• Title/Summary/Keyword: 동적 성능기준

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Blocking Intelligent Dos Attack with SDN (SDN과 허니팟 기반 동적 파라미터 조절을 통한 지능적 서비스 거부 공격 차단)

  • Yun, Junhyeok;Mun, Sungsik;Kim, Mihui
    • KIPS Transactions on Computer and Communication Systems
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    • v.11 no.1
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    • pp.23-34
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    • 2022
  • With the development of network technology, the application area has also been diversified, and protocols for various purposes have been developed and the amount of traffic has exploded. Therefore, it is difficult for the network administrator to meet the stability and security standards of the network with the existing traditional switching and routing methods. Software Defined Networking (SDN) is a new networking paradigm proposed to solve this problem. SDN enables efficient network management by programming network operations. This has the advantage that network administrators can flexibly respond to various types of attacks. In this paper, we design a threat level management module, an attack detection module, a packet statistics module, and a flow rule generator that collects attack information through the controller and switch, which are components of SDN, and detects attacks based on these attributes of SDN. It proposes a method to block denial of service attacks (DoS) of advanced attackers by programming and applying honeypot. In the proposed system, the attack packet can be quickly delivered to the honeypot according to the modifiable flow rule, and the honeypot that received the attack packets analyzed the intelligent attack pattern based on this. According to the analysis results, the attack detection module and the threat level management module are adjusted to respond to intelligent attacks. The performance and feasibility of the proposed system was shown by actually implementing the proposed system, performing intelligent attacks with various attack patterns and attack levels, and checking the attack detection rate compared to the existing system.

A Non-Calibrated 2x Interleaved 10b 120MS/s Pipeline SAR ADC with Minimized Channel Offset Mismatch (보정기법 없이 채널 간 오프셋 부정합을 최소화한 2x Interleaved 10비트 120MS/s 파이프라인 SAR ADC)

  • Cho, Young-Sae;Shim, Hyun-Sun;Lee, Seung-Hoon
    • Journal of the Institute of Electronics and Information Engineers
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    • v.52 no.9
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    • pp.63-73
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    • 2015
  • This work proposes a 2-channel time-interleaved (T-I) 10b 120MS/s pipeline SAR ADC minimizing offset mismatch between channels without any calibration scheme. The proposed ADC employs a 2-channel SAR and T-I topology based on a 2-step pipeline ADC with 4b and 7b in the first and second stage for high conversion rate and low power consumption. Analog circuits such as comparator and residue amplifier are shared between channels to minimize power consumption, chip area, and offset mismatch which limits the ADC linearity in the conventional T-I architecture, without any calibration scheme. The TSPC D flip-flop with a short propagation delay and a small number of transistors is used in the SAR logic instead of the conventional static D flip-flop to achieve high-speed SAR operation as well as low power consumption and chip area. Three separate reference voltage drivers for 4b SAR, 7b SAR circuits and a single residue amplifier prevent undesirable disturbance among the reference voltages due to each different switching operation and minimize gain mismatch between channels. High-frequency clocks with a controllable duty cycle are generated on chip to eliminate the need of external complicated high-frequency clocks for SAR operation. The prototype ADC in a 45nm CMOS technology demonstrates a measured DNL and INL within 0.69LSB and 0.77LSB, with a maximum SNDR and SFDR of 50.9dB and 59.7dB at 120MS/s, respectively. The proposed ADC occupies an active die area of 0.36mm2 and consumes 8.8mW at a 1.1V supply voltage.

