• Proceedings of the Korea Contents Association Conference
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• 2006.05a
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• pp.444-447
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• 2006

We propose software reliability growth model, considering testing effort resource during testing stage of S/W, and compare the time dependent testing effort resource behavior in this paper. We develop the data technology method for the S/W reliability measure. We study in detail between the time elapse and reliability. Also, we determine the optimum release time which meets the target reliability. We decide optimum release time for each condition how the reliability is good before testing after development.

• Proceedings of the Korean Reliability Society Conference
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• 2000.04a
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• pp.177-183
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• 2000

As monitoring, testing, and measuring techniques develop, predictive control of components and complete systems have become more practical and affordable. In this paper we develop a statistics-based approach assuming nonlinear degradation paths and time-dependent standard deviation. This approach can be extended to provide reliability estimates and limit value determination in the censoring case fur predictive maintenance policy.

• International Journal of Reliability and Applications
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• v.6 no.2
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• pp.117-133
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• 2005

Estimations of the parameters included in a two-component system are derived based on masked system life test data, when the probability of masking depends upon the exact cause of system failure. Also estimations of reliability for the individual components at a specified mission time are derived. Maximum likelihood and Bayes methods are used to derive these estimators. The problem is explained on a series system consisting of two independent components each of which has a Pareto distributed lifetime. Further we present numerical studies using simulation.

• Advances in aircraft and spacecraft science
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• v.9 no.3
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• pp.263-278
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• 2022

The time-varying structural reliability of an aeroelastic launch vehicle subjected to stochastic parameters is investigated. The launch vehicle structure is under the combined action of several stochastic loads that include aerodynamics, thrust as well as internal combustion pressure. The launch vehicle's main body structural flexibility is modeled via the normal mode shapes of a free-free Euler beam, where the aerodynamic loadings on the vehicle are due to force on each incremental section of the vehicle. The rigid and elastic coupled nonlinear equations of motion are derived following the Lagrangian approach that results in a complete aeroelastic simulation for the prediction of the instantaneous launch vehicle rigid-body motion as well as the body elastic deformations. Reliability analysis has been performed based on two distinct limit state functions, defined as the maximum launch vehicle tip elastic deformation and also the maximum allowable stress occurring along the launch vehicle total length. In this fashion, the time-dependent reliability problem can be converted into an equivalent time-invariant reliability problem. Subsequently, the first-order reliability method, as well as the Monte Carlo simulation schemes, are employed to determine and verify the aeroelastic launch vehicle dynamic failure probability for a given flight time.

• Journal of Korean Society for Quality Management
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• v.24 no.3
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• pp.19-30
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• 1996

We treat problems of estimating reliability R(t) = P[Y(t) ＞ X(t)] in the time dependent strength-stress model in which a unit of stress X(t) is subjected to environmental strength Y(t) at time t. In this paper we introduce a special model of R(t) with fixed strength and unaccumulated stress case, and propose a Mann-Whitney-Wilcoxon type estimator of R(t).

• Proceedings of the Korean Reliability Society Conference
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• 2001.06a
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• pp.273-275
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• 2001

With the continuous advancement in electronics technology, especially the usage of new materials and the introduction of new and immature manufacturing process, stress and time dependent types of physical, chemical and mechanical imperfections are introduced to the electronic hardware. These types of imperfections are called flaws. A reliability stress screening process(RSS) is a process which involves the application of operational and/or environmental stress to electronic hardware on a 100% basis, for the purpose of precipitating inherent, as well as process-induced, flaws while neither destroying nor degrading in a significant way the hardware being stressed.

• Journal of Information Technology Applications and Management
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• v.12 no.2
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• pp.1-13
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• 2005

This paper proposes a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase after developing it. The time-dependent behavior of testing effort expenditures is described by a Logistic curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, This paper discusses the relations between testing time and reliability and between duration following failure fixing and reliability are studied. SRGM in several literatures has used the exponential curve, Railleigh curve or Weibull curve as an amount of testing effort during software testing phase. However, it might not be appropriate to represent the consumption curve for testing effort by one of already proposed curves in some software development environments. Therefore, this paper shows that a logistic testing-effort function can be adequately expressed as a software development/testing effort curve and that it gives a good predictive capability based on real failure data.

• Journal of Korea Society of Industrial Information Systems
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• v.17 no.3
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• pp.27-34
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• 2012

This paper presents the impact of time dependent dielectric breakdown (TDDB, also called as gate oxide breakdown) failure on nanoscale digital CMOS Circuits. Recently, TDDB for ultra-thin gate oxides has been considered as one of the critical reliability issues which can lead to performance degradation or logic failures in nanoscale CMOS devices. Also, leakage power in the standby mode can be increased significantly. In this paper, TDDB aging effects on large CMOS digital circuits in the 45nm technology are analyzed. Simulation results show that TDDB effect on MOSFET circuits can result in more significant increase of power consumption compared to delay increase.

• Convergence Security Journal
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• v.13 no.1
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• pp.3-10
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• 2013

In this paper, reliability software model considering fault detection rate based on observations from the process of software product testing was studied. Adding new fault probability using the S-shaped distribution model that is widely used in the field of reliability problems presented. When correcting or modifying the software, finite failure non-homogeneous Poisson process model was used. In a software failure data analysis considering the time-dependent fault detection rate, the parameters estimation using maximum likelihood estimation of failure time data and reliability make out.

• The KIPS Transactions:PartD
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• v.8D no.6
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• pp.835-842
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• 2001

We propose a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase. The time-dependent behavior of testing effort expenditures is described by a Weibull curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, we discuss the relations between testing time and reliability and between duration following failure fixing and reliability are studied in this paper. The release time making the testing cost to be minimum is determined through studying the cost for each condition. Also, the release time is determined depending on the conditions of the specified reliability. The optimum release time is determined by simultaneously studying optimum release time issue that determines both the cost related time and the specified reliability related time.