• Title/Summary/Keyword: 솔더접합부

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Joint properties of carbon nanotube composite solder (탄소나노튜브 복합솔더의 본딩특성)

  • Ko, Young-Ki;Sa, Yoon-Ki;Choi, Yu-Ri;Lee, Chang-Woo;Yoo, Se-Hoon
    • Proceedings of the KWS Conference
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    • 2009.11a
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    • pp.74-74
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    • 2009
  • 카본나노튜브(CNT) 복합체는 우수한 기계적 성질을 가지고 있어 다양한 분야에서 연구되고 있다. 본 연구에서는 카본나노튜브(CNT)를 간단한 볼밀공정을 사용하여 Sn3.5Ag solder ball과 SAC305 powder 표면에 혼합하고 이를 통해 접합부 특성을 관찰하였다. 볼밀을 실시하기 전 카본나노튜브(CNT)는 초음파을 이용하여 분산을 실시하였다. Sn3.5Ag solder ball의 직경은 450um이고 SAC305 powder의 직경은 약 30um이었으며 이때 사용한 볼밀볼의 직경은 각각 3mm, 1mm이다. 볼밀 회전속도는 약 300rpm이고 6, 12, 18, 24시간동안 볼밀을 실시하였다. 24시간 볼밀 후에도 solder ball과 solder powder의 모양은 크게 변하지 않았다. SEM을 통해 표면을 관찰한 결과 분산된 카본나노튜브(CNT)는 solder ball과 solder powder의 표면에서 관찰되었다. 카본나노튜브(CNT)가 삽입된 solder ball은 BGA coupon 위에 놓고 Reflow를 실시하여 접합하였고 solder powder은 flux를 첨가하여 paste로 제조하여 2012 chip에 대한 접합특성을 관찰하였다. 카본나노튜브(CNT)는 solder ball 내부의 표면근처에서 관찰되었으며 카본나노튜브(CNT)가 혼합된 solder ball은 Aging 실시 후에 IMC 두께가 카본나노튜브(CNT)가 혼합되지 않은 solder ball에 비해 두께가 작고 접합강도는 약 10% 증가하였다. 또한 카본나노튜브(CNT)가 혼합된 solder paste와 카본나노튜브(CNT)가 혼합되지 않은 solder paste를 비교한 결과 인쇄성은 모두 양호하였으며 카본나노튜브(CNT)가 혼합된 paste를 사용한 chip의 전단강도가 높게 나타났다.

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Effect of PCB Surface Finishs on Intermetallic Compound Growth Kinetics of Sn-3.0Ag-0.5Cu Solder Bump (Sn-3.0Ag-0.5Cu 솔더범프의 금속간화합물 성장거동에 미치는 PCB 표면처리의 영향)

  • Jeong, Myeong-Hyeok;Kim, Jae-Myeong;Yoo, Se-Hoon;Lee, Chang-Woo;Park, Young-Bae
    • Journal of the Microelectronics and Packaging Society
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    • v.17 no.1
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    • pp.81-88
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    • 2010
  • Thermal annealing and electromigration test were performed at $150^{\circ}C$ and $4{\times}10^3\;A/cm^2$ conditions in order to investigate the effect of PCB surface finishs on the growth kinetics of intermetallic compound (IMC) in Sn-3.0Ag-0.5Cu solder bump. The surface finishes of the electrodes of printed circuit board (PCB) were organic solderability preservation (OSP), immersion Sn, and electroless Ni/immersion gold (ENIG). During thermal annealing, the OSP and immersion Sn show similar IMC growth velocity, while ENIG surface finish had much slower IMC growth velocity. Applying electric current accelerated IMC growth velocity and showed polarity effect due to directional electron flow.

Evaluation of Bonding Properties of Epoxy Solder Joints by High Temperature Aging Test (고온 시효 시험에 따른 Epoxy 솔더 접합부의 접합 특성 평가)

  • Kang, Min-Soo;Kim, Do-Seok;Shin, Young-Eui
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.32 no.1
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    • pp.6-12
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    • 2019
  • Bonding properties of epoxy-containing solder joints were investigated by a high temperature aging test. Specimens were prepared by bonding an R3216 standard chip resistor to an OSP-finished PCB by a reflow process with two basic types of solder (SAC305 & Sn58Bi) pastes and two epoxy-solder (SAC305+epoxy & Sn58Bi+epoxy) pastes. In all epoxy solder joints, an epoxy fillet was formed in the hardened epoxy, lying around the outer edge of the solder joint, between the chip and the Cu pad. In order to analyze the bonding characteristics of solder joints at high temperatures, a high-temperature aging test at $150^{\circ}C$ was carried out for 14 days (336 h). After aging, the intermetallic compound $Cu_6Sn_5$ was found to have formed in the solder joint on the Cu pad, and the shear stress on the conventional solder joint was reduced by a significant amount. The reason that the shear force did not decrease much, even though in epoxy solder, was thatbecause epoxy hardened at the outer edge of the supported solder joints. Using epoxy solder, strong bonding behavior can be ensured due to this resistance to shear force, even in metallurgical changes such as those where intermetallic compounds form at solder joints.

