• 제목/요약/키워드: photoemission spectroscopy

검색결과 167건 처리시간 0.03초

Spectroscopic Studies of TP6F PI Switched by Hole-Injection

  • 이경재;임규욱;김동민;이문호;강태희;정석민
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제40회 동계학술대회 초록집
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    • pp.297-298
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    • 2011
  • Metal/poly (4,4'-aminotriphen-ylene hexafluoroisopropylidenediphthalimide) (TP6F PI)/metal structure exhibited an electrically volatile phase transition with high (OFF) or low (ON) resistive states when voltage between electrodes swept. Here, we demonstrate a noble set-up in which holes are injected by photoelectron emission process during the voltage sweep instead of direct charge carrier injection via metal electrode, which enables direct investigation into changed electronic structures of TP6F PI both in ON and OFF states using photoemission spectroscopy methods. In the I-V measurement, TP6F PI shows a non-volatile behavior. In spectroscopic results, this non-volatile behavior is leaded from the structural modification of the O=C double bond in phthalimide of TP6F PI by hole injection.

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A review on angle resolved photoemission spectroscopy studies of Fe-based superconductors

  • Seo, J.J.;Kim, C.
    • 한국초전도ㆍ저온공학회논문지
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    • 제16권2호
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    • pp.7-19
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    • 2014
  • Since the discovery of iron-based superconductors in 2008, extensive and intensive studies have been performed to find the microscopic theory for the high temperature superconductivity in the materials. Electronic structure is the basic and essential information that is needed for the microscopic theory. Experimentally, angle resolved photoelectron spectroscopy (ARPES) is the most direct tool to obtain the electronic structure information, and therefore has played a vital role in the research. In this review, we review what has been done so far and what is needed to be done in ARPES studies of iron-based superconductors in search of the microscopic theory. This review covers issues on the band structure, orbital order/fluctuation, and gap structure/symmetries as well as some of the theories.

Photoemission study f valence stated in Eu chalcogenides

  • Hoon Koh;Park, Won-Go;Oh, S.J.
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2000년도 제18회 학술발표회 논문개요집
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    • pp.166-166
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    • 2000
  • We studied electronic structure of magnetic semiconductors EuO, EuS, and EuTe. The photoemission spectra show localized Eu 4f states and broad anion p bands. As the size of anion increases from oxygen to tellurium, anion p band width increases and eventually overlaps Eu 4f states. Hence in EuO and EuS, Eu 4f states are the highest occupied stated lying above anion p band, while Te 5p band spreads widely over Eu 4f states to become valence band maximum in EuTe. It was also observed that Eu 4f states have width of 0.7eV and dispersion of 0.2eV in EuS by angle resolved photoemission spectroscopy. The width of the 4f spectra mainly originates from atomic multiplets, but the much larger dispersion than that of Eu metal is due to p-f mixing.

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Charge Transfer Mechanism of Electrically Bistable Switching Devices based on Polyimide

  • 이경재;임규욱;김동민;이문호;강태희;정석민
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.374-374
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    • 2010
  • Charge transfer mechanism of poly(4,4'-aminotriphenylene hexafluoroisopropylidenediphthalimide) (TP6F PI) which exhibits bistable ON and OFF switching has been studied using photoemission electron spectroscopy (PES) and near-edge x-ray absorption fine structure (NEXAFS). Here, we demonstrate novel set-up in which holes are injected by photoemission process instead of direct charge carrier injection via metal electrode. The accumulated charges on the PI surface in the OFF state abruptly flow across the PI film when the bias voltage of a back electrode reaches a specific value, indicating that the film is changed to the ON state. Core level and x-ray absorption spectra probed at charge injection region via photoemission process do not show any evidences implying structural modification of TP6F PI during the phase change. Whereas, in valence band spectra, the highest occupied molecular orbital (HOMO) is shifted toward Fermi level, responsible for improved hole-mobility of TP6F PI of ON state.

