내므로, 투과성과 분리성이 좋은 기능성 고분자막의 개발에 다양한 연구가 필요로 하고있다. 본 연구에서 사용한 PTFE(polytetrafluoroethylene)는 결정성 고분자로서 넓은 온도범위에서 낮은 마찰계수, 우수한 전기적 절연특성, 강한 Carbon-fluorine 겹합에 기인한 높은 열적 안정성, 화확적 불활성때문에 공업용 고분자 재료로서 독특한 위치를 차지하고 있다. 최근에 미국과 일본을 주축으로 상용화딘 공기전지(Zinc-air battery)는 PTFE막의 뛰어난 소수성과 화학적 저항성으로 수은 전지의 대체품으로 주목받고 있는데, 장기 방전시 성능 저하가 따르므로 막을 통한 산소투과성을 방전에 필요한 최소값으로 감소시키는 것이 중요한 과제가 되고있다.

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A study on the dependance of substrate material and the properties of electron beam radiation in plasma polymerized films (플라즈마 중합막의 기판재질 의존성과 전자선 조사 특성에 대한 연구)

  • 김종택;박수홍;김형권;김병수;이덕출
    • Journal of the Korean Vacuum Society
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    • v.7 no.4
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    • pp.410-414
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    • 1998
  • The dependence of substrate material and electrode position were studied by radiation analysis of Ar discharge, and electron beam radiation was applied to confirm the crosslinked structure of the film. Comparing the conductor substrate with the insulator substrate, the former had lager peak density of radiation spectrum than latter. From the result of peak density of metastable state and ion, it was confirmed that the peak density of ion was falling to the down limit with increasing the distance of electrode by analyzing the radiation spectrum of polymerized films. When the polymerized styrene films was exposed to electron beam, it was possible to form a pattern with the insulator substrate.

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A study for the characteristics of non-volatile ZnO nanowire memory using $Al_{2}O_{3}$ charge trapped layers ($Al_{2}O_{3}$ 전하포획층으로 이용한 ZnO 나노선 비휘발성 메모리의 특성에 관한 연구)

  • Keem, Ki-Hyun;Kang, Jeong-Min;Yoon, Chang-Joon;Yeom, Dong-Hyuk;Jeong, Dong-Young;Park, Byoung-Jun;Kim, Sang-Sig
    • Proceedings of the KIEE Conference
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    • 2007.07a
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    • pp.1279-1280
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    • 2007
  • $Al_{2}O_{3}$ 절연막을 전하포획층으로 이용하여 Top 게이트 ZnO 나노선 전계효과트랜지스터를 제작하였고, 메모리 효과를 관찰하였다. $Al_{2}O_{3}$ 층을 게이트 절연막과 전하포획층으로 사용하였다. 대표적인 Top 게이트 ZnO 나노선 전계효과트랜지스터에 대하여 게이트 전압을 Double sweep 하였을 때의 드레인 전류-게이트 전압 특성이 반시계 방향의 히스테리시스와 문턱전압변화를 나타냈다. 펄스 형태의 게이트 전압을 1초 동안 인가한 후에, 드레인 전류-게이트 전압 특성의 문턱전압 변화가 0.3 V에서 0.8 V로 증가하였다. 이러한 특성은 게이트 전극에서 음전하 캐리어가 음의 게이트 전압에 대하여 $Al_{2}O_{3}$ 층에 충전되고, 양의 게이트 전압에 대하여 방전되는 것을 나타낸다.

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플라즈마 전해산화 공정에 있어서 전해액 내 실리콘 이온이 표면특성에 미치는 영향

  • Kim, Seong-Cheol;Yun, Sang-Hui;Seong, Gi-Hun;Gang, Du-Hong;Min, Gwan-Sik;Cha, Deok-Jun;Kim, Jin-Tae;Yun, Ju-Yeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.290-290
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    • 2013
  • 플라즈마 전해산화(Plasma Electrolytic Oxidation)란 저 농도의 알칼리 전해액을 매개로, 고전압을 가해 미세 플라즈마 방전을 유도하여 Al, Mg, Ti 등의 금속표면을 산화시켜 고내식성, 초경합금 수준의 내마모성, 탁월한 절연성과 고경도성을 가지는 산화막을 형성시키는 기술로 전자, 자동차, 의료, 섬유, 해양, 석유화학 산업에 이르기까지 광범위한 분야에 적용되어 우수한 물성을 확보할 수 있는 차세대의 표면처리 기술이다. 본 연구에서는 6061 알루미늄 합금을 이용하여 다양한 전해액 조건에서 플라즈마 전해산화 공정으로 Al2O3 산화막을 형성시켰다. 산화막의 조성 및 미세구조는 XRD와 FE-SEM, EDS를 이용하여 분석하였다. 형성된 산화막은 회색에서 밝은 회색으로 시편 전면에 고르게 나타났다. 전해액 조성을 바꾸어줌에 따라 각기 다른 표면 특성을 가지는 산화막을 얻을 수 있었고, 그에 따른 물성 변화를 분석하였다. 특히 Si 이온 농도를 조절함으로써 피막 성장인자와 표면 미세구조를 제어할 수 있었다.

