• Title/Summary/Keyword: pulse I-V

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Fabrication and Characterization of 5000V class 4-inch Light Triggered Thyristor (4인치 광점호 Thyristor의 제조 및 특성 분석에 대한 연구)

  • Cho, Doohyung;Won, Jongil;Yoo, Seongwook;Ko, Sangchoon;Park, Jongmoon;Lee, Byungha;Bae, Youngseok;Koo, Insu;Park, Kunsik
    • Proceedings of the KIPE Conference
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    • 2019.07a
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    • pp.230-232
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    • 2019
  • Light Triggerd Thyristor (LTT)는 HVDC 및 산업용 스위치 등에 사용되는 대전력 반도체소자이다. 일반적인 Thyristor가 전기적 신호에 의해 trigger 되는 것과는 다르게 LTT는 광신호에 의해 동작하는 소자이다. 본 논문에서는 5,000V, 2,200A 급의 4인치 LTT 소자의 제작 및 전기적인 특성평가 결과를 기술하였다. 4인치 LTT의 구조적인 특징은 전면부 중앙에 광신호가 주입되는 수광부가 위치해 있으며 입력 전류 증폭을 위한 4-단계 증폭 게이트 (gate) 구조를 가지도록 설계하였다. $400{\Omega}{\cdot}cm$ 비저항을 갖는 1mm 두께의 n-형 실리콘 웨이퍼에 boron 이온주입과 열처리 공정으로 약 $30{\mu}m$ 깊이의 p-base를 형성하였으며, 고내압 저지를 위한 edge termination은 VLD (variable lateral doping) 기술을 적용하였다. 제작된 4인치 LTT는 6,500 V의 순방향 항복전압 ($V_{DRM}$) 특성을 나타내었으며, 100V의 어노드전압 ($V_A$)과 20 mA의 게이트전류 ($I_G$)에 의하여 thyristor가 trigger 됨을 확인하였다. 제작한 LTT 소자는 disk형 press-pack 패키지를 진행한 후, LTT의 수광부에 $10{\mu}s$, 50 mW의 900 nm 광 펄스를 조사하여 전류 특성을 평가하였다. LTT 패키지 샘플에 60 Hz 주파수의 광 펄스를 조사한 경우 2,460 A의 순방향 평균전류 ($I_T$)와 $336A/{\mu}s$의 반복전류상승기울기 (repetitive di/dt)에 안정적으로 동작함을 확인하였다. 또한, 펄스 전류 시험의 경우 61.6 kA의 최대 통전 전류 (ITSM, surge current)와 $1,050A/{\mu}s$의 펄스전류 상승 기울기 (di/dt of on-state pulse current)에도 LTT의 손상 없이 동작함을 확인하였다.

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A Study on Optimum Spark Plasma Sintering Conditions for Conductive SiC-ZrB2 Composites

  • Lee, Jung-Hoon;Ju, Jin-Young;Kim, Cheol-Ho;Shin, Yong-Deok
    • Journal of Electrical Engineering and Technology
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    • v.6 no.4
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    • pp.543-550
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    • 2011
  • Conductive SiC-$ZrB_2$ composites were produced by subjecting a 40:60 (vol%) mixture of zirconium diboride (ZrB2) powder and ${\beta}$-silicon carbide (SiC) matrix to spark plasma sintering (SPS). Sintering was carried out for 5 min in an argon atmosphere at a uniaxial pressure and temperature of 50 MPa and $1500^{\circ}C$, respectively. The composite sintered at a heating speed of $25^{\circ}C$/min and an on/off pulse sequence of 12:2 was denoted as SZ12L. Composites SZ12H, SZ48H, and SZ10H were obtained by sintering at a heating speed of $100^{\circ}C$/min and at on/off pulse sequences of 12:2, 48:8, and 10:9, respectively. The physical, electrical, and mechanical properties of the SiC-$ZrB_2$ composites were examined and thermal image analysis of the composites was performed. The apparent porosities of SZ12L, SZ12H, SZ48H, and SZ10H were 13.35%, 0.60%, 12.28%, and 9.75%, respectively. At room temperature, SZ12L had the lowest flexural strength (286.90 MPa), whereas SZ12H had the highest flexural strength (1011.34 MPa). Between room temperature and $500^{\circ}C$, the SiC-$ZrB_2$ composites had a positive temperature coefficient of resistance (PTCR) and linear V-I characteristics. SZ12H had the lowest PTCR and highest electrical resistivity among all the composites. The optimum SPS conditions for the production of energy-friendly SiC-$ZrB_2$ composites are as follows: 1) an argon atmosphere, 2) a constant pressure of 50 MPa throughout the sintering process, 3) an on/off pulse sequence of 12:2 (pulse duration: 2.78 ms), and 4) a final sintering temperature of $1500^{\circ}C$ at a speed of $100^{\circ}C$/min and sintering for 5 min at $1500^{\circ}C$.

