• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.10
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• pp.1-8
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• 2003

Copper thin films were deposited on a Cu/Ta/Si substrate using the electroplating technique. Deposition rate was about 200 nm/min in proportion to current density and in inverse proportion to flow rate. Resistivity of copper thin film was approximately 2.1 ${\mu}$Ωcm and Int$\sub$(111)//Int$\sub$(200)/ ratio of copper film was 5.4 and no significant impurities were detected. After the deposition, electroplating copper films were annealed at various temperatures in a background pressure of 10$\^$-3/ torr. The resistivity of copper thin films were improved by ∼17 % and texture was improved by ∼40 % after annealing at 170$^{\circ}C$. The stress in films was not reduced much after annealing below 170$^{\circ}C$.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2008.10a
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• pp.95-99
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• 2008

Cu has been used for metallic interconnects in ULSI applications because of its lower resistivity according to the scaling down of semiconductor devices. The resistivity of Cu lines will affect the RC delay and will limit signal propagation in integrated circuits. We investigated the electrolyte effects of the electroplating solution in the resistivity value of Cu films grown by electroplating deposition (EPD). The resistivity was measured with a four-point probe and the material properties were investigated with XRD (X-ray Diffraction), AFM (Atomic Force Microscope), FE-SEM (Field Emission Scanning Electron Microscope) and XPS (X-ray Photoelectron Spectroscopy). From these experimental results, we found that the electrolyte condition plays an Important role in formation of Cu film with lower resistivity by EPD.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2015.11a
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• pp.333-333
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• 2015

본 연구에서는 디스플레이 패널 식각에 있어서 전극인 구리 박막 표면에 $SF_6/O_2$ 플라즈마 사용 시 발생되는 Corrosion 현상을 분석하기 위해 $SF_6/O_2$ 가스의 조성비를 변화하며 실험을 진행하였다. 유도결합 $SF_6/O_2$ 플라즈마를 이중 랭뮤어 탐침과 광 분광법을 이용한 플라즈마 진단을 통해 $SF_6/O_2$의 조성비의 변화에 따른 플라즈마 상태를 분석하고, $SF_6/O_2$ 플라즈마 조성비를 변화시켜 구리 박막의 표면을 처리한 후 발생되는 Corrosion과 Corrosion이 구리에 미치는 영향을 조사하기 위해 XPS, SEM, 4 point probe 등을 이용하였다.

• Korean Journal of Materials Research
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• v.10 no.1
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• pp.77-82
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• 2000

A surface of polytetrafluoroethylene(PTFE) was modified with changing ion doses by 1 keV $Ar^+$ ion irradiation and Cu films having thickness $5000\;{\AA}$ were deposited on the modified PTFE. The SEM study showed that the surface texture of modified PTFE was in the form of cones whose height increased depending on ion doses. Through XPS spectra, it was found that the intensity of F ls peaks decreased with ion doses by preferential sputtering of F atoms and the C-C and / or C-F chains were formed by the crosslinking in the newly unstable chains. Cu films were deposited uniformly along the filaments formed on the modified PTFE. In x-ray diffraction (XRD) spectra of deposited Cu films on modified PTFE, a preferred orientation along (111) and (200) planes was found and the peak intensity of (111) plane increased as surface roughness of modified PTFE increased. The resistivity of Cu films was changed from $2.7{\mu}{\Omega}cm$ of unmodified PTFE to $4.3{\mu}{\Omega}cm$ of modified PTFE at ion dose of $1{\times}10^{16}/\textrm{cm}^2$ and the abrupt increase of resistivity in the modified PTFE at ion dose of $1{\times}10^{17}/\textrm{cm}^2$ was due to being cut off the film which resulted from the increased surface roughness.

• Journal of the Korean Electrochemical Society
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• v.7 no.4
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• pp.173-178
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• 2004

Silicon thin film were synthesized from silane and argon gas mixture directly on copper foil by rf PECVD and then lithium ion batteries were prepared from them employed as the negative electrodes without any further treatment. In the present study, two different kinds of silicon thin films, amorphous silicon and copper silicide were prepared by changing deposition temperature. Amorphous silicon film was prepared below $200^{\circ}C$, but copper silicide film with granular shape was formed by the reaction between silicon radical and diffused copper ions under elevating temperature above $400^{\circ}C$. The amorphous silicon film gives higher capacity than copper silicide, but the capacity decreases sharply with charge-discharge cycling. This is possibly due to severe volume changes. The cyclability is improved, however, by employing the copper silicide as a negative electrode. The copper silicide plays an important role as an active material of the electrode, which mitigates volume change cause by the existence of silicon and copper chemical bonding and provides low electrical resistance as well.

