• 대한전기학회:학술대회논문집
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• 대한전기학회 2007년도 제38회 하계학술대회
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• pp.915-916
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• 2007

There are many equipments for the Short Circuit Test, for example Short Circuit Generator, Induction Motor, Sequence Timer, Exciter, CLR, Back Up Breaker, Making Switch and TRV etc. Especially Back up Breaker and Making Switch are very important equipments to test the short circuit test. A role of a Back up Breaker is to break high-voltage and high-current for short circuit test and a Making Switch should be operated always same speed/time and kept electrical-mechanical characteristics to make the voltage and current of short circuit test. This study introduces to the short circuit test also to kinds, principal movements and compare them of Back up Breaker and Making Switch.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2008년도 제39회 하계학술대회
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• pp.735-736
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• 2008

There are many equipments for the Short Circuit Test, for example Short Circuit Generator, Induction Motor, Sequence Timer, CLR, Back Up Breaker, Making Switch and Excitation Equipment etc. Gradually an allowable tolerance of the short circuit test voltage is become smaller by the standards for short circuit test. The excitation equipment of short circuit generator is very important for test voltage is adjusted by the excitation equipment. Especially the excitation equipment must be possessed character of exactitude, durability and inalterability because some times around 10,000 times opening and closing short circuit test is requested by clint, which must be done within one minute. The purpose of this study for function and operation of the excitation equipment which rated DC voltage is 1,000V, rated DC current is 300A, rated out put is 30kW and type is YNEX 97S-441/609, is to help operation of short circuit generator.

• 대한설비공학회:학술대회논문집
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• 대한설비공학회 2006년도 하계학술발표대회 논문집
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• pp.584-589
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• 2006

In this paper, a test apparatus for reliability evaluation of a rotary compressor has been suggested with a short-cycle concept. $CO_2$ refrigerant is adopted for this cycle to avoid phase change during cycle operation. Evaporator is not necessary in short-cycle. Utilizing a short-cycle, the test apparatus was built on the purpose of evaluating the reliability of each rotary compressor on the conveyer belt of the factory. The primary validation of the test apparatus is discussed by analyzing the experimental heat balance data. Additional validation was performed through the overload continuous operation test where the wear rate of the $CO_2$ short-cycle was found to similar to that of the R22 normal-cycle. The reliability evaluation test apparatus with a short-cycle in present investigation was found simple and efficient in the view of reducing sample numbers, costs, and test time in analyzing the reliability of rotary compressors.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 B
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• pp.705-706
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• 2006

Generally Short Circuit Test of transformers are tested according to IEEE std C57.12.00-2000, IEC 60076-5(2000-07), ES148(1998.6.26) or KS C4309(2003). But ES148(1998.6.26) is same as IEEE std C57. 12.00-2000 and KS C4309(2003) is revising coincidence with IEC 60076-5(2000-07). On this study condition of the transformers before short circuit test, calculation method for test current peak value, tolerance on the asymmetrical peak and r.m.s value, short circuit testing procedure, number of short circuit test, duration short circuit test, and detection of faults and evaluation of short circuit test result will be compared with ANSI and IEC.

• 전자공학회논문지B
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• 제31B권9호
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• pp.1-9
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• 1994

This paper analyzes the faults and their mechanism of CMOS ICs using IDDQ testing technique and evalutes the reliability of the chips that fail this test. It is implemented by the three testing phases, initial test, burn-in and life test. Each testing phase includes the parametric test, functional test, IDDQ test and propagation delay test. It is shown that the short faults such as gate-oxide short, bridging can be only detected by IDDQ testing technique and the number of test patterns for this test technique is very few. After first burn-in, the IDDQ of some test chips is decreased, which is increased in conventional studies and in subsequent burn-in, the IDDQ of all test chips is stabilized. It is verified that the resistive short faults exist in the test chips and it is deteriorated with time and causes the logic fault. Also, the new testing technique which can easily detect the rsistive short fault is proposed.

