• Journal of the Korean Applied Science and Technology
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• v.33 no.4
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• pp.813-823
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• 2016

The purpose of this study was to investigate the effects of ionized calcium treatment on total bacterial cross-contamination of chicken carcass surface in the slaughtering process. The growth of Escherichia coli was strongly inhibited in a medium prepared by using a 0.5% ionized calcium solution. The total bacterial cross-contamination of chicken carcass surface and the scalding water was significantly increased as the number of scalding was increased (p<0.05). The total bacterial cross-contamination of chicken carcass surface reached a plateau without a further increase as scalding was performed consecutively for 10 or more times. The total bacterial cross-contamination of the scalding water was significantly increased as the number of scalding was increased (p<0.05). The total bacterial cross-contamination of chicken carcass surface of the chickens raised on a floor type farm was significantly higher than that of the chickens raised in a battery cages (p<0.05). The total bacterial cross-contamination of chicken carcass surface of the chickens raised on a floor type farm was significantly lower in the 0.5% ionized calcium solution treatment group than in the control group (p<0.05).

• Applied Science and Convergence Technology
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• v.25 no.6
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• pp.128-132
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• 2016

We investigated the effect of Ar ion sputtering on the surface electronic structure of indium tin oxide (ITO) using X-ray and ultraviolet photoelectron spectroscopy (XPS and UPS) measurements with increasing Ar ion sputtering time. XPS measurements revealed that surface contamination on ITO was rapidly removed by Ar ion sputtering for 10 s. UPS measurements showed that the work function of ITO increased by 0.2 eV after Ar ion sputtering for 10 s. This increase in work function was attributed to the removal of surface contamination, which formed a positive interface dipole relative to the ITO substrate. However, further Ar ion sputtering did not change the work function of ITO although the surface stoichiometry of ITO did change. Therefore, removing the surface contamination is critical for increasing the work function of ITO, and Ar ion sputtering for a short time (about 10 s) can efficiently remove surface contamination.

• Journal of the Semiconductor & Display Technology
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• v.10 no.3
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• pp.15-19
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• 2011

The performance of the DRAM is strongly dependent on the purity and surface roughness of the TIT (TiN/Insulator/ TiN) capacitor electrodes. Hence, in the present study, we evaluate the effects of organic contamination and change of surface roughness on the cylindrical TIT capacitor electrodes during the wet cleaning process by various analytical techniques such as TDMS, AFM, XRD and V-SEM. Once the sacrificial oxide and PR (Photo Resist) are removed by HF, the organic contamination and surface oxide films on the bottom Ti/TiN electrode become visible. With prolonged HF process, the surface roughness of the electrode is increased, whereas the amount of oxidized Ti/TiN is reduced due to the HF chemicals. In the 80nm DRAM device fabrication, the organic contamination of the cylindrical TIT capacitor may cause defects like SBD (Storage node Bridge Defect). The SBD fail bit portion is increased as the surface roughness is increased by HF chemicals reactions.

• Journal of the Korea Safety Management & Science
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• v.17 no.4
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• pp.241-246
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• 2015

Generally a patient who was injected radiopharmaceuticals for nuclear medicine examination is not an object of isolation. Therefore, when the patient uses toilet, we expect surface contamination of a toilet by radioisotope. The measured value is $25.69Bq/cm^2$(a restroom near admission and administration), $19.39Bq/cm^2$(a toilet near department of radiology). The study shows that 9 of 24 locations in controlled area exceed over surface contamination limit. From now on, we should find source of contamination through measurement radioactive nuclide to apply radiation safety management.

• KEPCO Journal on Electric Power and Energy
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• v.7 no.2
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• pp.317-321
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• 2021

As the large-scale renewable energy power plant increases, the high-capacity and compact Energy Storage System (ESS) is required. However, this trend could reduce the insulation reliability of ESS. In this study, the surface flashover characteristics for four types of solid insulators are investigated in the uniform electric field with AC and Lightning Impulse (LI) voltage waveforms under various contamination levels. In addtion, insulator surfaces are compared based on the contact angle before and after surface flashover. The experimental results show that AC flashover voltage is dependent on the materials and the contamination level, but LI flashover voltage is only associated with the contamination level. Especially, AC flashover voltage of PC (PolyCarbonate) is higher than that of other insulators, which is associated with the unique and sequential creepage discharge propagation pattern of PC. The localized discharges on the surface of PC form corresponding tracking points. Then, the interconnected trackings result in the complete flashover. This flashover patterns degrade the surface of PC much more than that of epoxy and Bulk Molding Compoud (BMC). Thus, the contact angle of PC is significantly reduced compared to that of other insulators. The increased hydrophilicity in the surface of PC enhances the insulator surface conductivity.

