• 제목/요약/키워드: scattering layer

검색결과 401건 처리시간 0.021초

높은 결정성을 갖는 이산화티탄 나노입자의 합성 (Synthesis of Titanium Dioxide Nanoparticles with a High Crystalline Characteristics)

  • 김기출
    • 융합정보논문지
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    • 제7권5호
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    • pp.53-58
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    • 2017
  • 석유 고갈의 시대에 저가이면서 반투명한 특징을 갖고 있는 염료감응형 태양전지(DSC)는 1991년 $Gr{\ddot{a}}tzel$의 연구결과 보고 이후 많은 주목을 받아왔다. 염료감응형 태양전지의 광전극의 빛 수확 성능을 증진시키고, 궁극적으로 광전변환효율을 향상시키기 위하여 다양한 구조를 갖는 산란층이 광전극 소재로 제안되었다. DSC 광전극의 산란층에서 산란의 중심으로는 지름이 250 - 300 nm 정도의 크기를 갖는 비교적 큰 이산화티탄 나노입자가 필요하다. 본 연구에서는 변형된 졸겔 공정을 이용하여 약 300 nm 크기의 이산화티탄 나노결정을 합성하였다. XRD와 TEM 분석결과에 의하면, 합성된 이산화티탄 나노입자는 아나타제 상의 단결정 특성을 나타내었다. 합성된 이산화티탄 나노입자를 이용하여 스핀 코팅 공정으로 제조된 이산화티탄 박막의 광학적 투과율은 550 nm 파장에서 약 50%로 측정되었다. 이처럼 적당한 투과율은 DSC 산란층의 산란 중심으로 사용하기에 적합하며, DSC의 광전변환효율 향상에 적절하게 기여할 것으로 기대된다.

Detection of Second-Layer Corrosion in Aging Aircraft

  • Kim, Noh-Yu;Yang, Seun-Yong
    • 비파괴검사학회지
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    • 제29권6호
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    • pp.591-602
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    • 2009
  • The Compton backscatter technique has been applied to lap-joint in aircraft structure in order to determine mass loss due to exfoliative corrosion of the aluminum alloy sheet skin. The mass loss of each layer has been estimated from Compton backscatter A-scan including the aluminum sheet, the corrosion layer, and the sealant. A Compton backscattering imaging system has been also developed to obtain a cross-sectional profile of corroded lap-splices of aging aircraft using a specially designed slit-type camera. The camera is to focus on a small scattering volume inside the material from which the backscattered photons are collected by a collimated scintillator detector for interpretation of material characteristics. The cross section of the layered structure is scanned by moving the scattering volume through the thickness direction of the specimen. The theoretical model of the Compton scattering based on Boltzmann transport theory is presented for quantitative characterization of exfoliative corrosion through deconvolution procedure using a nonlinear least-square error minimization method. It produces practical information such as location and width of planar corrosion in layered structures of aircraft, which generally cannot be detected by conventional NDE techniques such as the ultrasonic method.

Solution-processible corrugated structure and scattering layer for enhanced light extraction from organic light-emitting diodes

  • Hyun, Woo Jin;Im, Sang Hyuk;Park, O Ok;Chin, Byung Doo
    • Journal of Information Display
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    • 제13권4호
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    • pp.151-157
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    • 2012
  • A simple method of fabricating out-coupling structures was demonstrated via solution-processing to enhance light extraction from organic light-emitting diodes (OLEDs). Scattering layers were easily obtained by spin-coating an $SiO_2$ sol solution that contained $TiO_2$ particles. By introducing the scattering layer and the solution-processible corrugated structure as internal and external extraction layers, the OLEDs showed increased external quantum efficiency without a change in the electroluminescence spectrum compared to conventional devices. Using these solution-processible out-coupling structures, nearly all-solution-processed OLEDs with enhanced light extraction could be fabricated. The light extraction enhancement is attributed to the suppression by the out-coupling structures of the light-trapping that arose at the interface of the glass substrate and the air.