A Study on PCFBD-MPC in 8kbps (8kbps에 있어서 PCFBD-MPC에 관한 연구)

  • Lee, See-woo
    • Journal of Internet Computing and Services
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    • v.18 no.5
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    • pp.17-22
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    • 2017
  • In a MPC coding using excitation source of voiced and unvoiced, it would be a distortion of speech waveform. This is caused by normalization of synthesis speech waveform of voiced in the process of restoration the multi-pulses of representation section. This paper present PCFBD-MPC( Position Compensation Frequency Band Division-Multi Pulse Coding ) used V/UV/S( Voiced / Unvoiced / Silence ) switching, position compensation in a multi-pulses each pitch interval and Unvoiced approximate-synthesis by using specific frequency in order to reduce distortion of synthesis waveform. Also, I was implemented that the PCFBD-MPC( Position Compensation Frequency Band Division-Multi Pulse Coding ) system and evaluate the SNRseg of PCFBD-MPC in coding condition of 8kbps. As a result, SNRseg of PCFBD-MPC was 13.4dB for female voice and 13.8dB for male voice respectively. In the future, I will study the evaluation of the sound quality of 8kbps speech coding method that simultaneously compensation the amplitude and position of multi-pulse source. These methods are expected to be applied to a method of speech coding using sound source in a low bit rate such as a cellular phone or a smart phone.

Analysis and Design of a PFC AC-DC Converter with Electrical Isolation

  • Lin, Chia-Ching;Yang, Lung-Sheng;Zheng, Ren-Jun
    • Journal of Power Electronics
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    • v.14 no.5
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    • pp.874-881
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    • 2014
  • This study presents a single-phase power factor correction AC-DC converter that operates in discontinuous conduction mode. This converter uses the pulse-width modulation technique to achieve almost unity power factor and low total harmonic distortion of input current for universal input voltage $90V_{rms}$ to $264V_{rms}$) applications. The converter has a simple structure and electrical isolation. The magnetizing-inductor energy of the transformer can be recycled to the output without an additional third winding. The steady-state analysis of voltage gain and boundary operating conditions are discussed in detail. Finally, experimental results are shown to verify the performance of the proposed converter.

Determination of Memory Trap Distribution in Charge Trap Type SONOSFET NVSM Cells Using Single Junction Charge Pumping Method (Single Junction Charge Pumping 방법을 이용한 전하 트랩 형 SONOSFET NVSM 셀의 기억 트랩 분포 결정)

  • 양전우;흥순혁;박희정;김선주;서광열
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.11a
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    • pp.453-456
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    • 1999
  • The Si-SiO$_2$interface trap and nitride bulk trap distribution of SONOSFET(polysilicon-oxide-nitride-oxide-semiconductor)NVSM(nonvolatile semiconductor memory) cell were investigated by single charge pumping method. The used device was fabricated by 0.35 7m standard logic fabrication including the ONO cell process. This ONO dielectric thickness is tunnel oxide 24 $\AA$, nitride 74 $\AA$, blocking oxide 25 $\AA$, respectively. Keeping the pulse base level in accumulation and pulsing the surface into inversion with increasing amplitudes, the charge pumping current flow from the single junction. Using the obtained I$_{cp}$-V$_{h}$ curve, the local V$_{t}$ distribution, doping concentration, lateral interface trap distribution and lateral memory trap distribution were extracted. The maximum N$_{it}$($\chi$) of 1.62$\times$10$^{19}$ /cm$^2$were determined.mined.d.

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High Performance ESD/Surge Protection Capability of Bidirectional Flip Chip Transient Voltage Suppression Diodes

  • Pharkphoumy, Sakhone;Khurelbaatar, Zagarzusem;Janardhanam, Valliedu;Choi, Chel-Jong;Shim, Kyu-Hwan;Daoheung, Daoheung;Bouangeun, Bouangeun;Choi, Sang-Sik;Cho, Deok-Ho
    • Transactions on Electrical and Electronic Materials
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    • v.17 no.4
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    • pp.196-200
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    • 2016
  • We have developed new electrostatic discharge (ESD) protection devices with, bidirectional flip chip transient voltage suppression. The devices differ in their epitaxial (epi) layers, which were grown by reduced pressure chemical vapor deposition (RPCVD). Their ESD properties were characterized using current-voltage (I-V), capacitance-voltage (C-V) measurement, and ESD analysis, including IEC61000-4-2, surge, and transmission line pulse (TLP) methods. Two BD-FCTVS diodes consisting of either a thick (12 μm) or thin (6 μm), n-Si epi layer showed the same reverse voltage of 8 V, very small reverse current level, and symmetric I-V and C-V curves. The damage found near the corner of the metal pads indicates that the size and shape of the radius governs their failure modes. The BD-FCTVS device made with a thin n- epi layer showed better performance than that made with a thick one in terms of enhancement of the features of ESD robustness, reliability, and protection capability. Therefore, this works confirms that the optimization of device parameters in conjunction with the doping concentration and thickness of epi layers be used to achieve high performance ESD properties.