• Journal of dental hygiene science
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• v.17 no.6
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• pp.472-480
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• 2017

The purpose of this study was to investigate Staphylococcus epidermidis contamination on hands of 20 dental hygienists and 140 equipment surface of 20 dental clinics in a local area, from July to August 2017. The degree of S. epidermidis contamination was measured using a hand plate and a rodac plate and then cultured at $35^{\circ}C$ for 24 hours. Based on hand plate criteria, hand contamination was classified into low, middle, and high groups. Analysis of the variance (ANOVA) of the contamination level of the hand parts of the group surface contamination level of the dental clinic equipment was descriptive statistics after clustering lock count. S. epidermidis contamination was moderate in 55% of the hands of dental hygienists. The area of contamination was 29.45 colony-forming units (CFU) on the palm, followed by the middle finger 7.8 CFU, ring finger 6.4 CFU, and thumb 6 CFU. Medical equipment surface contamination was showed that 3-way handle 4.45 CFU, computer mouse 3.37 CFU, mirror handle 1.60 CFU were higher than other areas. The group with high hand contamination had a high positive correlation with the S. epidermidis contamination of the hand. S. epidermidis contamination level was higher on hands than on the medical equipment surface contamination. Therefore, medical staff should recognize the importance of hand hygiene which should be practiced in the manner suggested by World Health Organization. In addition, the medical team needs to be responsible for performing infection control tasks, implementing infection management guidelines and providing systematic education on infectious disease management.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.19 no.12
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• pp.1078-1084
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• 2006

Impurity contamination induced by $CF_4\;and\;HBr/Cl_2/O_2$ plasma etching on Si surface was examined by using surface spectroscopes. XPS(x-ray photoelectron spectroscopy) surface analysis showed that F of 0.4 at % exists in the surface layer in the form of Si-F bonding but Br and Cl are below the detection limit $(0.1{\sim}1.0%)$ of the spectroscope. Static-SIMS(secondary ion mass spectrometry) surface analysis showed that the etched Si surface was contaminated with etching gas elements such as H, F, Cl and Br, and they existed to the depth of about $20{\sim}40nm$. The etched Si surface was treated with three different methods that were HF dip, thermal oxidation followed by HF dip and oxygen-plasma oxidation followed by HF dip. They showed an effect in reducing the impurity contamination and the oxygen-plasma oxidation followed by HF dipping method appears to be a little bit more effective.

• Restorative Dentistry and Endodontics
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• v.28 no.3
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• pp.203-208
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• 2003

The purpose of this study was to evaluate the effect of salivary contamination of teeth on bonding efficacy of self-priming and self-etching DBSs. The materials used were Single Bond(SB, self-priming system, 3M), Unifil Bond(UB, self-etching system, GC), and Scotchbond Multi-Purpose Plus(SM, 3M) as control. Forty five human molars randomly allocated to three groups as dentin bonding systems tested and embedded in epoxy resin. Then the specimens were wet-ground to expose flat buccal enamel surface or flat occlusal dentin surface and cut bucco-lingually to form two halves with slow speed diamond saw. One of them was used under non-contamination, other under contamination with saliva. The bonding procedure was according to the manufacturer's directions and resin composite(Z-100, 3M Dental Products, St. Paul, MN) was built-up on the bonded surface 5mm high. The specimens were ground carefully at the enamel-composite interface with fine finishing round diamond bur to create an hour-glass shape yielding bonded surface areas of $1.5{\pm}0.1\textrm{mm}^2$. The specimens were bonded to the modified microtensile testing apparatus with cyanoacrylate, attached to the universal testing machine and stressed in tension at a CHS of 1mm/min. The tensile force at failure was recorded and converted to a tensile stress(MPa). Mean values and standard deviations of the bond strength are listed in table. One-way ANOVA was used to determine significant difference at the 95% level. The bond strength of SBMP and SB were not affected by salivary contamination, but that of UB was significantly affected by salivary contamination. These results indicate that DBSs with total etch technique seems less likely affected by salivary contamination in bonding procedure.

• Proceedings of the KSME Conference
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• 2001.06d
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• pp.585-588
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• 2001

Particle contamination on the data storage disks has been a serious problem for magnetic hard disk drive manufacturers. For high storage optical disks, such as DVD-ROM/RAM or NFR (near field recording) system, particle-induced damages can be also detected because only a few micrometer particles can prevent read/write signal from optical lens. The increasing areal density and smaller bit size accelerates particle induced damages on the optical disk. One of the methods to prevent particle contamination on the optical disk surface is to handle the disk enclosed in a cartridge like a modern DVD-RAM disk. However, even for a perfectly sealed disk drive, particles are found inside the drive. The other method is to improve disk surface characteristics. Particle contamination on the surface can be reduced by proper selection of disk coating materials. [n this paper, particle detachment ratios for CD (compact disk), DVD (digital versatile disk), HD (magnetic hard disk), HD with Jut lubricant, and aluminosilicate substrate HD were investigated. Surface roughness and surface energy of the test disks were compared with the particle detachment ratios. Proper substrate and lubricant characteristics to reduce particle contamination on the disk surface were found.

• The Journal of Information Technology
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• v.8 no.1
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• pp.113-118
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• 2005

Investigation of surface discharge characteristics of surface leakage on polluted EPDM insulator have been performed. This work was performed utilizing High Frequency Current Trans former to monitor surface discharge. It was found that there were significant variation in the surface discharge waveform frequency spectrum, depending both on the surface discharge magnitude and more importantly on the duration of surface discharge activity.