• 제목/요약/키워드: voltage dependence

검색결과 441건 처리시간 0.024초

강유전체 표시기용 고전압 비정질 실리콘 박막트렌지서트의 온도변화 특성 (Temperature dependent characteristics of HVTFT for ferroelectric display)

  • 이우선;김남오;이경섭
    • E2M - 전기 전자와 첨단 소재
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    • 제9권6호
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    • pp.558-563
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    • 1996
  • We fabricated high voltage hydrogenerated amorphous silicon thin film transistors (a Si:H HVTFT) and investigated its temperature dependent characteristics of from 303 K to 363 K. The results show that the drain current was decreased at low gate voltage and increased at high gate voltage exponentially. According to the increasing the thickness of a Si layer, drain current increased. Difference of drain current at 363 K was increasd at the lower gate voltage and decreased at the higher gate voltage. When the drain and gate voltage of 100 V applied, the drain current increased linearly with rise temperature.

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The Stress Dependence of Trap Density in Silicon Oxide

  • Kang, C. S.
    • 대한전자공학회논문지TE
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    • 제37권2호
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    • pp.17-24
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    • 2000
  • In this paper, the stress and transient currents associated with the on and off time of applied voltage were used to measure the density and distribution of high voltage stress induced traps in thin silicon oxide films. The transient currents were due to the discharging of traps generated by high stress voltage in the silicon oxides. The trap distributions were relatively uniform new both cathode and anode interface. The trap densities were dependent on the stress polarity. The stress generated trap distributions were relatively uniform the order of 1011~1021[states/eV/cm2] after a stress voltage. It appear that the stress and transient current that flowed when the stress voltage were applied to the oxide was caused by carriers tunneling through the silicon oxide by the high voltage stress generated traps.

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Current-voltage Characteristics of Ceramics with Positive Temperature Coefficient of Resistance

  • Li, Yong-Gen;Cho, Sung-Gurl
    • 한국세라믹학회지
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    • 제40권10호
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    • pp.921-924
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    • 2003
  • A current-voltage relation for Positive Temperature Coefficient of Resistance (PTCR) ceramic was derived and compared with the experimental data. The new current-voltage relation was developed based on Heywangs double Schottky barrier model and a bias distribution across the grain boundary. The voltage limitation V < 4${\Phi}$$\sub$b/ suggested by Heywang is no longer necessary in the new expression for the voltage dependence of the resistance. The pulsed voltages were applied to the PTCR ceramic specimen in order to avoid possible temperature variation during the measurement.

입력전압 파형 검출만으로 구성된 단상 PFC 정류회로 (single-phase PFC rectifier circuit consonant to Input voltage waveform detection)

  • 정상화;이현우;전중함;서기영
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2002년도 학술대회 논문집 전문대학교육위원
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    • pp.12-15
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    • 2002
  • This propose a simple DC voltage sensor less single phase PFC(Power Factor Correction Circuit) converter by detecting a AC current sensors are not required to construct the control system. The DC voltage is directly controlled by the command input signal Kd($V_o/V_a$)for the boost chopper circuit. The DC voltage regulation is small because of the feed forward control for the AC line voltage VS and no dependence of the circuit parameters. The sinusoidal current waveform in phase with the AC input voltage can be obtained. These characteristics are confirmed by some experiment results.

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Temperature Dependence of the Electro-optic Characteristics in the Liquid Crystal Display Switching Modes

  • Jeon, Eun-Jeong;Srivastava, Anoop Kumar;Kim, Mi-Young;Jeong, Kwang-Un;Choi, Jeong-Min;Lee, Gi-Dong;Lee, Seung-Hee
    • Journal of Information Display
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    • 제10권4호
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    • pp.175-179
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    • 2009
  • As the physical properties of nematic liquid crystals vary with respect to temperature, the performances of liquid crystal displays (LCDs) are highly dependent on temperature. Additionally, it is well known that the electro-optic characteristics of LCDs, such as transmittance and threshold voltage, also rely on the LCD switching modes. The temperature dependence of the electro-optic characteristics of the wide-viewing-angle LCD modes, such as in-plane switching (IPS), multidomain vertical alignment by patterned electrode (PVA), and fringe-field switching (FFS), have been studied, and the results showed that the FFS mode has lower temperature dependence compared to the IPS and PVA modes. Since the liquid crystal (LC) reorients in different ways in each mode, this result is associated with the temperature dependence of LC's bend and twist elastic constants, and also with the position of the main reorientation, either in the middle or on the surface of the LC layer.

