• Title/Summary/Keyword: polarization switching

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Reconfigurable Polarization Patch Antenna with Y-Shaped Feed (Y형태의 급전 구조를 이용한 편파 변환 재구성 패치 안테나)

  • Lee, Da-Ae;Sung, Youngje
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.25 no.1
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    • pp.1-9
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    • 2014
  • In this paper, a reconfigurable polarization patch antenna that uses a Y-shaped feed is proposed. The proposed antenna consists of a square patch, a Y-shaped feeding structure, a PIN diode, and a bias circuit for diode operation. The structural symmetry/asymmetry of the feeding structure is determined by the on/off operation of the PIN diode that inserted into the side of one of the lines of the Y-shaped feeding structure. For the proposed reconfigurable antenna, the two microstrip lines of the feeding structure have the same length when the PIN diode operates in the on state, and the antenna exhibits linear polarization(LP). On the other hand, when the PIN diode operates in the off state, the length of one side line of the feeding structure is relatively shorter than that of the other line. Therefore, the antenna exhibits circular polarization(CP). From the measurement results, it is found that the proposed antenna exhibits good impedance matching and axial ratio. In addition, polarization switching can be easily achieved in the same operating band.

Effect of Annealing Temperature on the Properties of Sputtered Bi3.25La0.75Ti3O12 Thin Films

  • Kang, Hyunil;Song, Joontae
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.3
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    • pp.130-132
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    • 2013
  • $Bi_{3.25}La_{0.75}Ti_3O_{12}$(BLT) thin films were prepared on the Pt(150 nm)/Ti(50 nm)/$SiO_2$/Si substrate using the rf magnetron sputtering method. The BLT thin films were annealed at temperatures ranging from $600^{\circ}C$ to $750^{\circ}C$ using the rapid thermal annealing. The structure and surface morphology of the thin films were characterized by x-ray diffraction and field emission scanning electron microscopy. The hysteresis loop of the BLT thin films showed that the remanent polarization (2Pr) of the film annealed at $700^{\circ}C$ was 10.92 ${\mu}C/cm^2$. The fatigue characteristic of the BLT thin film annealed at $700^{\circ}C$ was shown change polarization up to $1.2{\times}10^9$ switching cycles. We confirmed the excellent remnant polarization (Pr) and fatigue properties compared with other fabrication methods and suggested a good method for BLT thin films fabrications.

Study on Birefringence Effect Of Single-Mode Fiber on Output Spectra of High-Order Fiber Comb Filter Based on Polarization-Diversity Loop Configuration (단일 모드 광섬유의 복굴절이 편광상이 배치구조 기반 고차 광섬유 빗살 필터의 출력 스펙트럼에 미치는 영향에 대한 고찰)

  • Kim, Young-Ho;Lee, Yong-Wook
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.26 no.6
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    • pp.8-15
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    • 2012
  • In this paper, we investigated possible optical parameters causing deviation of experimentally observed output spectra from theoretically predicted results in a high-order fiber comb filter based on a polarization-diversity loop configuration. They include wavelength dependency of half-wave plates (HWPs) inserted in the filter for wavelength switching and the modal birefringence of single-mode fibers (SMFs) with which optical components comprising the filter are connected. In order to consider the effect of the modal birefringence of the SMF on a filter performance, it is modeled as a low birefringence fiber with an arbitrary orientation angle and birefringence. It is found from the simulation results that the modal birefringence of SMFs strongly affects the spectral characteristics of the filter and decreases the extinction ratio of the filter, compared with the wavelength dependency of HWPs. In particular, it is also confirmed that the spectral deviation and asymmetric distortions of side-lobes in narrow band transmission spectra result mainly from the modal birefringence of SMFs.

