• Title/Summary/Keyword: reverse N-type

Search Result 130, Processing Time 0.028 seconds

A Fast IFFT Algorithm for IMDCT of AAC Decoder (AAC 디코더의 IMDCT를 위한 고속 IFFT 알고리즘)

  • Chi, Hua-Jun;Kim, Tae-Hoon;Park, Ju-Sung
    • The Journal of the Acoustical Society of Korea
    • /
    • v.26 no.5
    • /
    • pp.214-219
    • /
    • 2007
  • This paper proposes a new IFFT(Inverse Fast Fourier Transform) algorithm, which is proper for IMDCT(Inverse Modified Discrete Cosine Transform) of MPEG-2 AAC(Advanced Audio Coding) decoder. The $2^n$(N-point) type IMDCT is the most powerful among many IMDCT algorithms, however it includes IFFT that requires many calculation cycles. The IFFT used in $2^n$(N-point) type IMDCT employ the bit-reverse data arrangement of inputs and N/4-point complex IFFT to reduce the calculation cycles. We devised a new data arrangement method of IFFT input and $N/4^{n+1}$-type IFFT and thus we can reduce multiplication cycles, addition cycles, and ROM size.

Reliability Analysis in PtSi-nSi Devices with Concentration Variations of Junction Parts (접합 부분의 농도 변화를 갖는 PtSi-nSi 소자에서 신뢰성 분석)

  • 이용재
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.3 no.1
    • /
    • pp.229-234
    • /
    • 1999
  • We analyzed the reliability characteristics in platinum schottky diodes with variations of n-type silicon substrates concentrations and temperature variations of measurements. The parameters of reliability measurement analysis are saturation current. turn-on voltage and ideality factor in the forward bias, the breakdown voltage in the reverse bias with device shapes. The shape of devices are square type and long rectangular type for edge effect. As a result, we analyzed that the forward turn-on voltage, barrier height, dynamic resistance and reverse breakdown voltage were decreased but ideality factor and saturation current were increased by increased concentration in platinum and n-silicon junction parts. In measurement temperature(RT, $50^{\circ}C$, $75^{\circ}C$), the extracted electrical parameter values of reliability characteristics were increased at the higher temperature under the forward and reverse bias. The long rectangular type devices were more decreased than the square type in reverse breakdown voltage by tunneling effects of edge part.

  • PDF

ESTIMATES FOR THE RIESZ TRANSFORMS ASSOCIATED WITH SCHRÖDINGER TYPE OPERATORS ON THE HEISENBERG GROUP

  • Wang, Yanhui
    • Bulletin of the Korean Mathematical Society
    • /
    • v.59 no.5
    • /
    • pp.1255-1268
    • /
    • 2022
  • We consider the Schrödinger type operator 𝓛 = (-𝚫n)2 + V2 on the Heisenberg group ℍn, where 𝚫n is the sub-Laplacian and the non-negative potential V belongs to the reverse Hölder class RHs for s ≥ Q/2 and Q ≥ 6. We shall establish the (Lp, Lq) estimates for the Riesz transforms T𝛼,𝛽,j = V2𝛼𝛁jn𝓛-𝛽, j = 0, 1, 2, 3, where 𝛁n is the gradient operator on ℍn, 0 < α ≤ 1-j/4, j/4 < 𝛽 ≤ 1, and 𝛽 - 𝛼 ≥ j/4.

Advanced Treatment for Reuse of Oil Refinery Process Wastewater using UF/RO Processes (UF/RO 공정을 이용한 정유공장 방류수의 재활용을 위한 고도처리)

  • 이광현
    • Membrane Journal
    • /
    • v.10 no.4
    • /
    • pp.220-229
    • /
    • 2000
  • Deionized water and wastewater flux were discussed using module set 1-7 composed of ultrafiltration hollow fiber type modules and reverse osmosis spiral wound type modules. The separation characteristics of ultrafiltration and reverse osmosis membranes were discussed with the variation of applied pressure and temperature. Turbidity and SS were removed effectively from ultrafiltration mem¬brane, and removal efficiency of COD, T-N, and TDS using reverse osmosis membrane was very efficient. Permeate flux increased linearly with the increase of applied pressures and temperature. It was shown that ultrafiltration and reverse osmosis membranes were suitable Lo the advanced treatment and reuse of oil refinery process effluent.

  • PDF

Lp ESTIMATES FOR SCHRÖDINGER TYPE OPERATORS ON THE HEISENBERG GROUP

  • Yu, Liu
    • Journal of the Korean Mathematical Society
    • /
    • v.47 no.2
    • /
    • pp.425-443
    • /
    • 2010
  • We investigate the Schr$\ddot{o}$dinger type operator $H_2\;=\;(-\Delta_{\mathbb{H}^n})^2+V^2$ on the Heisenberg group $\mathbb{H}^n$, where $\Delta_{\mathbb{H}^n}$ is the sublaplacian and the nonnegative potential V belongs to the reverse H$\ddot{o}$lder class $B_q$ for $q\geq\frac{Q}{2}$, where Q is the homogeneous dimension of $\mathbb{H}^n$. We shall establish the estimates of the fundamental solution for the operator $H_2$ and obtain the $L^p$ estimates for the operator $\nabla^4_{\mathbb{H}^n}H^{-1}_2$, where $\nabla_{\mathbb{H}^n}$ is the gradient operator on $\mathbb{H}^n$.

