Browse > Article

Current Status of the Synchrotron Small-Angle X-ray Scattering Station BL4C1 at the Pohang Accelerator Laboratory  

Jorg Bolze (Pohang Accelerator Laboratory, Pohang University of Science and Technology)
Kim, Jehan (Pohang Accelerator Laboratory, Pohang University of Science and Technology)
Huang, Jung-Yun (Pohang Accelerator Laboratory, Pohang University of Science and Technology)
Seungyu Rah (Pohang Accelerator Laboratory, Pohang University of Science and Technology)
Youn, Hwa-Shik (Pohang Accelerator Laboratory, Pohang University of Science and Technology)
Lee, Byeongdu (Department of Chemistry, Center for Integrated Molecular Systems, BK21 Functional Polymer Thin Film Group, and Polymer Research Institute, Pohang University of Science and Technology)
Shin, Tae-Joo (Department of Chemistry, Center for Integrated Molecular Systems, BK22 Functional Polymer Thin Film Group, and Polymer Research Institute, Pohang University of Science and Technology)
Moonhor Ree (Department of Chemistry, Center for Integrated Molecular Systems, BK23 Functional Polymer Thin Film Group, and Polymer Research Institute, Pohang University of Science and Technology)
Publication Information
Macromolecular Research / v.10, no.1, 2002 , pp. 2-12 More about this Journal
Abstract
The small-angle X-ray scattering (SAXS) beamline BL4C1 at the 2.5 GeV storage ring of the Pohang Accelerator Laboratory (PAL) has been in its first you of operation since August 2000. During this first stage it could meet the basic requirements of the rapidly growing domestic SAXS user community, which has been carrying out measurements mainly on various polymer systems. The X-ray source is a bending magnet which produces white radiation with a critical energy of 5.5 keV. A synthetic double multilayer monochromator selects quasi-monochromatic radiation with a bandwidth of ca. 1.5%. This relatively low degree of monochromatization is sufficient for most SAXS measurements and allows a considerably higher flux at the sample as compared to monochromators using single crystals. Higher harmonics from the monochromator are rejected by reflection from a flat mirror, and a slit system is installed for collimation. A charge-coupled device (CCD) system, two one-dimensional photodiode arrays (PDA) and imaging plates (IP) are available its detectors. The overall performance of the beamline optics and of the detector systems has been checked using various standard samples. While the CCD and PDA detectors are well-suited for diffraction measurements, they give unsatisfactory data from weakly scattering samples, due to their high intrinsic noise. By using the IP system smooth scattering curves could be obtained in a wide dynamic range. In the second stage, stating from August 2001, the beamline will be upgraded with additional slits, focusing optics and gas-filled proportional detectors.
Keywords
synchrotron X-ray; small-angle X-ray scattering; beamline;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
Times Cited By Web Of Science : 107  (Related Records In Web of Science)
Times Cited By SCOPUS : 98
연도 인용수 순위
1 P. Cebe, B. S. Hsiao, and D. J. Lohse, Eds., Scattering from Polymers: Characterization by X-rays, Neutrons and Light, ACS Symposium Series 739 Oxford Univ. Press, 1999, and further references given therein
2 R. G. Gilbert, Emulsion Polymerization, Academic Press, London, 1995
3 S. W. Lee, B. Lee, and M. Ree, Macromol. Phys, Chem., 201, 453 (2000)
4 P. Norby, J. Appl. Cryst., 30,21 (1997)
5 R. J. Roe, Methods of X-ray and Neutron Scattering in Polymer Science, Oxford Univ. Press., Oxford, 2000
6 G. R. Strobl and M. Schneider, J. Polym. Sci., 18, 1343(1980)
7 L. A. Feigin and D. I. Svergun, Structure Analysis by Smallangle X-ray and Neutron Scattering, Plenum Press, New York, 1987
8 T. -Yo. Lee, J. Choi, Y. Chung, J. Y. Huang, J. M. Lee, S. H. Nam, and H. S. Youn, Nuclear Instruments and Methods in Physics Research A, 467-468,47 (2001)
9 M. Ree, S. H. Woo, and T. J. Shin, Polym. Sci. Technol. (Korea), 8, 57 (1997)
10 T. J. Shin, B. Lee, H. S. Youn, K. -B. Lee and M. Ree Langmuir, 17, 7842 (2001)
11 T. Fujisawa, Y. Inoko, and N. Yagi, J. Synchr. Rad, 6, 1106 (1999)
12 N. Dingenouts, Rontgenkleinwinkelstreuung als Methodik der Strukturanalyse teilgeordneter Systeme, Shaker Verlag, Aachen, 1999
13 N. Dingenouts, J. Bolze, D, Potschke, and M. Ballauff, Adv. Polym. Sci., 144, 1 (1999), and further references given therein
14 H. Brumberger, Ed., Modern Aspects of Small-Angle Scattering, Kluwer Academic Press, Dordrecht, 1995
15 A. P. Hammersley, S. O. Svensson, A, Thompson. H. Graafsma, ${\AA}$, Kvick, and J. Moy, Rev. Sci Instn., 66,2729 (1995)
16 M. Ree, S. H. Woo, K. Kim, H. Chang, W. C. Zin, K.-B, Lee, and Y. J. Park, Macromol. Symp., 118, 213 (1997)
17 B. Chu and B. S. Hsiao, Chem, Rev., 101, 1727 (2001)
18 A. Guinier and G. Fournet, Small Angle Scattering of X-rays, Chapman & Hall, London, 1955
19 N. Dingenouts and M. Ballauff, Langmuir, 15, 3283 (1999)
20 S. Doniach, Chem. Rev., 101, 1763 (2001)
21 O. Glatter and O. Kratky, Eds., Small Angle X-ray scattering, Academic Press, London, 1982