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Design of Test Access Mechanism for AMBA based SoC  

Min, Pil-Jae (Department of Computer Science & Engineering, Hanyang University)
Song, Jae-Hoon (Department of Computer Science & Engineering, Hanyang University)
Yi, Hyun-Bean (Department of Computer Science & Engineering, Hanyang University)
Park, Sung-Ju (Department of Electrical Engineering Computer Science, Hanyang University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.43, no.10, 2006 , pp. 74-79 More about this Journal
Abstract
Test Interface Controller (TIC) provided by ARM Ltd. is widely used for functional testing of System-on-Chip (SoC) adopting Advanced Microcontroller Bus Architecture (AMBA) bus system. Accordingly, this architecture has a deficiency of not being able to concurrently shifting in and out the structural scan test patterns through the TIC and AMBA bus. This paper introduces a new AMBA based Test Access Mechanism (ATAM) for speedy testing of SoCs embedding ARM cores. While preserving the compatability with the ARM TIC, since scan in and out operations can be performed simultaneously, test application time through the expensive Automatic Test Equipment (ATE) can be drastically reduced.
Keywords
SoC Testing; AMBA; TIC; Test Wrapper; Scan Test;
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