BOUNDS AND INEQUALITIES OF THE MODIFIED LOMMEL FUNCTIONS

  • Mondal, Saiful R.
    • Communications of the Korean Mathematical Society
    • /
    • v.34 no.2
    • /
    • pp.573-583
    • /
    • 2019
  • This article studies the monotonicity, log-convexity of the modified Lommel functions by using its power series and infinite product representation. Some properties for the ratio of the modified Lommel functions with the Lommel function, sinh and cosh are also discussed. As a consequence, $Tur{\acute{a}}n$ type and reverse $Tur{\acute{a}}n$ type inequalities are given. A Rayleigh type function for the Lommel functions are derived and as an application, we obtain the Redheffer-type inequality.

Electron Tunneling Characteristics of PtSi-nSi Junctions according to Temperature Variations (온도변화에 따른 백금 실리사이드-엔 실리콘 접합의 전자 터널링 특성)

  • 장창덕;이정석;이광우;이용재
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 1998.06a
    • /
    • pp.87-91
    • /
    • 1998
  • In this paper, We analyzed the current-voltage characteristics with n-type silicon substrates concentration and temperature variations (Room temperature, 50$^{\circ}C$, 75$^{\circ}C$) in platinum silicide and silicon junction. The electrical parameters of measurement are turn-on voltage, saturation current, ideality factor, barrier height, dynamic resistance in forward bias and reverse breakdown voltage according to variations of junction concentration of substrates and measurement temperature variations. As a result, the forward turn-on voltage, reverse breakdown voltage, barrier height and dynamic resistance were decreased but saturation currents and ideality factor were increased by substrates increased concentration variations in platinum silicide and n-silicon junction. In increased measurement temperature (RT, 50$^{\circ}C$, 75$^{\circ}C$), the extracted electrical parameter values of characteristics were rises by increased temperature variations according to the forward and reverse bias.

  • PDF

ESTIMATES FOR RIESZ TRANSFORMS ASSOCIATED WITH SCHRÖDINGER TYPE OPERATORS

  • Wang, Yueshan
    • Bulletin of the Korean Mathematical Society
    • /
    • v.56 no.5
    • /
    • pp.1117-1127
    • /
    • 2019
  • Let ${\mathcal{L}}_2=(-{\Delta})^2+V^2$ be the $Schr{\ddot{o}}dinger$ type operator, where nonnegative potential V belongs to the reverse $H{\ddot{o}}lder$ class $RH_s$, s > n/2. In this paper, we consider the operator $T_{{\alpha},{\beta}}=V^{2{\alpha}}{\mathcal{L}}^{-{\beta}}_2$ and its conjugate $T^*_{{\alpha},{\beta}}$, where $0<{\alpha}{\leq}{\beta}{\leq}1$. We establish the $(L^p,\;L^q)$-boundedness of operator $T_{{\alpha},{\beta}}$ and $T^*_{{\alpha},{\beta}}$, respectively, we also show that $T_{{\alpha},{\beta}}$ is bounded from Hardy type space $H^1_{L_2}({\mathbb{R}}^n)$ into $L^{p_2}({\mathbb{R}}^n)$ and $T^*_{{\alpha},{\beta}}$ is bounded from $L^{p_1}({\mathbb{R}}^n)$ into BMO type space $BMO_{{\mathcal{L}}1}({\mathbb{R}}^n)$, where $p_1={\frac{n}{4({\beta}-{\alpha})}}$, $p_2={\frac{n}{n-4({\beta}-{\alpha})}}$.

ESTIMATES FOR THE HIGHER ORDER RIESZ TRANSFORMS RELATED TO SCHRÖDINGER TYPE OPERATORS

  • Wang, Yanhui
    • Bulletin of the Korean Mathematical Society
    • /
    • v.58 no.1
    • /
    • pp.235-251
    • /
    • 2021
  • We consider the Schrödinger type operator ��k = (-∆)k+Vk on ℝn(n ≥ 2k + 1), where k = 1, 2 and the nonnegative potential V belongs to the reverse Hölder class RHs with n/2 < s < n. In this paper, we establish the (Lp, Lq)-boundedness of the higher order Riesz transform T��,�� = V2��∇2��-��2 (0 ≤ �� ≤ 1/2 < �� ≤ 1, �� - �� ≥ 1/2) and its adjoint operator T∗��,�� respectively. We show that T��,�� is bounded from Hardy type space $H^1_{\mathcal{L}_2}({\mathbb{R}}_n)$ into Lp2 (ℝn) and T∗��,�� is bounded from ��p1 (ℝn) into BMO type space $BMO_{\mathcal{L}_1}$ (ℝn) when �� - �� > 1/2, where $p_1={\frac{n}{4({\beta}-{\alpha})-2}}$, $p_2={\frac{n}{n-4({\beta}-{\alpha})+2}}$. Moreover, we prove that T��,�� is bounded from $BMO_{\mathcal{L}_1}({\mathbb{R}}_n)$ to itself when �� - �� = 1/2.

Contact Area-Dependent Electron Transport in Au/n-type Ge Schottky Junction

  • Kim, Hogyoung;Lee, Da Hye;Myung, Hye Seon
    • Korean Journal of Materials Research
    • /
    • v.26 no.8
    • /
    • pp.412-416
    • /
    • 2016
  • The electrical properties of Au/n-type Ge Schottky contacts with different contact areas were investigated using current-voltage (I-V) measurements. Analyses of the reverse bias current characteristics showed that the Poole-Frenkel effect became strong with decreasing contact area. The contribution of the perimeter current density to the total current density was found to increase with increasing reverse bias voltage. Fitting of the forward bias I-V characteristics by considering various transport models revealed that the tunneling current is dominant in the low forward bias region. The contributions of both the thermionic emission (TE) and the generation-recombination (GR) currents to the total current were similar regardless of the contact area, indicating that these currents mainly flow through the bulk region. In contrast, the contribution of the tunneling current to the total current increased with decreasing contact area. The largest $E_{00}$ value (related to tunneling probability) for the smallest contact area was associated with higher tunneling effect.