An Analysis of Soil Pressure Gauge Result from KHC Test Road (시험도로 토압계 계측결과 분석)

  • In Byeong-Eock;Kim Ji-Won;Kim Kyong-Ha;Lee Kwang-Ho
    • International Journal of Highway Engineering
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    • v.8 no.3 s.29
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    • pp.129-141
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    • 2006
  • The vertical soil pressure developed in the granular layer of asphalt pavement system is influenced by various factors, including the wheel load magnitude, the loading speed, and asphalt pavement temperature. This research observed the distribution of vertical soil pressure in pavement supporting layer by investigating measured data from soil pressure gage in the KHC Test Road. The existing specification of subbase and subgrade compaction was also evaluated with measured vertical pressure. The finite element analysis was conducted to verify the accuracy of results with measured data because it can maximize research capacity without significant field test. The test data was collected from A5, A7, A14, and A15 test sections at August, September, and November 2004 and August 2005. Those test sections and test data were selected because they had best quality. The size of influence area was evaluated and the vertical pressure variation was investigated with respect to load level, load speed, and pavement temperature. The lower speed, higher load level, and higher pavement temperature increased the vertical pressure and reduced the area of influence. The finite element result showed the similar trend of vertical pressure variation in comparison with measured data. The specification of compaction quality for subbase and subgrade is higher than the level of vertical pressure measured with truck load so that it should be lurker investigated.

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A 10b 50MS/s Low-Power Skinny-Type 0.13um CMOS ADC for CIS Applications (CIS 응용을 위해 제한된 폭을 가지는 10비트 50MS/s 저 전력 0.13um CMOS ADC)

  • Song, Jung-Eun;Hwang, Dong-Hyun;Hwang, Won-Seok;Kim, Kwang-Soo;Lee, Seung-Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.48 no.5
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    • pp.25-33
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    • 2011
  • This work proposes a skinny-type 10b 50MS/s 0.13um CMOS three-step pipeline ADC for CIS applications. Analog circuits for CIS applications commonly employ a high supply voltage to acquire a sufficiently acceptable dynamic range, while digital circuits use a low supply voltage to minimize power consumption. The proposed ADC converts analog signals in a wide-swing range to low voltage-based digital data using both of the two supply voltages. An op-amp sharing technique employed in residue amplifiers properly controls currents depending on the amplification mode of each pipeline stage, optimizes the performance of op-amps, and improves the power efficiency. In three FLASH ADCs, the number of input stages are reduced in half by the interpolation technique while each comparator consists of only a latch with low kick-back noise based on pull-down switches to separate the input nodes and output nodes. Reference circuits achieve a required settling time only with on-chip low-power drivers and digital correction logic has two kinds of level shifter depending on signal-voltage levels to be processed. The prototype ADC in a 0.13um CMOS to support 0.35um thick-gate-oxide transistors demonstrates the measured DNL and INL within 0.42LSB and 1.19LSB, respectively. The ADC shows a maximum SNDR of 55.4dB and a maximum SFDR of 68.7dB at 50MS/s, respectively. The ADC with an active die area of 0.53$mm^2$ consumes 15.6mW at 50MS/s with an analog voltage of 2.0V and two digital voltages of 2.8V ($=D_H$) and 1.2V ($=D_L$).

Development of Preliminary Quality Assurance Software for $GafChromic^{(R)}$ EBT2 Film Dosimetry ($GafChromic^{(R)}$ EBT2 Film Dosimetry를 위한 품질 관리용 초기 프로그램 개발)

