• 제목/요약/키워드: varying bias

검색결과 117건 처리시간 0.031초

RF CMOS 소자 기판 파라미터의 바이어스 및 게이트 길이 종속데이터 추출 (Extraction of Bias and Gate Length dependent data of Substrate Parameters for RF CMOS Devices)

  • 이용택;최문성;이성현
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2004년도 하계종합학술대회 논문집(2)
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    • pp.347-350
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    • 2004
  • The substrate parameters of Si MOSFET equivalent circuit model were directly extracted from measured S-Parameters in the GHz region by using simple 2-port parameter equations. Using the above extract ion method, bias and gate length dependent curves of substrate parameters in the RF region are obtained by varying drain voltage at several short channel devices with various gate lengths. These extract ion data will greatly contribute to scalable RF nonlinear substrate modeling.

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GC의 주입방식 차에 따른 고농도 악취황 성분의 검량오차 연구 : 주입부피의 고정방식 대비 주입농도의 고정방식 간 비교연구 (The Selection of Sample Injection Modes and Its Effect on the Calibration Bias in S Gas Detection by Gas Chromatography)

  • 김기현;최여진
    • 한국대기환경학회지
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    • 제21권2호
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    • pp.269-274
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    • 2005
  • In this work, analytical bias arising from the gas chromatographic determination of sulfur compounds was evaluated by the application of direct loop injection method to the GC/PFPD detection of four sulfur compounds including H$_{2}$S, CH$_{3}$SH, DMS, and DMDS. For the proper evaluation of analytical uncertainties involved in GC calibration, we employed two comparative techniques of calibration at fxed concentration injection (CFCI) vs calibration at fixed volume injection (CFVI) method. The results of our study indicate that CFCI method exhibits very poor sensitivity due to the matrix effect with varying injection volumes. On the other hand, as CFVI method overcomes such limitation, it can be used to obtain very accurate quantification of S compounds at their high concentration levels above a few to a few tens ppb.

고밀도 플라즈마에 의한 (Ba,Sr)$TiO_3$막의 식각특성 연구 (A study on the etching properties of (Ba,Sr)$TiO_3$ film by high density plasma)

  • 김승범;김창일;장의구
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1998년도 추계학술대회 논문집 학회본부 C
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    • pp.798-800
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    • 1998
  • (Ba,Sr)$TiO_3$ thin films were etched with $Cl_2$/Ar gas mixing ratio in an inductively coupled plasma (ICP) by varying the etching parameter such as f power, do bias voltage, and chamber pressure. The etch rate was $560{\AA}/min$ under Cl_2/(Cl_2+Ar)$ gas mixing ratio of 0.2, rf power of 600 W, do bias voltage of 250 V, and chamber pressure of 5 mTorr, At this time, the selectivity of BST to Pt, $SiO_2$ was respectively 0.52, 0.43. The surface reaction of the etched (Ba,Sr)$TiO_3$ thin films was investigated with X-ray photoelectron spectroscopy (XPS).

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도핑되지 않은 다결정 다이아몬드 박막의 전계방출기구 조사 (Investigation of field emission mechanism of undoped polycrystalline diamond films)

  • 심재엽;지응준;송기문;백홍구
    • 한국진공학회지
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    • 제8권4A호
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    • pp.417-424
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    • 1999
  • In order to investigate field emission mechanism of undoped polycrystalline diamond films, diamond films with different structural properties were deposited by varying positive substrate bias and/or $CH_4$ concentration. When increasing $CH_4$ concentration and positive substrate bias voltage, nondiamond carbon content in diamond films increased. Increase of nondiamond carbon content with increasing substrate voltage is ascribed to increase of substrate and excess generation of $CH_n$ radicals. Field emission properties of undoped polycrystalline diamond films ere significantly enhanced with increasing nondiamond carbon content. For diamond films with a small amount of nondiamond carbon, electrons are emitted through diamond surface while for the films with a large amount of nondiamond carbon, electron emission occurs through diamond bulk as well as surface. From this study, depending on nondiamond carbon content two field emission mechanisms were suggested.

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Analysis of Temperature Dependence of Thermally Induced Transient Effect in Interferometric Fiber-optic Gyroscopes

  • Choi, Woo-Seok
    • Journal of the Optical Society of Korea
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    • 제15권3호
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    • pp.237-243
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    • 2011
  • Thermal characteristics, such as diffusivity and temperature induced change in the fiber mode index of rotation sensing fiber coil are critical factors which determine the time varying, thermo-optically induced bias drift of interferometric fiber-optic gyroscopes (IFOGs). In this study, temperature dependence of the transient effect is analyzed in terms of the thermal characteristics of the fiber coil at three different temperatures. By applying an analytic model to the measured bias in the experiments, comprehensive thermal factors of the fiber coil could be extracted effectively. The validity of the model was confirmed by the fact that the extracted values are reasonable results in comparison with well known properties of the materials of the fiber coil. Temperature induced changes in the critical factors were confirmed to be essential in compensating the transient effect over a wide temperature range.