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In-situ Synchrotron Radiation Photoemission Spectroscopy Study of Atomic Layer Deposition of $Ta_2O_5$ film on Si Substrate with Ta(NtBu)(dmamp)$_2Me$ and $H_2O$

  • Lee, Seung Youb;Jung, Woosung;Kim, Yooseok;Kim, Seok Hwan;An, Ki-Seok;Park, Chong-Yun
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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    • pp.619-619
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    • 2013
  • The interfacial state between $Ta_2O_5$ and a Si substrate during the growth of $Ta_2O_5$ films by atomic layer deposition (ALD) was investigated using in-situ synchrotron radiation photoemission spectroscopy (SRPES). A newly synthesized liquid precursor Ta($N^tBu$) $(dmamp)_2Me$ was used as the metal precursor, with Ar as a purging gas and $H_2O$ as the oxidant source. After each half reaction cycle, samples were analyzed using in-situ SRPES under ultrahigh vacuum at room temperature. SRPES analysis revealed that Ta suboxide and Si dioxide were formed at the initial stages of $Ta_2O_5$ growth. However, the Ta suboxide states almostdisappeared as the ALD cycles progressed. Consequently, the $Ta^{5+}$ state, which corresponds with the stoichiometric $Ta_2O_5$, only appeared after 4.0 cycles. Additionally, tantalum silicate was not detected at the interfacial states between $Ta_2O_5$ and Si. The measured valence band offset between $Ta_2O_5$ and the Si substrate was 3.22 eV after 3.0 cycles.

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단결정 그라핀 위에서의 퓨란의 고리모양 형성 (Ring Formation of Furan on Epitaxial Graphene)

  • 김기정;양세나;박영찬;이한구;김봉수;이한길
    • 한국진공학회지
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    • 제20권4호
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    • pp.252-257
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    • 2011
  • 본 연구 그룹은 6H-SiC (0001)에서 성장시킨 그라핀 층에 흡착된 퓨란(furan)의 고리 형성과 전자적 성질을 원자 힘 현미경(Atomic Force Microscope : AFM), C K-edge에 대한 Near Edge X-ray Absorption Fine Structure (NEXAFS) 스펙트럼, 핵심부 준위 광전자 분광스펙트럼(Core-level Photoemission Spectroscopy : CLPES)을 이용하여 연구했다. 우리는 그라핀위에 흡착된 퓨란 분자들이 화학적 도핑이 가능한 산소기의 홀 전자쌍을 통하여 그라핀의 특성을 조절할 수 있는 화학적 기능화에 이용될 수 있다는 것을 알아냈다. 또한, 퓨란이 자발적으로 세 가지의 다른 결합 구조들 중 하나로 고리를 형성한다는 것과 그라핀 위에 퓨란에 의해 형성된 고리의 전자적 성질들이 AFM, NEXAFS, CLPES를 이용하여 각각 설명될 수 있다는 것을 보여주었다.

In Situ X-ray Photoemission Spectroscopy Study of Atomic Layer Deposition of $TiO_2$ on Silicon Substrate

  • Lee, Seung-Youb;Jeon, Cheol-ho;Kim, Yoo-Seok;Kim, Seok-Hwan;An, Ki-Seok;Park, Chong-Yun
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제41회 하계 정기 학술대회 초록집
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    • pp.222-222
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    • 2011
  • Titanium dioxide (TiO2) has a number of applications in optics and electronics due to its superior properties, such as physical and chemical stability, high refractive index, good transmission in vis and NIR regions, and high dielectric constant. Atomic layer deposition (ALD), also called atomic layer epitaxy, can be regarded as a special modification of the chemical vapor deposition method. ALD is a pulsed method in which the reactant vapors are alternately supplied onto the substrate. During each pulse, the precursors chemisorb or react with the surface groups. When the process conditions are suitably chosen, the film growth proceeds by alternate saturative surface reactions and is thus self-limiting. This makes it possible to cover even complex shaped objects with a uniform film. It is also possible to control the film thickness accurately simply by controlling the number of pulsing cycles repeated. We have investigated the ALD of TiO2 at 100$^{\circ}C$ using precursors titanium tetra-isopropoxide (TTIP) and H2O on -O, -OH terminated Si surface by in situ X-ray photoemission spectroscopy. ALD reactions with TTIP were performed on the H2O-dosed Si substrate at 100$^{\circ}C$, where one cycle was completed. The number of ALD cycles was increased by repeated deposition of H2O and TTIP at 100$^{\circ}C$. After precursor exposure, the samples were transferred under vacuum from the reaction chamber to the UHV chamber at room temperature for in situ XPS analysis. The XPS instrument included a hemispherical analyzer (ALPHA 110) and a monochromatic X-ray source generated by exciting Al K${\alpha}$ radiation (h${\nu}$=1486.6 eV).

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