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Test Method of an Embedded CMOS OP-AMP  

김강철 (여수대학교 컴퓨터공학과)
송근호 (경상대학교 전자공학과)
한석붕 (경상대학교 전자공학과)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.7, no.1, 2003 , pp. 100-105 More about this Journal
Abstract
In this paper, we propose the novel test method effectively to detect short and open faults in CMOS op-amp. The proposed method uses a sinusoidal signal with higher frequency than unit gain bandwidth. Since the proposed test method doesn't need complex algorithm to generate test pattern, the time of test pattern generation is short, and test cost is reduced because a single test pattern is able to detect all target faults. To verify the proposed method, CMOS two-stage operational amplifier with short and open faults is designed and the simulation results of HSPICE for the circuit have shown that the proposed test method can detect short and open faults in CMOS op-amp.
Keywords
Open Fault; Short Fault; CMOS OP-AMP; Frequency Characteristics; Fault Injection;
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