  • Park, Ji-Yeon;Lee, Jeong-Woo;Choi, Kyoung-Sik;Hong, Semie;Park, Byung-Moon;Bae, Yong-Ki;Jung, Won-Gyun;Suh, Tae-Suk
    • Progress in Medical Physics
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    • v.21 no.1
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    • pp.113-119
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    • 2010
  • Software for GafChromic EBT2 film dosimetry was developed in this study. The software provides film calibration functions based on color channels, which are categorized depending on the colors red, green, blue, and gray. Evaluations of the correction effects for light scattering of a flat-bed scanner and thickness differences of the active layer are available. Dosimetric results from EBT2 films can be compared with those from the treatment planning system ECLIPSE or the two-dimensional ionization chamber array MatriXX. Dose verification using EBT2 films is implemented by carrying out the following procedures: file import, noise filtering, background correction and active layer correction, dose calculation, and evaluation. The relative and absolute background corrections are selectively applied. The calibration results and fitting equation for the sensitometric curve are exported to files. After two different types of dose matrixes are aligned through the interpolation of spatial pixel spacing, interactive translation, and rotation, profiles and isodose curves are compared. In addition, the gamma index and gamma histogram are analyzed according to the determined criteria of distance-to-agreement and dose difference. The performance evaluations were achieved by dose verification in the $60^{\circ}$-enhanced dynamic wedged field and intensity-modulated (IM) beams for prostate cancer. All pass ratios for the two types of tests showed more than 99% in the evaluation, and a gamma histogram with 3 mm and 3% criteria was used. The software was developed for use in routine periodic quality assurance and complex IM beam verification. It can also be used as a dedicated radiochromic film software tool for analyzing dose distribution.

Discovering Promising Convergence Technologies Using Network Analysis of Maturity and Dependency of Technology (기술 성숙도 및 의존도의 네트워크 분석을 통한 유망 융합 기술 발굴 방법론)

  • Choi, Hochang;Kwahk, Kee-Young;Kim, Namgyu
    • Journal of Intelligence and Information Systems
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    • v.24 no.1
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    • pp.101-124
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    • 2018
  • Recently, most of the technologies have been developed in various forms through the advancement of single technology or interaction with other technologies. Particularly, these technologies have the characteristic of the convergence caused by the interaction between two or more techniques. In addition, efforts in responding to technological changes by advance are continuously increasing through forecasting promising convergence technologies that will emerge in the near future. According to this phenomenon, many researchers are attempting to perform various analyses about forecasting promising convergence technologies. A convergence technology has characteristics of various technologies according to the principle of generation. Therefore, forecasting promising convergence technologies is much more difficult than forecasting general technologies with high growth potential. Nevertheless, some achievements have been confirmed in an attempt to forecasting promising technologies using big data analysis and social network analysis. Studies of convergence technology through data analysis are actively conducted with the theme of discovering new convergence technologies and analyzing their trends. According that, information about new convergence technologies is being provided more abundantly than in the past. However, existing methods in analyzing convergence technology have some limitations. Firstly, most studies deal with convergence technology analyze data through predefined technology classifications. The technologies appearing recently tend to have characteristics of convergence and thus consist of technologies from various fields. In other words, the new convergence technologies may not belong to the defined classification. Therefore, the existing method does not properly reflect the dynamic change of the convergence phenomenon. Secondly, in order to forecast the promising convergence technologies, most of the existing analysis method use the general purpose indicators in process. This method does not fully utilize the specificity of convergence phenomenon. The new convergence technology is highly dependent on the existing technology, which is the origin of that technology. Based on that, it can grow into the independent field or disappear rapidly, according to the change of the dependent technology. In the existing analysis, the potential growth of convergence technology is judged through the traditional indicators designed from the general purpose. However, these indicators do not reflect the principle of convergence. In other words, these indicators do not reflect the characteristics of convergence technology, which brings the meaning of new technologies emerge through two or more mature technologies and grown technologies affect the creation of another technology. Thirdly, previous studies do not provide objective methods for evaluating the accuracy of models in forecasting promising convergence technologies. In the studies of convergence technology, the subject of forecasting promising technologies was relatively insufficient due to the complexity of the field. Therefore, it is difficult to find a method to evaluate the accuracy of the model that forecasting promising convergence technologies. In order to activate the field of forecasting promising convergence technology, it is important to establish a method for objectively verifying and evaluating the accuracy of the model proposed by each study. To overcome these limitations, we propose a new method for analysis of convergence technologies. First of all, through topic modeling, we derive a new technology classification in terms of text content. It reflects the dynamic change of the actual technology market, not the existing fixed classification standard. In addition, we identify the influence relationships between technologies through the topic correspondence weights of each document, and structuralize them into a network. In addition, we devise a centrality indicator (PGC, potential growth centrality) to forecast the future growth of technology by utilizing the centrality information of each technology. It reflects the convergence characteristics of each technology, according to technology maturity and interdependence between technologies. Along with this, we propose a method to evaluate the accuracy of forecasting model by measuring the growth rate of promising technology. It is based on the variation of potential growth centrality by period. In this paper, we conduct experiments with 13,477 patent documents dealing with technical contents to evaluate the performance and practical applicability of the proposed method. As a result, it is confirmed that the forecast model based on a centrality indicator of the proposed method has a maximum forecast accuracy of about 2.88 times higher than the accuracy of the forecast model based on the currently used network indicators.