Ferroelectric Properties $\textrm{SrBi}_{2}\textrm{Ta}_{2}\textrm{O}_{9}$ Thin Films Deposited by RF Magnetron Sputtering Technique (RF magnetron sputtering법에 의해 제조된 $\textrm{SrBi}_{2}\textrm{Ta}_{2}\textrm{O}_{9}$박막의 강유전 특성에 관한 연구)

  • Park, Sang-Sik;Yang, Cheol-Hun;Yun, Sun-Gil
    • Korean Journal of Materials Research
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    • v.7 no.6
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    • pp.505-509
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    • 1997
  • FRAM(Ferroelectric Random Access memory)에의 응용을 위해 rf magnetron sputtering법을 이용하여 SrB $i_{2}$T $a_{2}$ $O_{9}$(SBT)박막을 증착하였다. 사용된 기판은 Pt/Ti/Si $o_{2}$Si이었으며 50$0^{\circ}C$에서 증착한 후 80$0^{\circ}C$의 산소 분위기 하에서 1시간 동안 열처리하였다. 증착시 증착 압력을 변화시켜 가면서 이에 따른 특성의 변화를 고찰하였다. 박막내의 Bi와 Sr의 부족을 보상하기 위해 20mole%의 Bi $O_{2}$와 30mole%의 SrC $O_{3}$를 과잉으로 넣어 타겟을 제조후 사용하였고 박막들의 두께는 300nm의 두께를 가지며 증착압력에 따라 다른 미세 구조르 보였다. 10mtorr에서 증착한 박막의 조성은 S $r_{0.6}$B $i_{3.8}$Ta/ sub 2.0/ $O_{9.0}$이었다. 이 SBT 박막의 잔류 분극(2 $P_{r}$)과 보전계(2 $E_{c}$)값은 각각 인가 전압 5V에서 18.5 $\mu%C/$\textrm{cm}^2$과 150kV/cm이었고, signal/noise비는 3V에서 4.6을 나타내었다. 5V의 bipolar pulse하에서 $10^{10}$cycle까지 피로 현상이 나타나지 않았으며, 누설 전류 밀도는 133kV/cm에서 약 1x$10^{-7A}$$\textrm{cm}^2$의 값을 보였다.을 보였다.

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Finer Silver Nano-Particle Producing in Water Utilizing a Dielectric Bed (유전체 층을 이용한 수중 은 나노입자의 소형화 제조)

  • Moon, Jae-Duk
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.59 no.12
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    • pp.2250-2255
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    • 2010
  • An fine silver particle has a variety of uses, such as in killing micrograms and as catalysts. Many techniques have been used for the production of the fine particles. Faraday cell, consisting of two silver electrodes in an electrolyte, is unique, but it is hard to get a very fine particle by this method. A finer silver nano-particle producing cell, utilizing a dielectric bed as a lower electric current and higher field controlling means, has been proposed and investigated. The I-V characteristics of the cell and effect of the dielectric bed on the producing finer silver nano-particles have been investigated. The I-V characteristics of the cell with the dielectric bed were different from that of the same system without the bed, due to the increased cell resistance and elevated electric field intensity. It is found that the proposed cell with the dielectric bed can produce finer silver nano-particles effectively, which, however, can be used as one of effective fine silver nano-particle producing means.

Analysis of the ESD-Induced Degradation Behavior of Oxide VCSELs Using an Equivalent Circuit Model (ESD에 따른 산화형 VCSEL 열화 과정의 등가회로 모델을 이용한 분석)

  • Kim, Tae-Yong;Kim, Sang-Bae
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.3
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    • pp.6-21
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    • 2008
  • We have investigated the effect of the forward and reverse ESD pulse accumulation on the development of the oxide VCSEL's electrical and optical characteristics. The forward ESD-induced degradation is complicated, showing three degradation phases with increasing ESD voltage while the reverse ESD-induced degradation is divided by a sudden distinctive change in elecorl-optical characteristics. By comparing the measured L-I-V characteristics and their derivatives with the fitted characteristics using an equivalent circuit model as well as the large signal circuit model, the development of the oxide VCSEL's electro-optical characteristics under forward and reverse ESD conditions has been fully understood.

Analysis of Solar Simulator's Uncertainty Factor for Photovoltaic Module's I-V curve test (PV모듈의 I-V특성 시험을 위한 Solar Simulator의 측정불확도 요인 분석)

  • Kang, Gi-Hwan;Park, Chi-Hong;Kim, Kyung-Soo;Yu, Gwon-Jong;Ahn, Hyung-Keun;Han, Deuk-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.5-7
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    • 2006
  • In this paper, we analyzed the elements of measurement uncertainty on electrical performance test which are the most important things in photovoltaic module performance test. Repeating the performance test by 6 men, the measurement uncertainty could be calculated. In this experiment, Solar Simulator (A-Class pulse type) used for domestic certificate test of PV module is Pasan IIIb (Balval, Switzerland). The possible elements of the measurement uncertain that could effect electrical performance test of PV module are reference cell, spectrum correction, error from measurement repetition, test condition, stability and uniformity of artificial solar simulator. To find the measurement uncertainty, 6 men repeated the test by 10 times. And the results were that numerical average value was 124.44W and measurement uncertainty was $124.44W{\pm}0.75W$ with 95% confidence level for 125W PV module.

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