Fatigue Characteristics of PZT Thin Films Deposited by ECR-PECVD

  • Chung, Su-Ock;Lee, Won-Jong
    • Transactions on Electrical and Electronic Materials
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    • v.6 no.4
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    • pp.177-185
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    • 2005
  • Fatigue characteristics of lead zirconate titanate (PZT) films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition (ECR-PECVD) were investigated. The fatigue characteristics were investigated with respect to PZT film thickness, domain structure, fatigue pulse height, temperature, electrode materials and electrode configurations. The used top and bottom electrode materials were Pt and $RuO_2$. In the fatigue characteristics with fatigue pulse height and PZT film thickness, the fatigue rates are independent of the applied fatigue pulse height at the electric field regions to saturate the P-E hysteresis and polarization $(P^*,\;P^A)$ characteristics. The unipolar and bipolar fatigue characteristics of PZT capacitors with four different electrode configurations $(Pt//Pt,\;Pt//RuO_2,\;RuO_2//Pt,\;and\;RuO_2//RuO_2)$ were also investigated. The polarization-shifts during the unipolar fatigue and the temperature dependence of fatigue rate suggest that the migration of charged defects should not be expected in our CVD-PZT films. It seems that the polarization degradations are attributed to the formation of charged defects only at the Pt/PZT interface during the domain switching. The charged defects pin the domain wall at the vicinity of Pt/PZT interface. When the top and bottom electrode configurations are of asymmetric $(Pt//RuO_2,\;RuO_2//Pt)$, the internal fields can be generated by the difference of charged defect densities between top and bottom interfaces.

A Very Short Vertical Directional Coupler Switch with Polarization Independent Very High Extinction Ratios (편광에 관계없이 매우 높은 소멸비와 짧은 길이를 가지는 수직 방향성 결합기 스위치)

  • Jung Byung-Min;Kim Boo-Gyoun
    • Korean Journal of Optics and Photonics
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    • v.15 no.6
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    • pp.503-510
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    • 2004
  • We propose a novel vertical directional coupler switch using a vertical directional coupler with polarization independent coupling lengths employing the doublesided deep-ridge waveguide structure. This switch is composed of a switching operation induced section with symmetric structures and an extinction ratio enhanced section with asymmetric structures. We present design methods and examples for this switch with very short lengths and very high extinction ratios larger than 30 dB for both TE and TM modes in cases of both cross and bar states.

Ferroelectric Properties of PZT Thin Films by RF-Magnetron sputtering (RF 마그네트론 스퍼터링 법을 이용한 PZT 박막의 강유전 특성)

  • Park, Young;Joo, Pil-Yeoun;Yi, Ju-Sin;Song, Jun-Tae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.05a
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    • pp.341-344
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    • 1999
  • The effects of post annealing treatments of ferroelectrlclty in PZT(P $b_{1.05}$(Z $r_{0.52}$, $Ti_{0.48}$) $O_3$ thin film deposited on Pt/ $SiO_2$/Si substrate by RF-Magnetron sputtering methode was Investigated. Analyses by RTA(Rapid Thermal Annealing) treatments reveled that the crystallization process strongly depend on the healing temperature. The Perovskite structure with strong PZT (101) plan was obtained by RTA treatments at 75$0^{\circ}C$ With increasing RTA temperature of PZI thin films, the coercive field and remanent Polarization decreased, while saturation polarization( $P_{r}$) was decreased. P-E curves of Pt/PZT/Pt capacitor structures demonstrate typical hysteresiss loops. The measure values of $P_{r}$,. $E_{c}$ and dielectric constants by post annealed at 75$0^{\circ}C$ were 38 $\mu$C/$\textrm{cm}^2$ 35KV/cm and 974, respectively. Switching polarization versus fatigue characteristic showed 12% degradation up to 10$^{7}$ cycles.s.s.s.s.s.s.