Trends of Packaging and Micro-joining Technologies for Car Electronics (자동차용 전장품의 패키징 및 마이크로 접합기술 동향)

  • Lee, Gyeong Ah;Cho, Do Hoon;Sri Harini, Rajendran;Jung, Jae Pil
    • Journal of the Microelectronics and Packaging Society
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    • v.29 no.1
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    • pp.7-16
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    • 2022
  • Recently, the automobile industry is rapidly changing due to technological development. Next-generation cars with high technology and new functions are on the market. It is essential to develop electronic devices to meet the condition of next-generation cars. In this study, the authors have reviewed recent trends of automotive electronics and packaging technology. Automotive electronics are used in harsh environments compared with other industries. Thus, it is important to improve the reliability of device junctions that directly affect electronics performance. Soldering, TLP (transient liquid phase bonding), and sintering are introduced for the bonding methods in car electronics.

Method for Manufacturing Single Prong Pendant Jewelry Using Trench Process (트렌치 공정을 이용한 단발난집 펜던트 주얼리의 개발)

  • 송오성;김익환;이하연
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.2 no.2
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    • pp.7-10
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    • 2001
  • Recently, most jewelry design employ multiple prongs that grasp the front surface of the jewel to the metal frame To keep up with recent trends in fashion. jewelry manufacturers need to produce single-prong neckalces and earings constructed with non-precious metals. In responce to this demand, Ameth Development Division and The University of Seoul researched jointly and developed a technique for setting the jewel safely using a single prong with less weight. The setting process consists of making a small trench through the jewel at the mounting point and using a low melting point tin solder, to fill the trench and bonding with the prong. The application or this technology in the setting of a natural amethyst to a single 18K gold prong resulted in a 40% reduction in cost and weight and improvement of feeling for wearing.

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The Thermal Fatigue Analysis and Life Evaluation of Solder Joint for Flip Chip Package using Darveaux Model (Darveaux 모델에 의한 플립칩 패키지 솔더 접합부의 열피로 해석 및 수명 평가)

  • Shin Young-Eui;Kim Yeon-Sung;Kim Jong-Min;Choi Myun-Gi
    • Journal of Welding and Joining
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    • v.22 no.6
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    • pp.36-42
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    • 2004
  • Experimental and numerical approaches on the thermal fatigue for the solder joint of flip chip package are discussed. However, it is one of the most difficult problems to choose the proper fatigue model. It was found that viscoplstic FE model with Darveaux method was very desirable and useful to predict the thermal fatigue life of solder joint for flip chip package under $208{\~}423K$ thermal cycling condition such as steep slope of temperature(JEDEC standard condition C). Thermal fatigue life was 1075 cycles as a result of viscoplatic model. It was a good agreement compared to the experimental. And also, it was found from the experimental that probability of the thermal fatigue life was $60{\%}$ at 1500 cycles.

Degradation Characteristics of Eutectic and Pb-free Solder Joint of Electronics mounted for Automotive Engine (자동차 엔진룸용 전장품 유무연 솔더 접합부의 열화특성)

  • Kim, A Young;Hong, Won Sik
    • Journal of Welding and Joining
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    • v.32 no.3
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    • pp.74-80
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    • 2014
  • Due to environmental regulations (RoHS, WEEE and ELV) of the European Union, electronics and automotive electronics have to eliminate toxic substance from their devices and system. Especially, reliability issue of lead-free solder joint is increasing in car electronics due to ELV (End-of-Life Vehicle) banning from 2016. We have prepared engine control unit (ECU) modules soldered with Sn-40Pb and Sn-3.0Ag-0.5Cu (SAC305) solders, respectively. Degradation characteristics of solder joint strength were compared with various conditions of automobile environment such as cabin and engine room. Thermal cycle test (TC, $-40^{\circ}C$ ~ ($85^{\circ}C$ and $125^{\circ}C$), 1500 cycles) were conducted with automotive company standard. To compare shear strength degradation rate with eutectic and Pb-free solder alloy, we measured shear strength of chip components and its size from cabin and engine ECU modules. Based on the TC test results, finally, we have known the difference of degradation level with solder alloys and use environmental conditions. Solder joints degradation rate of engine room ECU is superior to cabin ECU due to large CTE (coefficient of thermal expansion) mismatch in field condition. Degradation rate of engine room ECU is 50~60% larger than cabin room electronics.