FGMM을 이용한 2중 유전체층 사이의 완전도체띠 격자구조에 의한 E-분극 전자파 산란 해석 (Analysis of E-polarized Electromagnetic Scattering by a Conductive Strip Grating Between a Double Dielectric Layer Using FGMM)

  • 윤의중
    • 한국인터넷방송통신학회논문지
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    • 제20권1호
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    • pp.77-82
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    • 2020
  • 본 논문에서는 2중 유전체층 사이의 완전도체띠 격자구조에 의한 E-분극 전자파 산란 문제는 전자파 수치해석 방법으로 알려진 FGMM(Fourier-Galerkin moment method)를 이용하여 해석하였다. 경계조건들은 미지의 계수를 구하기 위하여 이용하였고, 도체띠의 해석을 위해 완전도체 경계조건을 적용하였다. 도체띠의 폭과 주기, 2중 유전층 사이의 비유전율과 두께 및 입사각에 대해 정규화된 반사전력과 투과전력을 계산하였다. 전반적으로 2중 유전체 층의 비유전율이 증가할수록 반사전력은 증가하였으며, 상대적으로 투과전력은 감소하였다. 2중 유전체 층의 비유전율이 증가할수록 도체띠에 유도되는 전류밀도는 스트립 중앙에서 증가하였다. 본 논문의 제안된 구조에 대한 수치결과들은 기존 논문의 수치해석 결과들과 비교하여 매우 잘 일치하였다.

Synthesis of Amorphous Er3+-Yb3+ Co-doped TiO2 and Its Application as a Scattering Layer for Dye-sensitized Solar Cells

  • Han, Chi-Hwan;Lee, Hak-Soo;Lee, Kyung-Won;Han, Sang-Do;Singh, Ishwar
    • Bulletin of the Korean Chemical Society
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    • 제30권1호
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    • pp.219-223
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    • 2009
  • $TiO_2$ doped with $Er^{3+\;and\;Yb^{3+}$ was used for fabricating a scattering layer and a nano-crystalline $TiO_2$ electrode layer to be used in dye-sensitized solar cells. The material was prepared using a new sol-gel combustion hybrid method with acetylene black as fuel. The $Er^{3+}$-$Yb^{3+}$ co-doped titanium oxide powder synthesized at 700oC had embossed structure morphology with a size between 27 to 54 nm that agglomerated to produce micron size particles, as observed by the scanning electron micrographs. The XRD patterns showed that the $Er^{3+}$-$Yb^{3+}$ co-doped titanium oxide had an amorphous structure, while using the same method without doping $Er^{3+}\;or\;Yb^{3+},\;TiO_2$ was obtained in the crystallite form with thea dominance of rutile phase. Fabricating a bilayer structure consisting of nano-crystalline $TiO_2$ and the synthesized $Er^{3+}$-$Yb^{3+}$ co-doped titanium oxide showed better scattering property, with an overall increase of 15.6% in efficiency of the solar cell with respect to a single nano-crystalline $TiO_2$ layer.

R. F. Sputter법으로 성장된 AIN 완충층이 GaN 박막결함에 미치는 영향 (Effect of AIN Buffers by R. F. Sputter on Defects of GaN Thin films)

  • 이민수
    • 한국전기전자재료학회논문지
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    • 제17권5호
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    • pp.497-501
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    • 2004
  • The crystal structure of the GaN film on the AIN buffer layer grown by R. F sputtering with different thickness has been studied using X-ray scattering and transmission electron microscopy(TEM). The interface roughness between the AIN buffer layer and the epitaxial GaN film, due to crossover from planar to island grains, produced edge dislocations. The strain, coming from lattice mismatch between the AIN buffer layer and the epitaxial GaN film, produced screw dislocations. The density of the edge and screw dislocation propagating from the interface between the GaN film and the AIN buffer layer affected the electric resistance of GaN film.

Improvement of carrier transport in silicon MOSFETs by using h-BN decorated dielectric

  • Liu, Xiaochi;Hwang, Euyheon;Yoo, Won Jong
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2013년도 춘계학술대회 논문집
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    • pp.97-97
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    • 2013
  • We present a comprehensive study on the integration of h-BN with silicon MOSFET. Temperature dependent mobility modeling is used to discern the effects of top-gate dielectric on carrier transport and identify limiting factors of the system. The result indicates that coulomb scattering and surface roughness scattering are the dominant scattering mechanisms for silicon MOSFETs at relatively low temperature. Interposing a layer of h-BN between $SiO_2$ and Si effectively weakens coulomb scattering by separating carriers in the silicon inversion layer from the charged centers as 2-dimensional h-BN is relatively inert and is expected to be free of dangling bonds or surface charge traps owing to the strong, in-plane, ionic bonding of the planar hexagonal lattice structure, thus leading to a significant improvement in mobility relative to undecorated system. Furthermore, the atomically planar surface of h-BN also suppresses surface roughness scattering in this Si MOSFET system, resulting in a monotonously increasing mobility curve along with gate voltage, which is different from the traditional one with a extremum in a certain voltage. Alternatively, high-k dielectrics can lead to enhanced transport properties through dielectric screening. Modeling indicates that we can achieve even higher mobility by using h-BN decorated $HfO_2$ as gate dielectric in silicon MOSFETs instead of h-BN decorated $SiO_2$.

