• 제목/요약/키워드: test pattern

검색결과 3,897건 처리시간 0.032초

산불진화용 안전복 패턴 개발을 위한 연구 (A Study on the Pattern Development for Forest Fire Safety Clothing)

  • 최미성
    • 한국의류산업학회지
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    • 제13권4호
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    • pp.624-634
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    • 2011
  • The purpose of this study is to develop the pattern of safety clothes used at flat or mountainous areas and to identify the pattern of safety clothes by conducting experimental evaluation of virtual wear. Three subjects were selected, based on fire fighters' physical constitution. A prototype design for safety clothing was determined after in-depth interviewing of professionals and surveying of Forest service staff and related agency. Wearing test should be carried out in the order of pattern making, virtual and real wearing evaluation. For data analysis, technical statistical values should be obtained by using body measurements of subject, frequency analysis and T-test. The jacket is designed to have a front extension and the entire length of clothing enough for wearer to put on it over ordinary shirts or sweater. The collar of jacket is of round type. Cyber reality enables to identify the movement and activity of virtual fitting model and to find out errors or problems in safety clothing prior to on-the-spot wear test, thus raising the precision level of pattern. There was significant difference between real and virtual fit preference. The results show that the virtual try-on system need the development of a specific style.

PCB의 금속 이온 마이그레이션 현상에 관한 연구 (A Study on the Metallic ion Migration Phenomena of PCB)

  • 홍원식;강보철;송병석;김광배
    • 한국재료학회지
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    • 제15권1호
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    • pp.54-60
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    • 2005
  • Recently a lots of problems have observed in high densified and high integrated electronic components. One of them is ion migration phenomena, which induce the electrical short of electrical circuit. ion migration phenomena has been observed in the field of exposing the specific environment and using for a long tin e. This study was evaluated the generation time of ion migration and was investigated properly test method through water drop test and high temperature high humidity test. Also we observed direct causes and confirmed generation mechanism of dendritic growth as we reproduced the ion migration phenomena. We utilized PCB(printed circuit board) having a comb pattern as follows 0.5, 1.0, 2.0 mm pattern distance. Cu, SnPb and Au were electroplated on the comb pattern. 6.5 V and 15 V were applied in the comb pattern and then we measured the electrical short time causing by ion migration. In these results, we examined a difference of ion migration time depending on pattern materials, applied voltage and pattern spacing of PCB conductor.

영역 카메라를 이용한 플라즈마 디스플레이의 컬러출력 검사 시스템 (Color Inspection System for Plasma Display Panel by Using Area Camera)

  • 김우섭;도현철;진성일
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2003년도 하계종합학술대회 논문집 Ⅳ
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    • pp.1763-1766
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    • 2003
  • This paper proposes a non-contact color inspection system for plasma display panel (PDP). The red, green, and blue test pattern images are acquired by using the area color CCD camera at the various distance from the PDP. The RGB values are obtained from the region of interest (ROI) which are extracted by applying the image processing to the test pattern image. Finally, the CIE xy and u'v' chromaticity coordinates of the test pattern images according to the distance are acquired from the RGB color coordinates.

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내장된 메모리를 위한 향상된 March 테스트 알고리듬의 설계 및 구현 (Design and implementation of improved march test algorithm for embedded meories)

  • 박강민;장훈;양승민
    • 한국통신학회논문지
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    • 제22권7호
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    • pp.1394-1402
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    • 1997
  • In this work, an efficient test algorithm and BIST architeture a for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect nighborhood pattern sensitive fault which could not be detected in previous march test algoarithms. The proposed test algorithm perposed test algorithm performs testing for neghborhood pattern sensitive fault using backgroung data which has been used word-oriented memory testing.

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성인여성의 경부 및 견부의 유형에 따른 길원형 및 칼라원형의 설계에 관한 연구 (A Study of Designing of Bodice and Collar Pattern according to the Shape of Women′s Neck and Shoulder)

  • 김희숙
    • 복식문화연구
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    • 제9권5호
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    • pp.770-782
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    • 2001
  • The definite objects of this study are as follows; 1. The study presents the methods of the designing collar pattern and bodice pattern by each concrete object after comparing and analyzing the factors among the features which are in need of clothes designing. 2. The object of this study is to make body-suitable ready-made clothes by comparing and analyzing the methods of designing collar pattern and bodices pattern presented by each concrete objects and Bunka Pattern. The results of this study are as follows; 1 . The results of this study developed the body-suitable bodice pattern of bend-forward type, straight type and lean-back type Compared with the Bunka pattern by physical function test, this study was rated high in the aspects of the shape of neck and shoulder. 2. The collar pattern was designed according to each type. The front center rising point of straight type is 2.5cm, lean-back type is 3.0cm and bend-forward type is 1.5cm. Compared with the Bunka pattern by physical function test, this study is rated high in the aspects of the shape. To confirm the increase and change of the measure definitely, the complete examination of each subject is necessary. This developed and investigated pattern must be supplemented more by comparing and analyzing with other pattern and body types.

