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New Testability Measure Based on Learning  

김지호 (중앙대학교 전자전기공학부)
배두현 (중앙대학교 전자전기공학)
송오영 (중앙대학교 전자전기공학부)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.41, no.5, 2004 , pp. 81-90 More about this Journal
Abstract
This paper presents new testability measure based on learning, which can be useful in the deterministic process of test pattern generation algorithms. This testability measure uses the structural information that are obtained by teaming. The proposed testability measure searches for test pattern that can early detect the conflict in case of the hardest decision problems. On the other hand in case of the easiest decision problem, it searches for test pattern that likely results in the least conflict. The proposed testability measure reduces CPU time to generate test pattern that accomplishes the same fault coverage as that of the distance-based measure.
Keywords
testability; ATPG; VLSI; DFT; learning;
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