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MOS소자 반전층의 전자이동도에 대한 해석적 모델 (An analytical model for inversion layer electron mobility in MOSFET)

  • 신형순
    • E2M - 전기 전자와 첨단 소재
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    • 제9권2호
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    • pp.174-179
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    • 1996
  • We present a new physically based analytical equation for electron effective mobility in MOS inversion layers. The new semi-empirical model is accounting expicitly for surface roughness scattering and screened Coulomb scattering in addition to phonon scattering. This model shows excellent agreement with experimentally measured effective mobility data from three different published sources for a wide range of effective transverse field, channel doping and temperature. By accounting for screened Coulomb scattering due to doping impurities in the channel, our model describes very well the roll-off of effective mobility in the low field (threshold) region for a wide range of channel doping level (Na=3.0*10$^{14}$ - 2.8*10$^{18}$ cm$^{-3}$ ).

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Brillouin Light Scattering을 이용한 GaAs/Fe/Au 구조의 자기이방성 (Brillouin Light Scattering Study of Magnetic Anisotropy in GaAs/Fe/Au System)

  • 하승석;유천열;이석목
    • 한국자기학회지
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    • 제18권4호
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    • pp.147-153
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    • 2008
  • GaAs 기판위에 Fe을 성장시킨 이종 접합 구조는 두 물질의 lattice mismatch가 1.4 % 정도로 작기 때문에 결정 상태가 매우 좋은 Fe층을 성장시킬 수 있는 것으로 알려져있다. GaAs/Fe의 계면에서는 많은 흥미로운 현상이 관찰되며, 또한 스핀주입을 이용한 산업적 응용 면으로 가치가 있는 구조로서 활발한 연구가 진행되어 왔다. 본 연구에서는 GaAs(100) 표면에 Fe층을 쐐기모양으로 두께를 $0{\sim}3.4$ nm로 바꾸어 성장시키고 5 nm 두께의 Au층을 추가 증착시킨 시료를 Brillouin light scattering(BLS) 측정방법을 이용, 자기이방성에 대해 조사하였다. Fe층 두께를 변화시켜가며 자화 용이축과 곤란축 방향으로 외부자기장의 세기에 대한 스핀파 들뜸의 의존도와 외부자기장의 방위각에 대한 스핀파 들뜸의 의존도를 조사하였다. 측정된 결과의 정량적 분석을 통해 Fe층의 두께에 따라 일축 자기이방성 상수와 이축 자기이방성 상수를 구하였다. GaAs층 위에서 성장된 Fe층의 자기이방성은 GaAs 기판에 영향을 받아 Fe층의 두께가 얇을수록 큰 일축 자기이방성을 가지고 박막의 두께가 증가함에 따라서 Fe 본래의 이축 이방성의 크기가 증가함을 확인하였다.

Detection of Second-Layer Corrosion in Aging Aircraft Fuselage

  • Kim, Noh-Yu;Achenbach, J.D.
    • 비파괴검사학회지
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    • 제26권6호
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    • pp.417-426
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    • 2006
  • A Digital X-ray imaging system using Compton backscattering has been developed to obtain a cross-sectional profile and mass loss of corroded lap-splices of aging aircraft from density variation. A slit-type camera was designed to focus on a small scattering volume inside the material, from which the backscattered photons are collected by a collimated scintillator detector for interpretation of material characteristics. The cross section of the lap-joint is scanned by moving the scattering volume through the thickness direction of the specimen. The mass loss of each layer has been estimated from a Compton backscatter A-scan to obtain the thickness of each layer including the aluminum sheet, the corrosion layer and the sealant. Quantitative information such as location and width of planar corrosion in the lap splices of fuselages is obtained by deconvolution using a nonlinear least-square error minimization method(BFGS method): A simple reconstruction model is also introduced to overcome distortion of the Compton backscatter data due to attenuation effects attributed to beam hardening and quantum noise.