• Applied Microscopy
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• 제46권3호
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• pp.155-159
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• 2016

This paper analyses the relationship between the distribution of a dielectric layer on the apex of a metal field electron emitter and the distribution of electron emission. Emitters were prepared by coating a tungsten emitter with a layer of epoxylite resin. A high-resolution scanning electron microscope was used to monitor the emitter profile and measure the coating thickness. Field electron microscope studies of the emission current distribution from these composite emitters (Tungsten-Clark Electromedical Instruments Epoxylite resin [Tungsten/CEI-resin emitter]) have been carried out. Two forms of image have been observed: bright single-spot images, thought to be associated with a smooth substrate and a uniform dielectric layer; and multi-spot images, though to be associated with irregularity in the substrate or the dielectric layer.

• Applied Microscopy
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• 제51권
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• pp.1.1-1.2
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• 2021

We demonstrate a fabrication of an atomically controlled single-crystal heart-shaped nanostructure using a convergent electron beam in a scanning transmission electron microscope. The delicately controlled e-beam enable epitaxial crystallization of perovskite oxide LaAlO₃ grown out of the relative conductive interface (i.e. 2 dimensional electron gas) between amorphous LaAlO₃/crystalline SrTiO₃.

• Nuclear Engineering and Technology
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• 제50권2호
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• pp.259-267
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• 2018

Focused ion beam-scanning electron microscope and electron backscattered diffraction examinations were conducted in the center of a $73\;GWd/t_U\;UO_2$ fuel. They showed the formation of subdomains within the initial grains. The local crystal orientations in these domains were close to that of the original grain. Most of the fission gas bubbles were located on the boundaries. Their shapes were far from spherical and far from lenticular. No interlinked bubble network was found. These observations shed light on previous unexplained observations. They plead for a revision of the classical description of fission gas release mechanisms for the center of high burn-up $UO_2$. Yet, complementary detailed observations are needed to better understand the mechanisms involved.

• 한국정밀공학회지
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• 제24권9호
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• pp.95-102
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• 2007

The scanning electron microscope (SEM) is one of the most popular instruments available for the measurement and analysis of the micro/nano structures. It is equipped with an electron optical system that consists of an electron beam source, magnetic lenses, apertures, deflection coils, and a detector. The magnetic lenses playa role in refracting electron beams to obtain a focused spot using the magnetic field driven by an electric current from a coil. A SEM column usually contains two condenser lenses and an objective lens. The condenser lenses generate a magnetic field that forces the electron beams to form crossovers at desired locations. The objective lens then focuses the electron beams on the specimen. The present work concerns finite element analysis for the electron magnetic lenses so as to analyze their magnetic characteristics. To improve the performance of the magnetic lenses, the effect of the excitation current and pole-piece design on the amount of resulting magnetic fields and their peak locations are analyzed through the finite element analysis.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2006년도 추계학술대회 논문집
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• pp.507-508
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• 2006

• 한국정밀공학회지
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• 제26권11호
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• pp.92-98
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• 2009

The scanning electron microscope (SEM) contains an electron optical system in which electrons are emitted and moved to form a focused beam, and generates secondary electrons from the specimen surfaces, eventually making an image. The electron optical system usually contains two condenser lenses and an objective lens. The condenser lenses generate a magnetic field that forces the electron beams to form crossovers at desired locations. The objective lens then focuses the electron beams on the specimen. The present study covers the design and analysis of an objective lens for a thermionic SEM. A finite element (FE) analysis for the objective lens is performed to analyze its magnetic characteristics for various lens designs. Relevant beam trajectories are also investigated by tracing the ray path of the electron beams under the magnetic fields inside the objective lens.

• 식물조직배양학회지
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• 제22권6호
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• pp.323-327
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• 1995

미나리의 체세포 배발생 과정을 해부학적으로 구명하기 위하여 배발생 기원세포와 캘러스를 광학현미경 및 전자현미경으로 관찰한 결과, 배발생 세포는 hematoxylin에 짙은 보라색으로, 비배발생 세포는 safranin에 적색으로 염색되어 광학현미경하에서 쉽게 구별할 수 있었다. 배발생 캘러스는 많은 수의 원배 및 발육중인 배, 비배발생 세포 등으로 구성되어 있었다. 체세포 배발생은 발육 중인 배나 세포괴의 표피세포에 위치한 배발생 세포의 하나가 분열하거나 세포괴내의 비배발생 세포속에 묻혀 있는 배발생 세포가 분열하여 일어났다. 배발생 과정은 항상 일정한 형태는 아니지만 단세포로부터 일정한 segmentation 과정를 거쳐서 배발생이 진행되는 것으로 나타났다. 투과전자현미경에 의한 관찰에서 배발생 세포는 비배발생 세포에 비하여 세포질이 조밀하고 핵이 대형이며 amyloplast, 인지질체 및 세포소기 관들이 많으며 액포가 없거나 매우 작았다. 이들 세포들은 두터운 세포벽에 의하여 주위의 비배발생 세포와 분리되어 있으며 세포윤곽은 둥글었다. 주사전자현미경으로 관찰한 배발생캘러스는 외부가 그물이 씌워진 형태의 구형의 다양한 크기의 배들과 비교적 크기가 큰 비배발생 세포들이 혼재하였다. 한편 비배발생능 캘러스는 구성세포가 크고 외부에는 gelatin같은 물질로 덮여 있었다.

• 한국산업안전학회:학술대회논문집
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• 한국안전학회 1998년도 추계 학술논문발표회 논문집
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• pp.173-177
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• 1998

In this paper, we reported an outbreak of fire hazard of ballast for fluorescent lamp. The surface structure and composition of ballast coil analyzed by using metallurgical microscope, scanning electron microscope(SEM) and energy dispersive x-ray spectroscopy(EDX). The surface of molten mark appeared columnar structure and void. EDX analysis indicated that the molten mark spectra were composed not only of the corresponding original spectra but also of several new lines.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2007년도 춘계학술대회A
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• pp.1271-1276
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• 2007

The most powerful analytical equipment usually comes at the cost of having the highest demand for space. Where electron microscopes has traditionally required a room to themselves, not just for reasons of their size but because of ancillary demands for pipes and service. The simple optical microscopes, of course, can occupy the desk-top, but because their performance is limited by the wavelength of light, their powers of magnification and resolution are inferior to that of the electron microscope. Mini SEM will sit comfortably on a desk-top but offers magnification and resolution performances much closer to that of a standard SEM. This new technique extends the scope of SEM as a high-resolution microscope, relatively cheap and widely available imaging tool, for a wider variety of samples.

• Bulletin of the Korean Chemical Society
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• 제28권1호
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• pp.81-84
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• 2007

Ab initio periodic Hartree-Fock calculations with the full potential and minimum basis set are applied to interpretation of scanning tunneling microscope (STM) and atomic force microscope (AFM) images on 1TVTe2. Our results show that the simulated STM image shows asymmetry while the simulated AFM image shows the circular electron densities at the bright spots without asymmetry of electron density to agree with the experimental AFM image. The bright spots of both the STM and AFM images of VTe2 are associated with the surface Te atoms, while the patterns of bright spots of STM and AFM images are different.