• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.6
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• pp.70-76
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• 2015

This paper introduces an FPGA self-test architecture reusing FPGA boundary scan chain as self-test circuits. An FPGA boundary scan cell is two or three times bigger than a normal boundary scan cell because it is used for configuring the function of input/output pins functions as well as testing and debugging. Accordingly, we analyze the architecture of an FPGA boundary scan cell in detail and design a set of built-in self-test (BIST) circuits in which FPGA boundary scan chain and a small amount of FPGA logic elements. By reusing FPGA boundary scan chain for self-test, we can reduce area overhead and perform a processor based on-board FPGA testing/monitoring. Experimental results show the area overhead comparison and simulation results.

• Proceedings of the Acoustical Society of Korea Conference
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• 1985.10a
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• pp.47-49
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• 1985

In most of ultrasonic NDT(Non-Destructive Testing) equipments using A-scan display technic, it is one of the inconveniences that the user must be proficient in reading the displayed signals for the accurate decisions. In this study, a simple microprocessorized NDT machine for the flaw detection was developed. The operation of system is based on the conventional NDT system. The microprocessor detects the time delay between transmitted pulse and echos by counter-measure method. Then according to the scanning position, the location of flaw orthe other side of testing object is plotted on the CRT. The main advantages of the developed system are simplicity in handling, recording capability of measured data, and low cost.

• ETRI Journal
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• v.33 no.3
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• pp.374-381
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• 2011

A simple and effective compression method is proposed for multiple-scan testing. For a given test set, each test pattern is compressed from the view of slices. An encoding table exploiting seven types of frequently-occurring pattern is used. Compression is then achieved by mapping slice data into codewords. The decompression logic is small and easy to implement. It is also applicable to schemes adopting a single-scan chain. Experimental results show this method can achieve good compression effect.

• Journal of the Korean Society for Nondestructive Testing
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• v.20 no.4
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• pp.322-328
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• 2000

In this paper, we were investigated the detectability on various specimen in self-designed test field using the GPR system with three antenna elements. The GPR system was constantly radiated 730MHz frequency. To examine the detectability on various condition, the test were experimented using different materials, size and buried depth. As an adjusted wave-propagation velocity, the location of hyperbolic curve pattern were displayed B-scan CRT. And the pattern was exactly positioned when it was compared to the real buried-depth. Therefore, we can confirm similarity between the wave-propagation velocity and previous results.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.10 s.352
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• pp.74-79
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• 2006

Test Interface Controller (TIC) provided by ARM Ltd. is widely used for functional testing of System-on-Chip (SoC) adopting Advanced Microcontroller Bus Architecture (AMBA) bus system. Accordingly, this architecture has a deficiency of not being able to concurrently shifting in and out the structural scan test patterns through the TIC and AMBA bus. This paper introduces a new AMBA based Test Access Mechanism (ATAM) for speedy testing of SoCs embedding ARM cores. While preserving the compatability with the ARM TIC, since scan in and out operations can be performed simultaneously, test application time through the expensive Automatic Test Equipment (ATE) can be drastically reduced.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.11
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• pp.105-114
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• 2000

Delay testing is essential for assurance of digital circuits as the speed and the density of the circuits improve greatly. However, delay faults in sequential circuits cannot be detected easily due to the existence of state registers. To overcome this difficulty a new test method and algorithm are devised which can be used for both stuck-at testing and delay testing. To apply the new test method, a new scan flip-flop is implemented. Experimental results on ISCAS 89 benchmark circuits show that the number of testable paths can be increased drastically over conventional scan techniques.

• Journal of the Korean Society for Nondestructive Testing
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• v.13 no.3
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• pp.7-13
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• 1993

Fracture behavior of pre-cracked compact tension specimens made of AISI 4130 steel was investigated using acoustic emission (AE) and ultrasonic C-scan measurements. While each specimen was loaded up to a certain level, various acoustic emission parameters were recorded together with the crack opening displacement (COD). An elastic-plastic finite element analysis was performed to calculate COD and the damage (plastic) zone size ahead of crack tip. Ultrasonic C-scans, in a pulse-echo, immersion mode, were done for mapping the damage zone size. The agreement between the finite element results and the measured COD was satisfactory. Based on AE results, the test specimens were found to show ductile behavior. The slope of the total ringdown counts vs. COD curve was useful to determine the crack initiation. The preliminary C-scan images showed evidence of changes in the amplitude of ultrasonic signal in the damaged region, and the shape and size of the damage zone matched qualitatively with the finite element results. A further work on the damage zone sizing was also pointed out.

• Proceedings of the KIEE Conference
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• 1998.11b
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• pp.669-671
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• 1998

Due to the serial nature of scan chains, the use of the boundary scan chain leads the high application costs. And with 3-state net, it is important to avoid enabling the two drivers in a net. In this paper, the new test method for 3-state nets in the multiple boundary scan chains is presented. This method configures the boundary scan cells as multiple scan chains and the test application time can be reduced. Also three efficient algorithms are proposed for testing the interconnects in a board without the collision of the test data in 3-state nets.

• Journal of the Korean Society for Precision Engineering
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• v.13 no.12
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• pp.142-150
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• 1996

Nowadays, as the development paeiod of new products becomes even shorter, the importance of Rapid Prototyping Technology(RPT) has been rapidly increased. The major application of RPT is an early verification of product designs and quick production of prototypes for testing. Moreover, RPT is applied not only as a second tooling process such as mold making and investment casting but also as a creating some physical structure in medical field. Despite the remarkable progress of RPT, it is required to improve various problems resulting from application such as production time, accuracy and materials. This paper presents a laser scan path generation for accuracy of stereolithographicparts The methodology of laser scan path generation is discussed based on the stereolithography, The procedure of this research is as follows : 1) Input laser scanning conditions such as a laser beam diameter and a laser scanning interval, 2) Reconstruct original contours without self intersecting offset, 3) Calculate offset about reconstructed contours, 4) Calculate intersection points between horizontal or vertical lines and offset contours for internal hatch, 5) Decide laser shutter on/off points. The algorithm developed and programmed by C language is verified as an efficient method after testing a number of STL files of mechanical parts.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.8 no.2
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• pp.245-249
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• 2007

In this paper describes image enhancement technique using deconvolution processing for ultrasonic nondestructive testing. When flaws are detected fur B-scan or C-scan, blurring effect which is caused by the moving intervals of transducer degrades the quality of images. In addition, acquisited images suffer form speckle noise which is caused by the ultrasonic components reflected from the grain boundary of material (1,2). The deconvolution technique can restore sharp peak value or clean image from blurring signal or image. This processing is applied to C-scan image obtained from known specimen. Experimental results show that the deconvolution processing contributes to get improved the quality of C-scan images.