[KSCI] Korea Science Citation Index Service

Array Testing of TFT-LCD Panel with Integrated Gate Driver Circuits

Lee, Jonghwan (Department of System Semiconductor Engineering, Sangmyung University)

Publication Information

Journal of the Semiconductor & Display Technology / v.19, no.3, 2020 , pp. 68-72 More about this Journal

Abstract

A new method for array testing of TFT-CD panel with the integrated gate driver circuits is presented. As larger size/high resolution TFT-LCD with the peripheral driver circuits has emerged, one of the important problems for manufacturing is array testing on the panel. This paper describes the technology of detecting defective arrays and optimizing the array testing process. For the effective characterization of pixel array, the pixel storage capability is simulated and measured with voltage imaging system. This technology permits full functional testing during the manufacturing process, enabling fabrication of large TFT-LCD panels with the integrated driver circuits.

Keywords

Array Testing; TFT-LCD; Peripheral Driver Circuits; Pixel Storage Capability; Voltage Imaging System;

Citations & Related Records

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