Study on Joint of Micro Solder Bump for Application of Flexible Electronics (플렉시블 전자기기 응용을 위한 미세 솔더 범프 접합부에 관한 연구)

  • Ko, Yong-Ho;Kim, Min-Su;Kim, Taek-Soo;Bang, Jung-Hwan;Lee, Chang-Woo
    • Journal of Welding and Joining
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    • v.31 no.3
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    • pp.4-10
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    • 2013
  • In electronic industry, the trend of future electronics will be flexible, bendable, wearable electronics. Until now, there is few study on bonding technology and reliability of bonding joint between chip with micro solder bump and flexible substrate. In this study, we investigated joint properties of Si chip with eutectic Sn-58Bi solder bump on Cu pillar bump bonded on flexible substrate finished with ENIG by flip chip process. After flip chip bonding, we observed microstructure of bump joint by SEM and then evaluated properties of bump joint by die shear test, thermal shock test, and bending test. After thermal shock test, we observed that crack initiated between $Cu_6Sn_5IMC$ and Sn-Bi solder and then propagated within Sn-Bi solder and/or interface between IMC and solder. On the other hands, We observed that fracture propated at interface between Ni3Sn4 IMC and solder and/or in solder matrix after bending test.

Reliability Investigation and Interfacial Reaction of BGA packages Using the Pb-free Sn-Zn Solder (Sn-Zn 무연솔더를 사용한 BGA패키지의 계면반응 및 신뢰성 평가)

  • Jeon, Hyeon-Seok;Yun, Jeong-Won;Jeong, Seung-Bu
    • Proceedings of the KWS Conference
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    • 2005.06a
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    • pp.25-27
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    • 2005
  • Sn-9Zn solder balls were bonded to Cu and ENIG (Electroless Nickel/Immersion Gold) pads, and the effect of aging on their joint reliability was investigated. The interfacial products were different from the general reaction layer formed in a Sn-base solder. The intermetallic compounds formed in the solder/Cu joint were $Cu_{5}Zn_{8}$ and $Cu_{6}Sn_{5}$. After aging treatment, voids formed irregularly at the bottom side of the solder because of Sn diffusion into the $Cu_{5}Zn_{8}$ IMC. In the case of the solder/ENIG joint, $AuZn_{3}$ IMCs were formed at the interface. In the case of the Sn-9Zn/ENIG, the shear strength remained nearly constant in spite of aging for 1000 hours at $150^{\circ}C$. On the other hand, in the case of the Sn-9Zn/Cu, the shear strength significantly decreased after aging at $150^{\circ}C$ for 100hours and then remained constant by further prolonged aging. Therefore, the protective plating layer such as ENIG must be used to ensure the mechanical reliability of the Sn-9Zn/Cu joint.

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Effects of Ni-P Bath on the Brittle Fracture of Sn-Ag-Cu Solder/ENEPIG Solder Joint (ENEPIG/Sn-Ag-Cu 솔더 접합부의 취성 파괴에 미치는 무전해 니켈 도금액의 영향)

  • Kim, Kyoung-Ho;Seo, Wonil;Kwon, Sang-Hyun;Kim, Jun-Ki;Yoon, Jeong-Won;Yoo, Sehoon
    • Journal of Welding and Joining
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    • v.35 no.3
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    • pp.1-6
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    • 2017
  • The effect of metal turnover (MTO) of electroless Ni plating bath on the brittle fracture behavior of electroless nickel electroless palladium immersion gold (ENEPIG)/Sn-3.0wt%Ag-0.5wt%Cu(SAC305) solder joint was evaluated in this study. The MTOs of the electroless Ni for the ENEPIG surface finish were 0 and 3. As the MTO increased, the interfacial IMC thickness increased. The brittle fracture behavior of the ENEPIG/SAC305 solder joint was evaluated with high speed shear (HSS) test. The HSS strength decreased with increasing the MTO of the electroless Ni bath. The brittle fracture increased with increasing the shear speed of the HSS test. The percentage of the brittle fracture for the 3 MTO sample was much higher than that for the 0 MTO sample.