The Sensitivity of ${\bar{X}}$ Control Chart and Process Capability Analysis

관리도의 민감도와 공정능력 분석

$C_p$ and other process capability indices are used extensively in industry, However, They are inadequate and widely misused. In a practical application, process average ${\mu}$ is almost always drifted by various assignable causes in process. And control charts will not detect these shifts in process average. In this study, incorporating these undetected shifts, a new capability analysis method is introduced.