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http://dx.doi.org/10.5573/ieie.2014.51.1.079

PMBIST for NAND Flash Memory Pattern Test  

Kim, Tae-Hwan (Department of Computer, Soongsil University)
Chang, Hoon (Department of Computer, Soongsil University)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.51, no.1, 2014 , pp. 79-89 More about this Journal
Abstract
It has been an increase in consumers who want a high-capacity and fast speed by the newly diffused mobile device(Smart phones, Ultra books, Tablet PC). As a result, the demand for Flash Memory is constantly increasing. Flash Memory is separated by a NAND-type and NOR-type. NAND-type Flash Memory speed is slow, but price is cheaper than the NOR-type Flash Memory. For this reason, NAND-type Flash Memory is widely used in the mobile market. So Fault Detection is very important for Flash Memory Test. In this paper, Proposed PMBIST for Pattern Test of NAND-type Flash Memory improved Fault detection.
Keywords
PMBIST(Programmable Memory Built-in Self Test); FSM(Finite State Machine); NAND Flash Memory;
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