• JSTS:Journal of Semiconductor Technology and Science
• /
• v.6 no.2
• /
• pp.87-89
• /
• 2006

This paper proposes a sense amplifier with non-volatile memory in order to improve the image quality of LCD by enhancing the matching of the driving voltages between the panel and driver. The sense amplifier having a wide sensing margin and fast response adjusts LCD driver voltage of display driver. The CSTN-LCD with the sense amplifier results improved image quality than that with conventional 6 bit column driver without it.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.48 no.5
• /
• pp.6-11
• /
• 2011

We have developed dissolved ozone decompose system in the used ozonated water for the semiconductor and LCD fabrication processes, which will be base of obtaining core process technology in the high performance, low price semiconductor and LCD fabrications. Using this technology, it is possible for the semiconductor wafer and LCD planer to process more rapid and chip, and productivity will be improved.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.46 no.10
• /
• pp.25-30
• /
• 2009

We have developed recycling technology of ethylen carbonate to use in photoresist stripping and cleaning process, which will be core processing technology for high performance and low price semiconductor and LCD fabrication. Using this technology, it is possible for semiconductor wafer and LCD planer to process more rapid and chip, and productivity will be improved.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2004.08a
• /
• pp.1240-1243
• /
• 2004

Multi-Valued Image Entropy Coding (MVIEC) is a new class of joint source channel coding, which reduces both input-width (1/4) and average current (0.36-1.3) for LCD source drivers. This paper describes the detail results on MVIEC for several image sets in order to verify the practical performance.

• IE interfaces
• /
• v.21 no.2
• /
• pp.151-160
• /
• 2008

Defect size distribution is a probability density function for the defects that occur on wafers or glasses during semiconductor/LCD fabrication. It is one of the most important information to estimate manufacturing yield using well-known statistical estimation methods. The defects are detected by automatic optical inspection (AOI) facilities. However, the data that is provided from AOI is not accurate due to resolution of AOI and its defect detection mechanism. It causes distortion of defect size distribution and results in wrong estimation of the manufacturing yield. In this paper, I suggest a size conversion method and a maximum likelihood estimator to overcome the vague defect size information of AOI. The methods are verified by the Monte Carlo simulation that is constructed as similar as real situation.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2007.08a
• /
• pp.571-573
• /
• 2007

It is known that the main source of the area image sticking is the ion charge adsorption on the alignment layer. We found out that the adsorption of the ion charge of the liquid crystal in the cell was physisorption, which takes place between all molecules on any surface providing the adsorption force is small.

• Journal of the Semiconductor & Display Technology
• /
• v.19 no.3
• /
• pp.68-72
• /
• 2020

A new method for array testing of TFT-CD panel with the integrated gate driver circuits is presented. As larger size/high resolution TFT-LCD with the peripheral driver circuits has emerged, one of the important problems for manufacturing is array testing on the panel. This paper describes the technology of detecting defective arrays and optimizing the array testing process. For the effective characterization of pixel array, the pixel storage capability is simulated and measured with voltage imaging system. This technology permits full functional testing during the manufacturing process, enabling fabrication of large TFT-LCD panels with the integrated driver circuits.

• Proceedings of the IEEK Conference
• /
• 2008.06a
• /
• pp.575-576
• /
• 2008

This paper presents a design of a charge pumping circuit for LCD Driver IC. The charge pumping circuit consists of a control block, a VCIOUT generating block, a DDVDH generating block, a VGH/VGL generating block, and VCL generating block. It generates various higher and lower voltage than supply voltage using external control input. Simulation results show that voltages of DDVDH, VGH, VGL, and VCL satisfy the target voltage, and the output DDVDH drives the output current 7mA.

• Journal of the Semiconductor & Display Technology
• /
• v.9 no.3
• /
• pp.59-63
• /
• 2010

This paper proposes computer visual inspection algorithms for various LCD defects which are found in a manufacturing process. Modular vision processing steps are required in order to detect different types of LCD defects. Those key modules include RGB filtering for pixel defects, gray-scale morphological processing and Hough transform for line defects, and adaptive threshold for spot defects. The proposed algorithms can give users detailed information on the type of defects in the LCD panel, the size of defect, and its location. The machine vision inspection system is implemented using C language in an embedded Linux system for a high-speed real-time image processing. Experiment results show that the proposed algorithms are quite successful.

• Proceedings of the IEEK Conference
• /
• 2008.06a
• /
• pp.589-590
• /
• 2008

This paper describes an improved design of graphic memory for QVGA ($320{\times}240\;RGB$) - scale 262k-color LCD Driver IC. A distributor block is adopted to reduce graphic RAM area, which is accomplished with 1/8 data lines of the previous structure. In line-read operation, the drivabilty of memory array cell is improved by partitioning a word line according to the row address. The proposed graphic memory circuit has been designed in transistor level using $0.18{\mu}m$ CMOS technology library and verified using Hsim.