• Journal of the Optical Society of Korea
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• 제16권3호
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• pp.263-269
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• 2012

In this paper, we propose a new dual optical encryption method for binary data and secret key based on 2-step phase-shifting digital holography for a cryptographic system. Schematically, the proposed optical setup contains two Mach-Zehnder type interferometers. The inner interferometer is used for encrypting the secret key with the common key, while the outer interferometer is used for encrypting the binary data with the same secret key. 2-step phase-shifting digital holograms, which result in the encrypted data, are acquired by moving the PZT mirror with phase step of 0 or ${\pi}/2$ in the reference beam path of the Mach-Zehnder type interferometer. The digital hologram with the encrypted information is a Fourier transform hologram and is recorded on CCD with 256 gray level quantized intensities. Computer experiments show the results to be encryption and decryption carried out with the proposed method. The decryption of binary secret key image and data image is performed successfully.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1996년도 추계학술대회 논문집
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• pp.459-463
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• 1996

The lateral-shearing interferometer specially devised for production line inspection lenses is presented. The interferometer is composed with immersion oil and four prisms whose relative sliding motion provide lateral-shearing and phase-shifting. A special phase-measuring algorithm of a-bucket is adopted to compensate the phase-shifting error caused by the thickness reduction in the immersion oil Three different algorithm for determinating quantitative aberration of aspherical lenses are presented and compared with one another.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2013년도 춘계학술대회 논문집
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• pp.1079-1080
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• 2013

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2001년도 춘계학술대회 논문집
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• pp.110-113
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• 2001

We present an interferometer system, which is able to perform both the phase shifting interferometry and white light interferometry. The interferometer system uses a d.c. motor to control the probe position with an accuracy of 10nm, which shows an outstanding performance on white light interferometry. However, the moving mechanism of d.c. motor is not accurate enough for the phase shifting interferometry that requires a moving precision less than 1 nm. We therefore propose a Fourier transform technique to calculate the phase of interferograms, which is strongly resistant to calibration errors and external vibration. Experimental results show that the Fourier transform technique is capable of reducing the measurement error caused by inaccurate movement within 0.1nm.

• Current Optics and Photonics
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• 제2권5호
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• pp.474-481
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• 2018

We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.

• 한국광학회지
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• 제14권4호
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• pp.392-398
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• 2003

구면 거울을 정밀하고 정확하게 측정할 수 있는 위상천이 회절격자 간섭계를 제시한다. 간섭계는 하나의 회절격자를 이용하여 간섭계의 기준광과 측정광을 분할하고, 다시 결합시켜 간섭무늬를 생성시키고 위상천이 시키는 간단한 구조로 설계되었다. 광원으로부터의 광을 큰 수치구경인 고정도의 집속렌즈의 초점에 위치한 회절격자 위에 집속하여 반사회절된 파면을 기준파면과 측정파면으로 사용한다 부가적인 기준면이 없이 회절격자 위의 매우 작은 영역이 기준면을 대신하므로 시스템 오차가 작다. 광섬유 형태의 공초점현미경 구조를 광원과 집속렌즈 사이에 설치하여 집속렌즈와 회절격자사이의 정렬오차를 최소화 하였다. 회절격자를 광축에 수직한 방향으로 이송함으로써 기준파면과 측정파면사이에 상대적인 위상천이를 일으켜서 일련의 위상천이된 간섭무늬를 쉽게 획득할 수 있다. 간섭계를 제작하고, 결상렌즈와 CCD를 이용해서 얻은 위상천이된 대상구면 거울의 간섭무늬들을 해석하여 전체적인 간섭계 시스템의 성능을 평가해 보았다.

• Journal of the Optical Society of Korea
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• 제16권4호
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• pp.354-364
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• 2012

In this paper, a new 2-step quadrature phase-shifting digital holographic optical encryption method using orthogonal polarization is proposed and tolerance errors for this method are analyzed. Unlike the conventional technique using a PZT mirror, the proposed optical setup comprises two input and output polarizers, and one ${\lambda}$/4-plate retarder. This method makes it easier to get a phase shift of ${\pi}$/2 without using a mechanically driven PZT device for phase-shifting and it simplifies the 2-step phase-shifting Mach-Zehnder interferometer setup for optical encryption. The decryption performance and tolerance error analysis for the proposed method are presented. Computer experiments show that the proposed method is an alternate candidate for 2-step quadrature phase-shifting digital holographic optical encryption applications.

• 비파괴검사학회지
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• 제25권2호
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• pp.67-73
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• 2005

레이저 간섭계를 이용하여 수백 나노미터 정도의 박막 두께를 측정하였다. 마흐-젠더 간섭계로 실험장치를 구성하고 위상이동법을 통해 박막을 투과할 때 생기는 위상지연을 측정하였다. 광휘 상관 모델을 적용하여 위상 이동법의 단점인 위상이동 오차가 보정된 위상도를 측정하였다. 기존에는 고려되지 않았던 공간적 위상 이동오차를 보정하기 위하여 최소자승법을 이용하여 위상 기준면을 추정하였다. 이 방법으로 미세한 위상지연을 측정해야 하는 100nm $Si_3N_4$ 박막시료의 두께를 5nm의 정밀도로 측정할 수 있었다.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2009년도 추계학술대회 논문집
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• pp.69-70
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• 2009

• Journal of the Optical Society of Korea
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• 제10권4호
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• pp.178-183
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• 2006

An in-line phase-shifting digital holographic microscopy system was constructed by inserting a conventional microscope in the object arm of a Mach-Zehnder interferometer. It was used to measure the three dimensional shape of a micro Fresnel lens. It was also shown that both the lateral and the axial resolutions of the in-line phase-shifting system using a self-calibration algorithm were superior to those of the best off-axis system.