• 응용통계연구
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• 제29권2호
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• pp.301-308
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• 2016

공정이 특정 허용범위 내에서 생산을 할 수 있는 지 여부를 결정하는 데 공정능력지수가 사용된다. 공정능력지수 $C_p$, $C_{pk}$ 그리고 $C_{pm}$ 등은 공정의 현황을 추적할 수 있는 활용성이 높은 관리도구로서 특별한 관심을 가진다. 대부분 공정능력지수에 대한 계산결과는 통계적 추정과 가설검정에 초점을 맞춘다. 따라서 $C_p$, $C_{pk}$ 그리고 $C_{pm}$의 추정치 ${\hat{C}}_p$, ${\hat{C}}_{pk}$ 그리고 ${\hat{C}}_{pm}$ 사이의 점근적 성질을 조사하는 것이 의미가 있을 것이다. 이 논문에서는 BN(${\mu}_x,{\mu}_y,{\sigma}^2_x,{\sigma}^2_y,{\rho}$) 하에서 세 가지 추정치 ${\hat{C}}_p$, ${\hat{C}}_{pk}$ 그리고 ${\hat{C}}_{pm}$ 간의 점근적 상관관계를 연구한다. 비정규성을 가진 공정에서는 두 종류의 공정능력지수 간에 상관관계를 정립할 수 있을 것이다.

• Journal of the Korean Statistical Society
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• 제26권4호
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• pp.543-554
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• 1997

A family of some capability indices { $C_{p}$(.alpha.,.beta.); .alpha..geq.0, .beta..geq.0}, containing the indices $C_{p}$, $C_{{pk}}$, $C_{{pm}}$, and $C_{{pmk}}$, has been defined by Vannman(1993) for the case of two-sided specification interval. By varying the parameters of the family various capability indices with suitable properties are obtained. We derive tha asymptotic distribution of the family { $C_{p}$(.alpha.,.beta.); .alpha..geq.0,.beta..geq.0} under general proper conditions. It is also shown that the bootstrap approximation to the distribution of the estimator $C_{p}$(.alpha., .beta.) is vaild for almost all sample sequences. These asymptotic distributions would be used in constructing some bootstrap confidence intervals.tervals.

• 산업경영시스템학회지
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• 제34권4호
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• pp.114-119
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• 2011

Process capability indices (PCls) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index $SC_{pm}$ (m) which is the minimum value of the location PCls.

• 대한안전경영과학회지
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• 제3권3호
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• pp.175-190
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• 2001

We propose, a new process capability index $C_{psk}$(WV) applying the weighted variance control charting method for non-normally distributed. The main idea of the weighted variance method(WVM) is to divide a skewed or asymmetric distribution into two normal distributions from its mean to create two new distributions which have the same mean but different standard deviations. In this paper we propose an example, a distributions generated from the Johnson family of distributions, to demonstrate how the weighted variance-based process capability indices perform in comparison with another two non-normal methods, namely the Clements and the Wright methods. This example shows that the weighted valiance-based indices are more consistent than the other two methods in terms of sensitivity to departure to the process mean/median from the target value for non-normal processes. Second method show using the percentage nonconforming by the Pearson, Johnson and Burr systems. This example shows a little difference between the Pearson system and Burr system, but Johnson system underestimated than the two systems for process capability.

• 산업경영시스템학회지
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• 제28권4호
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• pp.48-54
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• 2005

Recently, a couple of process capability indices are used to evaluate that the outputs of the process satisfy the specifications. An assumption of those indices is that the specifications of the characteristics are given single constant value. The display panel is a highly precise product and all the specifications of measure points are designed by their locations in the panel. So it is very difficult to locate the measurement facility to the exact position. In this paper, we propose a new process capability index in case of multi specifications and unfixable objects.

• 산업경영시스템학회지
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• 제38권1호
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• pp.182-187
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• 2015

Process capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance to meet the specification limits on quality characteristics. The most of existing PCIs are concerned with a single variable. But, in many cases, people want to express a integrated PCI which includes a couple of sequential processes. In this paper, we analyzed the characteristics of system PCIs such as ${\bar{Cp}}(f)$, $SC_{pk}$, $SC_{psk}$, $C^T_{psk}(m)$ and $SC_{pm}(m)$.

• 산업경영시스템학회지
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• 제24권63호
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• pp.45-54
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• 2001

The process capability indices have been widely used in manufacturing industries to provide numerical measures of process potential and performance. This study is concerned with process controls and adjustments by incapability index $C_{pp}$ and its sub-indices. A monitoring for $\^{C}_{pp}$ would provide a convenient way to monitor changes on process capability after statistical control is established, since $C_{pp}$ simultaneously measures process variability and centering. Further, we can separate charting of process location and variability by sub-indices of $C_{pp}$, ($C_{ia}$, $C_{ip}$), without returning to $\={x}$-R chart, even though an out-of-control signals on $\^{C}_{pp}$ control chart is found.

• 산업기술연구
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• 제28권A호
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• pp.149-153
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• 2008

$C_p$ and other process capability indices are used extensively in industry, However, They are inadequate and widely misused. In a practical application, process average ${\mu}$ is almost always drifted by various assignable causes in process. And control charts will not detect these shifts in process average. In this study, incorporating these undetected shifts, a new capability analysis method is introduced.

• 품질경영학회지
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• 제27권1호
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• pp.18-34
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• 1999

This paper is a brief review of the different procedures that are available for fitting theoretical distributions to data. The use of each technique Is illustrated by reference to a distribution system which including the Pearson, Johnson and Burr functions. These functions can be used to calculate percent out of specification. Therefore, in this paper a new method for estimating a measure of process capability for Gamma distributed variable data proposed using the percentage nonconforming. Process capability indices combines with the percentage nonconforming Information can be used to evaluate more accurately process capability.

• 대한산업공학회지
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• 제29권2호
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• pp.114-125
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• 2003

This paper proposes multivariate process capability indices (PCIs) for skewed populations using $T^2$rand modified process region approaches. The proposed methods are based on the multivariate version of a weighted standard deviation method which adjusts the variance-covariance matrix of quality characteristics and approximates the probability density function using several multivariate Journal distributions with the adjusted variance-covariance matrix. Performance of the proposed PCIs is investigated using Monte Carlo simulation, and finite sample properties of the estimators are studied by means of relative bias and mean square error.