Characterization of indium tin oxide surfaces and interfaces using low intensity x-ray photoemission spectroscopy

  • Lee, Yeon-Jin ;
  • Lyon, J.E. (University of South Florida) ;
  • Beerbom, M.M. (University of South Florida) ;
  • Schlar, R. (University of South Florida)
  • 이연진 (한국표준과학연구원) ;
  • ;
  • ;
  • Published : 2007.08.15