Pooling shrinkage estimator of reliability for exponential failure model using the sampling plan (n, C, T)

  • Al-Hemyari, Z.A.;Jehel, A.K.
    • International Journal of Reliability and Applications
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    • 제12권1호
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    • pp.61-77
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    • 2011
  • One of the most important problems in the estimation of the parameter of the failure model, is the cost of experimental sampling units, which can be reduced by using any prior information available about ${\theta}$, and devising a two-stage pooling shrunken estimation procedure. We have proposed an estimator of the reliability function (R(t)) of the exponential model using two-stage time censored data when a prior value about the unknown parameter (${\theta}$) is available from the past. To compare the performance of the proposed estimator with the classical estimator, computer intensive calculations for bias, mean squared error, relative efficiency, expected sample size and percentage of the overall sample size saved expressions, were done for varying the constants involved in the proposed estimator (${\tilde{R}}$(t)).

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Characteristic of P doped ZnO-based thin film transistor by DC magnetron sputtering

  • Lee, Sih;Moon, Yeon-Keon;Moon, Dae-Yong;Kim, Woong-Sun;Kim, Kyung-Taek;Park, Jong-Wan
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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    • pp.540-542
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    • 2009
  • Phosphorus doped ZnO (PZO) thin films were deposited on $SiO_2$/n-Si substrates using DC magnetron sputtering system varying oxygen partial pressures from 0 to 40 % under Ar atmosphere. The deposited films showed reduced n-type conductivity due to the compensating donor effects by phosphorus dopant. The bias-time stability shows relatively good stability over bias and time comparing to un-doped ZnO-based TFTs.

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음성천이구간에서의 성도 파라메타 시변추정에 관한 연구 (Time-varying Estimation of Vocal Track Parameters During the Speech Transition Regions)

  • 최홍섭
    • 한국음향학회지
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    • 제16권2호
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    • pp.101-106
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    • 1997
  • 음성의 천이구간에서의 특징 파라메타를 찾아내기 위하여 본 논문에서는 AR모델을 사용하여 적응적으로 성문폐쇄구간을 찾은 후, 이를 제외한 구간에서 성도 파라메타를 추정함으로써 음원의 피치바이어스 영향을 제거하는 SSRLS(Sample Selective RLS)방법을 제안한다. 성능을 비교하기 위하여 합성음과 실제음에 대하여 포만트 추정실험을 했으며, 실험결과 제안된 방법이 WRLS 보다 우수함을 알 수 있었다.

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LDV 스펙트럼 분석을 위한 재생방법의 비교 연구 (A Comparative Study of Reconstruction Methods for LDV Spectral Analysis)

  • 이도환;성형진
    • 대한기계학회논문집
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    • 제18권1호
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    • pp.166-174
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    • 1994
  • A critical evaluation is made of the spectral bias which occurs in the use of a laser doppler velocimeter(LDV). Two processing algorithms are considered for spectral estimates: the sample and hold interpolation method(SH) and the nonuniform Shannon reconstruction technique(SR). Assessment is made of these for varying data densities $(0.05{\le}d.d.{\le}5)$ and turbulence levels(t.i.=30%, 100%). As an improved version of the spectral estimator, the utility of POCS (the projection onto convex sets) has been tested in the present study. This algorithm is found useful to be in the region when $d.d.{\gep}3.$

On simple estimation technique for the reliability of exponential lifetime model

  • Al-Hemyari, Z.A.;Al-Saidy, Obaid M.;Al-Ali, A.R.
    • International Journal of Reliability and Applications
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    • 제14권2호
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    • pp.79-96
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    • 2013
  • Exponential distribution plays a key role in engineering reliability and its applications. The exponential failure model has been studied for years. This article introduces two new preliminary test estimators for the reliability function (R(t)) in complete and censored samples from the exponential model with the use of a prior estimation (${\theta}_0$) of the mean (${\theta}$). The proposed preliminary test estimators are studied and compared numerically with the existing estimators. Computer-intensive calculations for bias and relative efficiency show that for, different values of levels of significance and for varying constants involved in the proposed estimators, the proposed estimators are far better than classical and existing estimators.

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