A 10b 250MS/s $1.8mm^2$ 85mW 0.13um CMOS ADC Based on High-Accuracy Integrated Capacitors (높은 정확도를 가진 집적 커페시터 기반의 10비트 250MS/s $1.8mm^2$ 85mW 0.13un CMOS A/D 변환기)

  • Sa, Doo-Hwan;Choi, Hee-Cheol;Kim, Young-Lok;Lee, Seung-Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.11 s.353
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    • pp.58-68
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    • 2006
  • This work proposes a 10b 250MS/s $1.8mm^2$ 85mW 0.13um CMOS A/D Converter (ADC) for high-performance integrated systems such as next-generation DTV and WLAN simultaneously requiring low voltage, low power, and small area at high speed. The proposed 3-stage pipeline ADC minimizes chip area and power dissipation at the target resolution and sampling rate. The input SHA maintains 10b resolution with either gate-bootstrapped sampling switches or nominal CMOS sampling switches. The SHA and two MDACs based on a conventional 2-stage amplifier employ optimized trans-conductance ratios of two amplifier stages to achieve the required DC gain, bandwidth, and phase margin. The proposed signal insensitive 3-D fully symmetric capacitor layout reduces the device mismatch of two MDACs. The low-noise on-chip current and voltage references can choose optional off-chip voltage references. The prototype ADC is implemented in a 0.13um 1P8M CMOS process. The measured DNL and INL are within 0.24LSB and 0.35LSB while the ADC shows a maximum SNDR of 54dB and 48dB and a maximum SFDR of 67dB and 61dB at 200MS/s and 250MS/s, respectively. The ADC with an active die area of $1.8mm^2$ consumes 85mW at 250MS/s at a 1.2V supply.

A 0.31pJ/conv-step 13b 100MS/s 0.13um CMOS ADC for 3G Communication Systems (3G 통신 시스템 응용을 위한 0.31pJ/conv-step의 13비트 100MS/s 0.13um CMOS A/D 변환기)

  • Lee, Dong-Suk;Lee, Myung-Hwan;Kwon, Yi-Gi;Lee, Seung-Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.3
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    • pp.75-85
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    • 2009
  • This work proposes a 13b 100MS/s 0.13um CMOS ADC for 3G communication systems such as two-carrier W-CDMA applications simultaneously requiring high resolution, low power, and small size at high speed. The proposed ADC employs a four-step pipeline architecture to optimize power consumption and chip area at the target resolution and sampling rate. Area-efficient high-speed high-resolution gate-bootstrapping circuits are implemented at the sampling switches of the input SHA to maintain signal linearity over the Nyquist rate even at a 1.0V supply operation. The cascode compensation technique on a low-impedance path implemented in the two-stage amplifiers of the SHA and MDAC simultaneously achieves the required operation speed and phase margin with more reduced power consumption than the Miller compensation technique. Low-glitch dynamic latches in sub-ranging flash ADCs reduce kickback-noise referred to the differential input stage of the comparator by isolating the input stage from output nodes to improve system accuracy. The proposed low-noise current and voltage references based on triple negative T.C. circuits are employed on chip with optional off-chip reference voltages. The prototype ADC in a 0.13um 1P8M CMOS technology demonstrates the measured DNL and INL within 0.70LSB and 1.79LSB, respectively. The ADC shows a maximum SNDR of 64.5dB and a maximum SFDR of 78.0dB at 100MS/s, respectively. The ABC with an active die area of $1.22mm^2$ consumes 42.0mW at 100MS/s and a 1.2V supply, corresponding to a FOM of 0.31pJ/conv-step.