비대칭 자기터널접합에서의 수직 스핀 전달 토크: 물질 변수에 대한 의존성 (Perpendicular Spin-transfer Torque in Asymmetric Magnetic Tunnel Junctions: Material Parameter Dependence)

  • 한재호;이현우
    • 한국자기학회지
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    • 제21권2호
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    • pp.52-55
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    • 2011
  • 스핀전달토크는 나노구조에서 자성상태를 제어하는데 유용한 수단이다. 자기터널접합에서 스핀전달토크는 자성물질층의 자화가 이루는 평면에 평행한 성분과 수직인 성분으로 나눌 수 있다. 이중 평행한 성분의 스핀전달토크의 성질은 상당히 잘 알려져 있으나, 수직인 성분의 스핀전달토크의 성질에 대해서는 여전히 이견이 많다. 비대칭 자기터널접합에서의 최근 실험에서, 수직전달토크의 전압 의존성이 전압의 이차항 성분뿐만 아니라 일차항 성분도 가짐을 보고하였다. 하지만 물질 변수에 대한 의존성은 여전히 잘 알려지지 않았다. 이 논문에서는 비대칭 자기터널접합에서의 스핀전달토크의 전압의존성을, 강자성층의 스핀 갈라짐 에너지와 일함수의 차이, 그리고 페르미 에너지를 변화시켜 가면서 체계적인 조사를 하였다.

Dynamic Reference Scheme with Improved Read Voltage Margin for Compensating Cell-position and Background-pattern Dependencies in Pure Memristor Array

  • Shin, SangHak;Byeon, Sang-Don;Song, Jeasang;Truong, Son Ngoc;Mo, Hyun-Sun;Kim, Deajeong;Min, Kyeong-Sik
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제15권6호
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    • pp.685-694
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    • 2015
  • In this paper, a new dynamic reference scheme is proposed to improve the read voltage margin better than the previous static reference scheme. The proposed dynamic reference scheme can be helpful in compensating not only the background pattern dependence but also the cell position dependence. The proposed dynamic reference is verified by simulating the CMOS-memristor hybrid circuit using the practical CMOS SPICE and memristor Verilog-A models. In the simulation, the percentage read voltage margin is compared between the previous static reference scheme and the new dynamic reference scheme. Assuming that the critical percentage of read voltage margin is 5%, the memristor array size with the dynamic scheme can be larger by 60%, compared to the array size with the static one. In addition, for the array size of $64{\times}64$, the interconnect resistance in the array with the dynamic scheme can be increased by 30% than the static reference one. For the array size of $128{\times}128$, the interconnect resistance with the proposed scheme can be improved by 38% than the previous static one, allowing more margin on the variation of interconnect resistance.

실리콘 전력 MOSFET의 온도에 따른 항복전압 및 On 저항 (Temperature Dependent Breakdown Voltage and On-resistance of Si Power MOSFETs)

  • 박일용;최연익;정상구
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제49권4호
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    • pp.246-248
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    • 2000
  • Closed-form expressions for the temperature dependent breakdown voltage and the on-resistance of the Si power MOSFETs were derived by employing effective temperature dependent ionization coefficient for electrons and holes. The breakdown voltage increases by 20% and the on-resistance increases 2 times when the temperature increases from 300 K to 423 K. The analytic results normalized to the values at 300 K show good agreement with the experimental data of Motorola within 3.5% and 7% for the breakdown voltage and the on-resistance, respectively.

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Comparison of Electrical Properties between Sputter Deposited Au and Cu Schottky Contacts to n-type Ge

  • Kim, Hogyoung;Kim, Min Kyung;Kim, Yeon Jin
    • 한국재료학회지
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    • 제26권10호
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    • pp.556-560
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    • 2016
  • Using current-voltage (I-V) and capacitance-voltage (C-V) measurements, the electrical properties of Au and Cu Schottky contacts to n-Ge were comparatively investigated. Lower values of barrier height, ideality factor and series resistance were obtained for the Au contact as compared to the Cu contact. The values of capacitance showed strong dependence on the bias voltage and the frequency. The presence of an inversion layer at the interface might reduce the intercept voltage at the voltage axis, lowering the barrier height for C-V measurements, especially at lower frequencies. In addition, a higher interface state density was observed for the Au contact. The generation of sputter deposition-induced defects might occur more severely for the Au contact; these defects affected both the I-V and C-V characteristics.

Dependence of Resistance and Capacitance of Organic light Emitting diode (OLED) on Applied Voltage

  • Lee, Soon-Seok;Im, Woo-Bin;Lim, Sung-Kyoo
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.446-449
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    • 2008
  • Organic light emitting diodes (OLEDs) with multiple organic layers were fabricated to obtain and to evaluate an equivalent resistance and an equivalent capacitance of OLED device. The staircase voltage with an increasing period and a constant period was designed and applied to the OLED. The resistance of OLED was found to decrease from $270\;k{\Omega}$ to $2\;K{\Omega}$ as applied voltage increased after turn on. The equivalent capacitance of OLED maintained unchanged at low voltage level and deceased after showing peak value as the applied voltage increased.

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