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Fabrecation and Characterization of $SrBi_2TaNbO_9$ Ferroelectric Thin Film Prepared by Sol-Gel Method (SOL-GEL법을 이용한 $SrBi_2TaNbO_9$ 강유전성 박막 제조 및 특성 평가)

  • 이진한;박상준;장건익
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.94-98
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    • 2000
  • Polycrystalline SBTN ferroelectric thin films were prepared by sol-gel method with various Nb mole ratios on Pt/ $SiO_2$/Si (100) substrates. The films were annealed at different temperatures and characterized in terms of phase and microstructure. Relatively a well saturated hysteresis pattern was obtained at x =0.2 in S $r_{0.8}$B $i_{2.3}$(T $a_{1-x}$ N $b_{x}$)$_2$ $O_{9+}$$\alpha$/ thin films. At an applied voltage of 5V, the dielectric constant ($\varepsilon$$_{r}$) and dissipation factor (tan $\delta$) of typical S $r_{0.8}$B $i_{2.3}$(T $a_{1-x}$ N $b_{x}$)$_2$ $O_{9+}$$\alpha$/ thin film (x=0.2) were about 236.2 and 0.034. Measured remanent polarization (2Pr) and coercive field (Ec) were 4.28C/c $m_2$, and 38.88kv/cm respectively. No fatigue was observed up to 6$\times$10$_{10}$ switching cycles at 5V and the normalized polarization reduced by a factor of only 4%.%. 4%.%. 4%.%.%.%.%.

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Study on the Poling Conditions of PZT Ceramics with $MnO_2$ additive (압전 세라믹 PZT에 첨가된 $MnO_2$가 분극조건에 미치는 영향)

  • Choi, H.I.;Lee, J.H.;SaGong, G.
    • Proceedings of the KIEE Conference
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    • 1991.07a
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    • pp.247-250
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    • 1991
  • In this paper, we have investigated the poling conditons depending upon the electric field and temperature for PZT ceramics with various stoichiometry prepared by wet direct method, and $MnO_2$ dopant. The electric field required for saturation polarization was plotted against temperature $(1,000/T^{\circ}K)$ so that the required field could be estimated at any given temperature by measuring the charge displaced during poling. From this curve it should be possible to predict the field required to produce maximum domain switching at temperature below the Curie temperature, when $MnO_2$ dopant was added to the PZT ceramics, the electric field required for saturation polarization was lowered than that of undoped PZT samples.

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Structural and Electrical Properties of (Ba,Sr)$TiO_3$[BST] Thin Films with Ar/$O_2$ ratio (Ar/$O_2$ 비에 따른 (Ba,Sr)$TiO_3$ 박막의 구조 및 전기적 특성)

  • 신승창;이문기;류기원;배선기;이영희
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1998.11a
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    • pp.243-246
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    • 1998
  • (Ba, Sr)TiO$_3$[BST] thin films were fabricated on Pt/SiO$_2$/Si substrate by RF sputtering technique. The structural, dielectric and electrical properties of BST thin films were investigated with Ar/O$_2$ ratio. Dielectric constant and dielectric loss of the BST thin film were about 1020 and 2.0[%], respectively. (at RF power 80W, post annealing temperature $650^{\circ}C$, deposition pressure of 5mTorr and Ar/O$_2$=80/20). For the BST(Ar/O$_2$=80/20) thin film with Polarization switching cycles of 10$^{10}$ , remanent polarization and coercive field were 0.084[$\mu$C/cm$^2$], 1.954[kV/cm], respectively.

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Dielectric properties of $Bi_{3.25}La_{0.75}Ti_3O_{12}$ thin films with Bi contents (Bi 첨가량에 따른 BLT 박막의 유전특성)

  • 김경태;김창일;강동희;심일운
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07a
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    • pp.371-374
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    • 2002
  • Bismuth lanthanum titanate thin films with excess Bi contents were prepared onto Pt/Ti/$SiO_2$/Si substrate by metalorganic decomposition (MOD) technique. The structure and morphology of the films were analyzed using X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. From the XRD analysis, BLT thin films show polycrystalline structure and the layered-perovskite phase was obtained over 10% excess of Bi contents. As a result of ferroelectric characteristics related to the Bi content of the BLT thin film, the remanent polarization and dielectric constant decreased with increasing over Bi content of 10 % excess. The BLT film with Bi content of 10% excess was measured to have a dielectric constant of n9 and dielectric loss of 1.85[%]. The BLT thin films showed little polarization fatigue test up to 3.5 x $10^{9}$ bipolar switching cycling.

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