• The Korean Journal of Applied Statistics
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• v.29 no.2
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• pp.301-308
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• 2016

The process capability index is used to determine whether a production process is capable of producing items within a specified tolerance. Some process capability indices $C_p$, $C_{pk}$ and $C_{pm}$ have been of particular interest as useful management tools for tracking process performance. Most evaluations on process capability indices focus on statistical estimation and test of hypothesis. It is necessary to investigate their asymptotic correlationship among basic estimators ${\hat{C}}_p$, ${\hat{C}}_{pk}$ and ${\hat{C}}_{pm}$ of process capability indices $C_p$, $C_{pk}$ and $C_{pm}$. In this paper, we study their asymptotic correlationship for three process capability indices ${\hat{C}}_p$, ${\hat{C}}_{pk}$ and ${\hat{C}}_{pm}$ under bivariate normal distribution BN(${\mu}_x,{\mu}_y,{\sigma}^2_x,{\sigma}^2_y,{\rho}$). With some nonnormal processes, the asymptotic correlation coefficient of any two respective process capability index estimators could be established.

• Journal of the Korean Statistical Society
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• v.26 no.4
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• pp.543-554
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• 1997

A family of some capability indices { $C_{p}$(.alpha.,.beta.); .alpha..geq.0, .beta..geq.0}, containing the indices $C_{p}$, $C_{{pk}}$, $C_{{pm}}$, and $C_{{pmk}}$, has been defined by Vannman(1993) for the case of two-sided specification interval. By varying the parameters of the family various capability indices with suitable properties are obtained. We derive tha asymptotic distribution of the family { $C_{p}$(.alpha.,.beta.); .alpha..geq.0,.beta..geq.0} under general proper conditions. It is also shown that the bootstrap approximation to the distribution of the estimator $C_{p}$(.alpha., .beta.) is vaild for almost all sample sequences. These asymptotic distributions would be used in constructing some bootstrap confidence intervals.tervals.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.34 no.4
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• pp.114-119
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• 2011

Process capability indices (PCls) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index $SC_{pm}$ (m) which is the minimum value of the location PCls.

• Journal of the Korea Safety Management & Science
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• v.3 no.3
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• pp.175-190
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• 2001

We propose, a new process capability index $C_{psk}$(WV) applying the weighted variance control charting method for non-normally distributed. The main idea of the weighted variance method(WVM) is to divide a skewed or asymmetric distribution into two normal distributions from its mean to create two new distributions which have the same mean but different standard deviations. In this paper we propose an example, a distributions generated from the Johnson family of distributions, to demonstrate how the weighted variance-based process capability indices perform in comparison with another two non-normal methods, namely the Clements and the Wright methods. This example shows that the weighted valiance-based indices are more consistent than the other two methods in terms of sensitivity to departure to the process mean/median from the target value for non-normal processes. Second method show using the percentage nonconforming by the Pearson, Johnson and Burr systems. This example shows a little difference between the Pearson system and Burr system, but Johnson system underestimated than the two systems for process capability.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.28 no.4
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• pp.48-54
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• 2005

Recently, a couple of process capability indices are used to evaluate that the outputs of the process satisfy the specifications. An assumption of those indices is that the specifications of the characteristics are given single constant value. The display panel is a highly precise product and all the specifications of measure points are designed by their locations in the panel. So it is very difficult to locate the measurement facility to the exact position. In this paper, we propose a new process capability index in case of multi specifications and unfixable objects.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.38 no.1
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• pp.182-187
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• 2015

Process capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance to meet the specification limits on quality characteristics. The most of existing PCIs are concerned with a single variable. But, in many cases, people want to express a integrated PCI which includes a couple of sequential processes. In this paper, we analyzed the characteristics of system PCIs such as ${\bar{Cp}}(f)$, $SC_{pk}$, $SC_{psk}$, $C^T_{psk}(m)$ and $SC_{pm}(m)$.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.24 no.63
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• pp.45-54
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• 2001

The process capability indices have been widely used in manufacturing industries to provide numerical measures of process potential and performance. This study is concerned with process controls and adjustments by incapability index $C_{pp}$ and its sub-indices. A monitoring for $\^{C}_{pp}$ would provide a convenient way to monitor changes on process capability after statistical control is established, since $C_{pp}$ simultaneously measures process variability and centering. Further, we can separate charting of process location and variability by sub-indices of $C_{pp}$, ($C_{ia}$, $C_{ip}$), without returning to $\={x}$-R chart, even though an out-of-control signals on $\^{C}_{pp}$ control chart is found.

• Journal of Industrial Technology
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• v.28 no.A
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• pp.149-153
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• 2008

$C_p$ and other process capability indices are used extensively in industry, However, They are inadequate and widely misused. In a practical application, process average ${\mu}$ is almost always drifted by various assignable causes in process. And control charts will not detect these shifts in process average. In this study, incorporating these undetected shifts, a new capability analysis method is introduced.

• Journal of Korean Society for Quality Management
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• v.27 no.1
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• pp.18-34
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• 1999

This paper is a brief review of the different procedures that are available for fitting theoretical distributions to data. The use of each technique Is illustrated by reference to a distribution system which including the Pearson, Johnson and Burr functions. These functions can be used to calculate percent out of specification. Therefore, in this paper a new method for estimating a measure of process capability for Gamma distributed variable data proposed using the percentage nonconforming. Process capability indices combines with the percentage nonconforming Information can be used to evaluate more accurately process capability.

• Journal of Korean Institute of Industrial Engineers
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• v.29 no.2
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• pp.114-125
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• 2003

This paper proposes multivariate process capability indices (PCIs) for skewed populations using $T^2$rand modified process region approaches. The proposed methods are based on the multivariate version of a weighted standard deviation method which adjusts the variance-covariance matrix of quality characteristics and approximates the probability density function using several multivariate Journal distributions with the adjusted variance-covariance matrix. Performance of the proposed PCIs is investigated using Monte Carlo simulation, and finite sample properties of the estimators are studied by means of relative bias and mean square error.