1 |
S. O. Chung, H. C. Lee, and W. J. Lee, 'Effects of electrodes on the electric properties of Pb(Zr,Ti) films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition', Jpn. J. Appl. Phys., Vol. 39, No. 3A, p. 1203, 2000
DOI
|
2 |
K. M. Byun, J. W. Kim, and W. J. Lee, 'Theoretical composition calibration and thickness measurement in the analysis of multielement thin films using wavelength dispersive spectroscopy: applications to lead zirconate titanate thin films', Jpn. J. Appl. Phys., Vol. 36, No. 9AB, p. L1242, 1997
|
3 |
T. Tsurumi, Y. Kumano, N. Ohashi, T. Takenaka, and O. Fukunaga, '90 domain reorientation and electric-field-induced strain of tetragonal lead zirconate titanate ceramics', Jpn. J. Appl. Phys., Vol. 36, No. 9B, p. 5970, 1997
|
4 |
X. Du and I. W. Chen, 'Fatigue of ferroelectric thin films', J. Appl. Phys., Vol. 83, No. 12, p. 7789, 1998
|
5 |
S. O. Chung, J. W. Kim, G. H. Kim, C. O. Park, and W. J. Lee, 'Formation of a lead zirconate titanate (PZT)/Pt interfacial layer and structural changes in the Pt/Ti/ /Si substrate during the deposition of PZT thin film by electron cyclotron resonance plasma-enhanced chemical vapor deposition', Jpn. J. Appl. Phys., Vol. 36, No. 7A, p. 4386, 1997
|
6 |
H. M. Duiker, P. D. Beale, J. F. Scott, C. A. paz de Araujo, B. M. Melnick, J. D. Cuchioaro, and L. D. McMillan, 'Fatigue and switching in ferroelectric memories: Theory and experiment', J. Appl. Phys, Vol. 68, No. 11, p. 5783, 1990
|
7 |
W. L. Warren, D. Dimos, B. A. Tuttle, R. D. Nasby, and G. E. Pike, 'Electronic domain pinning in Pb(Zr,Ti) thin films and its role in fatigue', Appl. Phys. lett., Vol. 65, No.8, p. 1018, 1994
DOI
ScienceOn
|
8 |
D. Ricinschi and M. Okuyama, 'Relationships between macroscopic polarization hysteresis and local piezoresponse of fatigued Pb(Zr,Ti) films within a Landau theory-based lattice model', Appl. Phys. Lett., Vol. 81, No. 21, p. 4040, 2002
|
9 |
H, Funakubo, T. Hioki, M. Otsu, K. Shinizaki, and N. Mizutani, 'Film thickness dependence of dielectric property and crystal structure of film prepared on Pt/ /Si substrate by metal organic chemical vapor deposition', Jpn. J. Appl. Phys., Vol. 32, No. 9B, p. 4175, 1993
|
10 |
T. Hase, T. Noguchi, K. Takenura, and Y. Miyasaka, 'Imprint characteristics of thin films with modified Sr composition', Jpn. J. Appl. Phys., Vol. 37, No. 9B, p. 5198, 1998
|
11 |
A. Jiang, M. Dawber, J. F. Scott, C. Wang, P. Migliorato, and M. Gregg, 'Studies of switching kinetics in ferroelectric thin films', Jpn. J. Appl. Phys., Vol. 42, No. 11, p. 6973, 2003
|
12 |
B. S. Kawk, E. P. Boyd, and A. Erbil, 'Metalorganic chemical vapor deposition of thin films', Appl. Phys. Lett., Vol. 53, No. 18, p. 1702, 1988
DOI
|
13 |
S. O. Chung, J. W. Kim, S. T. Kim, G. H. Kim, and W. J. Lee, 'Microstructure and electric properties of the PZT thin films fabricated by ECR PECVD: the effects of an interfacial layer and rapid thermal annealing', Mat. Chem. & Phys., Vol. 53, No.1, p. 60, 1998
|