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NAND Flash Memory Pattern Test를 위한 PMBIST (PMBIST for NAND Flash Memory Pattern Test)

  • 김태환;장훈
    • 전자공학회논문지
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    • 제51권1호
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    • pp.79-89
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    • 2014
  • 최근 새롭게 보급되는 휴대기기(스마트폰, 울트라북, 태블릿 PC)로 인하여 고용량과 빠른 속도를 원하는 소비자가 증가하고 있다. 이에 따라 Flash Memory의 수요도 지속적으로 증가하고 있다. Flash Memory는 NAND형과 NOR형으로 구분되어 있다. NAND형 Flash Memory는 NOR형 Flash Memory에 비해 속도는 느리지만 가격이 저렴하다. 그렇기 때문에 NAND형 Flash Memory는 Mobile 시장에서 많이 사용되어지고 있다. 그래서 Flash Memory Test를 위한 Fault 검출은 메우 중요하다. 본 논문에서는 Fault 검출 향상을 위한 NAND형 Flash Memory의 Pattern Test를 위한 PMBIST를 제안한다.

구성요인에 따른 래글런 소매패턴의 비교 연구(II) - 개발된 소매패턴의 평가를 중심으로 - (A Comparative Study on the Raglan-Sleeve Patterns According to the Construction Factors(II))

  • 이경화;조재희
    • 복식
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    • 제53권8호
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    • pp.1-10
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    • 2003
  • The purpose of this study was to verify fitness of a new raglan sleeve pattern according to the result of appearance and function evaluation. Also, it was to search the relation between the construction factor and the function on the selected 3 types of the existent raglan sleeve patterns and the new sleeve pattern. Three female university students having different shoulder shapes were selected as subjects, wore 4 different types of the raglan steeve was evaluated by professional panel. The functions of the evaluated sleeve patterns evaluated was made by the wearer themselves. According to the comparison of the new raglan sleeve pattern with the existent raglan sleeve pattern, the new raglan sleeve pattern acquired the higher evaluation scores both on the appearance test and the function evaluation. It was known that the appearance and function of the raglan sleeve pattern were effected by construction factors of the sleeve pattern.

학습 정보를 이용한 테스트 용이도 척도의 계산 (New Testability Measure Based on Learning)

  • 김지호;배두현;송오영
    • 대한전자공학회논문지SD
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    • 제41권5호
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    • pp.81-90
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    • 2004
  • 본 연구는 테스트 패턴 생성 알고리즘에서 결정 과정을 안내하는 데 이용되는 새로운 테스트 용이도 척도 계산법을 제안한다. 이 테스트 용이도 척도는 학습에 의해 얻어지는 회로의 구조적 정보를 이용한다. 제안된 테스트 용이도 척도는 오직 하나의 해결책이 존재할 경우 모순조건을 조기에 찾아내는 패턴을 유도하며, 반면에 다수의 해결책들이 존재할 경우 최소한의 모순이 발생토록 유도한다. 제안된 테스트 용이도 척도는 기존의 방법과 동일한 고장 검출율을 얻는 패턴을 얻는데 소요되는 CPU 시간을 상당히 감소시킨다.

BiCMOS 회로의 Stuck-Open 고장 검출을 위한테스트 패턴 생성 (Test Pattern Generation for Detection of Sutck-Open Faults in BiCMOS Circuits)

  • 신재홍
    • 전기학회논문지P
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    • 제53권1호
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    • pp.22-27
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    • 2004
  • BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential behavior. In this paper, proposes a method for efficiently generating test pattern which detect stuck-open in BiCMOS circuits. In proposed method, BiCMOS circuit is divided into pull-up part and pull-down part, using structural property of BiCMOS circuit, and we generate test pattern using set theory for efficiently detecting faults which occured each divided blocks.

패턴 집단 생성 방식을 사용한 내장형 자체 테스트 기법 (Logic Built-In Self Test Based on Clustered Pattern Generation)

  • 강용석;김현돈;서일석;강성호
    • 대한전자공학회논문지SD
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    • 제39권7호
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    • pp.81-88
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    • 2002
  • 본 논문에서는 패턴 집단 생성 방식을 사용한 새로운 내장형 자체 테스트를 위한 테스트 패턴 생성기를 제안하였다. 제안된 기술은 클럭당 테스트 환경에서 작은 하드웨어 크기를 가지면서 미리 계산된 결정 테스트 집합을 가진다. 테스트를 제어하기 위한 회로는 간단하여 자동적으로 합성된다. 새로운 패턴 생성기를 기존의 방법들과 비교한 결과를 ISCAS 벤치마크 회로를 가지고 검증하였다.