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Characteristics of $Ta_{2}O_{5}$ Films by RF Reactive Sputtering (RF 반응성 스펏터링으로 제조한 $Ta_{2}O_{5}$ 막의 특성)

  • Park, Wug-Dong;Keum, Dong-Yeal;Kim, Ki-Wan;Choi, Kyu-Man
    • Journal of Sensor Science and Technology
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    • v.1 no.2
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    • pp.173-181
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    • 1992
  • Tantalum pentoxide($Ta_{2}O_{5}$) thin films on p-type (100) silicon wafer were fabricated by RF reactive sputtering. Physical properties and structure of the specimens were examined by XRD and AES. From the C-V analysis, the dielectric constant of $Ta_{2}O_{5}$ films was in the range of 10-12 in the reactive gas atmosphere in which 10% of oxygen gas is mixed. The ratio of Ta : 0 was 1 : 2 and 1 : 2.49 by AES and RBS examination, respectively. The heat-treatment at $700^{\circ}C$ in $O_{2}$ ambient led to induce crystallization. When the heat-treatment temperature was $1000^{\circ}C$, the dielectric constant was 20.5 in $O_{2}$ ambient and 23 in $N_{2}$ ambient, respectively. The crystal structure of $Ta_{2}O_{5}$ film was pseudo hexagonal of ${\delta}-Ta_{2}O_{5}$. The flat band voltage shift(${\Delta}V_{FB}$) of the specimens and the leakage current density were decreased for higher oxygen mixing ratio. The maximum breakdown field was 2.4MV/cm at the oxygen mixing ratio of 10%. The $Ta_{2}O_{5}$ films will be applicable to hydrogen ion sensitive film and gate oxide material for memory device.

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An Analysis of Vacuum Plasma Phenomena in DBD(Dielectric Barrier Discharges) (DBD(Dielectric Barrier Discharges)에서 전공 플라즈마 발생에 대한 해석적 연구)

  • Shin, Myoung-Soo;Cha, Sung-Hoon;Kim, Jong-Bong;Kim, Jong-Ho;Kim, Seong-Young;Lee, Hye-Jin
    • Journal of the Korean Society for Precision Engineering
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    • v.26 no.3
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    • pp.122-128
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    • 2009
  • DBD(Dielectric Barrier Discharges) plasma is often used to clean the surface of semiconductor. The cleaning performance is affected mainly by plasma density and duration time. In this study, the plasma density is predicted by coupled simulation of flow, chemistry mixing and reaction, plasma, and electric field. 13.56 MHz of RF source is used to generate plasma. The effect of dielectric thickness, gap distance, and flow velocity on plasma density is investigated. It is shown that the plasma density increases as the dielectric thickness decreases and the gap distance increases.

Stress Induced Leakage Currents in the Silicon Oxide Insulator with the Nano Structures (나노 구조에서 실리콘 산화 절연막의 스트레스 유기 누설전류)

  • 강창수
    • Journal of the Institute of Electronics Engineers of Korea TE
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    • v.39 no.4
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    • pp.335-340
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    • 2002
  • In this paper, the stress induced leakage currents of thin silicon oxides is investigated in the ULSI implementation with nano structure transistors. The stress and transient currents associated with the on and off time of applied voltage were used to measure the distribution of high voltage stress induced traps in thin silicon oxide films. The stress and transient currents were due to the charging and discharging of traps generated by high stress voltage in the silicon oxides. The transient current was caused by the tunnel charging and discharging of the stress generated traps nearby two interfaces. The stress induced leakage current will affect data retention in electrically erasable programmable read only memories. The oxide current for the thickness dependence of stress current, transient current, and stress induced leakage currents has been measured in oxides with thicknesses between 113.4${\AA}$ and 814${\AA}$, which have the gate area $10^3cm^2$. The stress induced leakage currents will affect data retention and the stress current, transient current is used to estimate to fundamental limitations on oxide thicknesses.

Effect of Additional Pulse to Remove the Sulfate Film on the Charging Capacity in the Industrial Lead-Acid Battery (극판 피막 분해용 펄스파가 산업용 연축전지의 충전용량에 미치는 영향)

  • Choi, Kwang-Gyun;Yoo, Ho-seon
    • Plant Journal
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    • v.16 no.4
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    • pp.40-44
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    • 2020
  • In this study, after supplying a pulse wave to the 2 V Industrial Lead-Acid Battery electrode plate and repeating the charging and discharging, the discharging time per voltage was analyzed. According to the result of experiment, while the lead-acid Battery that a pulse wave is not supplied decreased about 18 % of discharging capacity than the beginning, the lead-acid Battery that a pulse wave is supplied decreased a little amount much lower than 18 %, of discharging capacity and recorded the 0.56 % decrease, at a minimum, from discharging capacity at the 20 kHz frequency. This means that the sulfate on electrode plate is detached and the positive and negative charge transfer is highly activated at the 20 kHz frequency

The operation properties of DBD reactors in air pressure with varying the capacitance of reactors (정전 용량변화에 따른 대기압 DBD 반응기의 동작 특성 연구)

  • 박봉경;김윤환;장봉철;조정현;김곤호
    • Journal of the Korean Vacuum Society
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    • v.10 no.4
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    • pp.440-448
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    • 2001
  • The operation properties of DBD plasma reactors were observed by using 20 kV square pulse at the cylindrical and planar type of reactors in the condition of air pressure. The optimum operation frequency $f_0$ which optimizes the efficiency of operation was found as such $f_0\proptoexp(-C)$ when the current-voltage curve and charge-voltage curve were observed. Using these properties the dissipated power was evaluated. The dissipated power at the optimum frequency of operation was varied as the value of capacitance which is dependent on the structure and the dielectric material of the reactor, and had the maximum value at the specific value of capacitance. With these value of capacitance, DBD reactors which has a high level of efficiency can be formed.

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