A 1.1V 12b 100MS/s 0.43㎟ ADC based on a low-voltage gain-boosting amplifier in a 45nm CMOS technology (45nm CMOS 공정기술에 최적화된 저전압용 이득-부스팅 증폭기 기반의 1.1V 12b 100MS/s 0.43㎟ ADC)

  • An, Tai-Ji;Park, Jun-Sang;Roh, Ji-Hyun;Lee, Mun-Kyo;Nah, Sun-Phil;Lee, Seung-Hoon
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.7
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    • pp.122-130
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    • 2013
  • This work proposes a 12b 100MS/s 45nm CMOS four-step pipeline ADC for high-speed digital communication systems requiring high resolution, low power, and small size. The input SHA employs a gate-bootstrapping circuit to sample wide-band input signals with an accuracy of 12 bits or more. The input SHA and MDACs adopt two-stage op-amps with a gain-boosting technique to achieve the required DC gain and high signal swing range. In addition, cascode and Miller frequency-compensation techniques are selectively used for wide bandwidth and stable signal settling. The cascode current mirror minimizes current mismatch by channel length modulation and supply variation. The finger width of current mirrors and amplifiers is laid out in the same size to reduce device mismatch. The proposed supply- and temperature-insensitive current and voltage references are implemented on chip with optional off-chip reference voltages for various system applications. The prototype ADC in a 45nm CMOS demonstrates the measured DNL and INL within 0.88LSB and 1.46LSB, respectively. The ADC shows a maximum SNDR of 61.0dB and a maximum SFDR of 74.9dB at 100MS/s, respectively. The ADC with an active die area of $0.43mm^2$ consumes 29.8mW at 100MS/s and a 1.1V supply.

A 10b 200MS/s 75.6mW $0.76mm^2$ 65nm CMOS Pipeline ADC for HDTV Applications (HDTV 응용을 위한 10비트 200MS/s 75.6mW $0.76mm^2$ 65nm CMOS 파이프라인 A/D 변환기)

  • Park, Beom-Soo;Kim, Young-Ju;Park, Seung-Jae;Lee, Seung-Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.3
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    • pp.60-68
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    • 2009
  • This work proposes a 10b 200MS/s 65nm CMOS ADC for high-definition video systems such as HDTV requiring high resolution and fast operating speed simultaneously. The proposed ADC employs a four-step pipeline architecture to minimize power consumption and chip area. The input SHA based on four capacitors reduces the output signal range from $1.4V_{p-p}$ to $1.0V_{p-p}$ considering high input signal levels at a low supply voltage of 1.2V. The proposed three-stage amplifiers in the input SHA and MDAC1 overcome the low output resistance problem as commonly observed in a 65nm CMOS process. The proposed multipath frequency-compensation technique enables the conventional RNMC based three-stage amplifiers to achieve a stable operation at a high sampling rate of 200MS/s. The conventional switched-bias power-reduction technique in the sub-ranging flash ADCs further reduces power consumption while the reference generator integrated on chip with optional off-chip reference voltages allows versatile system a locations. The prototype ADC in a 65nm CMOS technology demonstrates a measured DNL and INL within 0.19LSB and 0.61LSB, respectively. The ADC shows a maximum SNDR of 54.BdB and 52.4dB and a maximum SFDR of 72.9dB and 64.8dB at 150MS/S and 200MS/s, respectively. The proposed ADC occupies an active die area of $0.76mm^2$ and consumes 75.6mW at a 1.2V supply voltage.