• 한국정보통신학회논문지
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• 제7권1호
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• pp.100-105
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• 2003

본 논문에서는 CMOS 연산증폭기에 존재하는 모든 단락고장(short fault)과 개방고장(open fault)을 효과적으로 검출할 수 있는 새로운 테스트 방식을 제안한다. 제안하는 테스트 방식은 단위이득 대역폭(unit gain bandwidth)보다 큰 주파수를 가치는 단일 정현파를 이용한다. 이 방식은 하나의 테스트 패턴으로 모든 대상고장을 검출할 수 있으므로 테스트 패턴 생성을 위한 알고리즘이 간단하다. 따라서 패턴 생성 시간이 짧고, 테스트 비용을 줄일 수 있는 장점을 가지고 있다. 제안한 테스트 방식을 검증하기 위하여 2단 연산 증폭기를 설계하였으며, HSPICE 모의실험을 통하여 대상 고장에 대하여 높은 고장검출율(fault coverage)을 얻었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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• pp.501-502
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• 2006

In this paper, new and aging sample of MCCB and ELCB are investigated the main performance test such as short circuit test, mechanical and electrical endurance test, dielectric test and surge current test. The surface conditions of new and aging sample are analyzed by SEM, TGA and DSC. The ELCB occurred badness mainly in short circuit test and surge current test. The badness cause of short circuit test was confirmed due to imperfect contact of contact part.

• 한국작물학회지
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• 제42권4호
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• pp.466-472
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• 1997

Vegetable perilla, "Ipdlkkae 1"(Perilla frutescens var japonica Hara), was tested about the flowering and maturing responce in summer and winter. In summer season, it was researched about those responses according to the change of seeding date from May 15th to Oct. 15th at one month interval in the field. "Ipdlkkae 1" flowered Oct. 2nd under the day length of eleven hours and fourty-one minutes, compared with Sep. 6th (day length of twelve hours and fourty-three minutes) of "Yepsildlggae". And those responses showed that vegetable perilla was have to seeded before July 15th for two reason. The first is a unique response of perilla to day length. If perilla stay under short-day condition for some days, perilla will flower after four weeks. The second is a weather, especially frost and cold. In the test of latest seeding at Oct. 15th, the plants flowered more late than normal flowering period and they were not able to mature for frost of early winter. And this result showed that any other species, which has the characteristic of later flowering than that of "Ipdlkkae 1", could not able to mature in the field. In winter time, this species was tested about the same responses according to the change of short-day treatments. In the case of the test from May 1st (above fourteen hours day length), even if the test plants were stayed under short-day condition for more than 10 days, they were not able to mature, but flowerd. From the test of Apr. 15th, day length of thirteen hours, the plants were showed variable reaction to the short-day treatment. In this test, 11days for short-day treatment was a basic day to decide whether flowering was delayed or not. In the test from Apr. 1st, perilla seeds were able to harvest at least 5 days short-day treatment. In the final test from Mar. 15th, it had no need to take short-day treatment for harvesting of normal seeds, because the day length of that are twelve hours, which is an enough time to induce flowering and maturing, previously reported.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2008년도 제39회 하계학술대회
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• pp.866-867
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• 2008

Among many tests to verify the characteristics of power system apparatus, the short circuit test is performed to verify the performance characteristics of the apparatus under the short-circuited power system. The verification of the short-circuit performance is inevitable for the reliability of power system and the safety of the operator around. The short circuit performance test requires the suitable power source and Korea Electrotechnology Research Institute has 4000 MVA, 500 MVA short circuit generators for the short circuit performance test. This paper will study on the parameters of short-circuit generator and the estimation of them.

• 한국초전도저온공학회:학술대회논문집
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• 한국초전도저온공학회 2003년도 추계학술대회 논문집
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• pp.10-13
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• 2003

6.6㎸rms/200Arms DC reactor type superconducting fault current limiter (SFCL) has been developed. This paper deals with the manufacture and short-circuit test of the SFCL. DC reactor was the HTS solenoid coil whose inductance was 84mH. AC/DC power converter was performed as the dual-mode operation. The short-term run(1 sec) and short-circuit test of this SFCL was performed successfully. The experimental results have a similar tendency to the simulation results. In short-circuit test, at 2 cycles after the fault, fault current limitation rate was about 30％.