• 제목/요약/키워드: synchrotron x-ray scattering

검색결과 71건 처리시간 0.023초

Delayed auger recombination in silicon measured by time-resolved X-ray scattering

  • Jo, Wonhyuk;Landahl, Eric C.;Kim, Seongheun;Lee, Dong Ryeol;Lee, Sooheyong
    • Current Applied Physics
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    • 제18권11호
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    • pp.1230-1234
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    • 2018
  • We report a new method of measuring the non-radiative recombination rate in bulk Silicon. Synchrotron timeresolved x-ray scattering (TRXS) combines femtometer spatial sensitivity with nanosecond time resolution to record the temporal evolution of a crystal lattice following intense ultrafast laser excitation. Modeling this data requires an Auger recombination time that is considerably slower than previous measurements, which were made at lower laser intensities while probing only a relatively shallow surface depth. We attribute this difference to an enhanced Coulomb interaction that has been predicted to occur in bulk materials with high densities of photoexcited charge carriers.

High-pressure synchrotron X-ray diffraction study of tremolite and actinolite in various fluids

  • Kong, Mihye;Vogt, Thomas;Lee, Yongjae
    • Current Applied Physics
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    • 제18권11호
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    • pp.1218-1224
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    • 2018
  • Pressure-dependent structural and morphological changes of two amphibole minerals, tremolite and actinolite, were investigated up to 7.0 GPa using synchrotron X-ray powder diffraction underthree different pressure transmission media (PTM): water (W), $CO_2$ and silicone oil (SI). The elastic response of tremolite and actinolite are found to be dependent on the PTM used. When using water (W) as PTM, tremolite and actinolite show normal volume contractions with bulk moduli of 74(1) and 78(1) GPa, respectively. When using $CO_2$ as PTM, we observe the formation of calcite from tremolite above 3.8(1) GPa, whereas actinolite did not show any carbonation reaction. Under silicone oil PTM, we observe modulated volume contraction behaviors in both samples, compared to water and $CO_2$ PTM, with bulk moduli in the order of 90(1) and 94(4) GPa for tremolite and actinolite, respectively.

Current Status of the Synchrotron Small-Angle X-ray Scattering Station BL4C1 at the Pohang Accelerator Laboratory

  • Jorg Bolze;Kim, Jehan;Huang, Jung-Yun;Seungyu Rah;Youn, Hwa-Shik;Lee, Byeongdu;Shin, Tae-Joo;Moonhor Ree
    • Macromolecular Research
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    • 제10권1호
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    • pp.2-12
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    • 2002
  • The small-angle X-ray scattering (SAXS) beamline BL4C1 at the 2.5 GeV storage ring of the Pohang Accelerator Laboratory (PAL) has been in its first you of operation since August 2000. During this first stage it could meet the basic requirements of the rapidly growing domestic SAXS user community, which has been carrying out measurements mainly on various polymer systems. The X-ray source is a bending magnet which produces white radiation with a critical energy of 5.5 keV. A synthetic double multilayer monochromator selects quasi-monochromatic radiation with a bandwidth of ca. 1.5%. This relatively low degree of monochromatization is sufficient for most SAXS measurements and allows a considerably higher flux at the sample as compared to monochromators using single crystals. Higher harmonics from the monochromator are rejected by reflection from a flat mirror, and a slit system is installed for collimation. A charge-coupled device (CCD) system, two one-dimensional photodiode arrays (PDA) and imaging plates (IP) are available its detectors. The overall performance of the beamline optics and of the detector systems has been checked using various standard samples. While the CCD and PDA detectors are well-suited for diffraction measurements, they give unsatisfactory data from weakly scattering samples, due to their high intrinsic noise. By using the IP system smooth scattering curves could be obtained in a wide dynamic range. In the second stage, stating from August 2001, the beamline will be upgraded with additional slits, focusing optics and gas-filled proportional detectors.

Crystallization Behavior of Polymers as Viewed from the Molecular Level

  • Tashiro, Kohji;Sasaki, Sono;Ueno, Yoko;Yoshioka, Akiko;Kobayashi, Masamichi
    • Macromolecular Research
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    • 제8권3호
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    • pp.103-115
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    • 2000
  • The structural changes viewed from the molecular level have been investigated for the isothermal crystallization phenomena of polyethylene (PE) and the solvent-induced crystallization phenomenon of syndiotactic polystyrene (sPS) glassy sample. The data, which were collected by the time-resolved measurements of Fourier-transform infrared spectra, Raman spectra, synchrotron-sourced small-angle X-ray scattering, wide-angle X-ray scattering, and so on, were combined together to extract the detailed structural information in these phase transition phenomena. In the case of PE, the isothermal crystallization from the melt to the orthorhombic form was found to occur via the conformationally-disordered trans chain form, followed by the formation of the lamellar stacking structure of regular orthorhombic-type crystals. In the case of sPS, the amorphous chains in the glassy sample were found to enhance the mobility through the interaction with the injected solvent molecules, which act as a trigger to cause the conformational ordering from the random coil to the regular T$_2$G$_2$-type helical form. The thus created short helical segments were found to grow into longer helices, which gathered together to form the crystallites, as revealed by the organized coupling of the infrared, Raman and X-ray scattering data.

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A real-time X-ray scattering study of sputtering growth of TiN films

  • J.H.Je;Noh, D.Y.;Kim, H.K.;K.S.Liang
    • 한국진공학회지
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    • 제4권S1호
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    • pp.97-101
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    • 1995
  • We report the results of a real-time synchrotron x-ray scattering study of the growth of TiN thin films on Si(001) substrates by RF sputtering. Our experiemnts show that the morphology of the TiN films strongly depends on growth conditions. After the nucleation and growth takes place with random crystallographic orientation at the very early stage, the films grow with a preferred orientation. Such preferred orientation was found to depend on both the sputtering power and the carrier gases used in the sputtering. Generally, the final morphology assumes either(111) or (002) crystallographic orientation. Using Ar sputtering, a cross-over effect from(002) to (111) was observed at intermediate time. The nature of the observed morphological changes is discussed.

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