• Korean Journal of Materials Research
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• v.7 no.3
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• pp.188-195
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• 1997

Copper ions were adsorbed on amorphous Si films by spincoating of Cu solutions and were employed as surface nucleation sites for low-temperature crystallization. The crystallization temperature can bc lo~vered down to $500^{\circ}C$ and rhe crystallization time can be shortened by Cu adsorption. The Cu-adsorbed amorphous films were crystallized by fractal growth with the shape of tree branches. The fractal size ranged from $30 to 300{\mu}m$, depending on the Cu solution concentration. The fractals consisted of f e a t h e r like elliptical grains with the size of $0.3~0.4{\mu}m$. which was comparable to that of the intrinsic films crystallized at $600^{\circ}C$. Both the nucleation activation energy and grotvth activation energy decreased as the Cu concentration in the solution increased. The results suggest thcit the adsorbed Cu increases preferred nucleation sites at the surface and enhmces crystallization by reducing thc activation energies of nucleation and growth.

• Journal of the Korean Vacuum Society
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• v.6 no.3
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• pp.206-212
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• 1997

The reflow characteristics of copper, which is expected to be used as interconnection materials in the next generation semiconductor devices, were investigated. Copper films were deposited on hole and trench patterns by metal organic chemical vapor deposition and annealed in nitrogen and oxygen ambient with the annealing temperatures ranging from $350^{\circ}C$ to $550^{\circ}C$. Copper films were not reflowed into the patterns upon the annealing in nitrogen ambient, but reflowed at the annealing temperature higher than $450^{\circ}C$ in oxygen ambient. It is considered that the reflow takes place as the heat generated by the oxidation of copper liquefies the copper film partly and the liquid copper fills the patterns for minimizing the surface energy and the potential energy. Upon the annealing in oxygen ambient, the copper oxide whose thickness was less than 300$\AA$ formed at the surface of an agglomerate and the resistivity of copper film increased drastically at an annealing temperature of $550^{\circ}C$ due to the copper agglomeration.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2017.05a
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• pp.124-124
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• 2017

Fe-Ni-Co 합금 박막(<$100{\mu}m$)을 황화물계 용액에서 전주공정으로 제조하였다. XRF로 측정한 박판의 평균 조성은 Fe-34 wt.% Ni-3 wt.% Co 이다. AFM으로 측정한 표면 조도는 35.2 nm 이다. 표면의 나노 경도는 평균 5.4 GPa 이었다. Oliver 모델을 적용한 구리 박막의 탄성하강강성도는 약 75 이었다. Alekhin 모델을 적용한 구리 박막의 마찰계수, 피로한계는 각각 0.134, 0.027 이었다. 유한요소법으로 평가한 Berkovich 형 나노압침선단의 하중분포를 이차원 선형 및 비선형 해석하면 1 [mN]의 정적하중을 가한 Fe-Ni-Co 박막은 약 576 [mN]로 예측되었다. 압침선단의 하중집중정도는 표면탐침현미경으로 관찰한 압흔의 변형정도와 유사한 경향을 보였다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2008.11a
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• pp.63-63
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• 2008

Volmer-Weber 형의 성장을 하는 구리박막은 두께 증가에 따라 초기 압축, 인장, 2차 압축응력의 독특한 3단게 응력거동을 보인다. 인장응력의 경우 일반적으로 박막 두께 증가에 따른 과잉 부피를 줄이기 위해 결정립 성장 및 결정립 병합이 인장응력을 일으킨다고 보고되고 있다. 박막 증착시 결정립 크기는 증착속도, 증착된 원소의 이동도, 섬의 핵생성 속도 등 여러 가지 인자의 상호작용에 의해 결정되므로, 본 연구에서는 각각 다른 표면조도를 갖는 기판을 사용하여 결정립 성장 및 결정립 병합을 다르게 함으로써 고유인장응력 기구를 밝히고자 한다.

• Proceedings of the Korean Vacuum Society Conference
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• 2006.02a
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• pp.195-195
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• 2006