• Title/Summary/Keyword: pass transistor

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LDO Regulator with Improved Fast Response Characteristics and Push-Pull Detection Structure (Push-Pull Detection 구조 및 빠른 응답 특성을 갖는 LDO 레귤레이터)

  • Lee, Joo-Young
    • Journal of IKEEE
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    • v.25 no.1
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    • pp.201-205
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    • 2021
  • In this paper present Low Drop-Out (LDO) regulator that improved load transient characteristics due to the push-pull detection structure. The response characteristic of the voltage delta value is improved due to the proposed push-pull sensing circuit structure between the input terminal of the LDO regulator pass transistor and the output terminal of the internal error amplifier. Voltage value has improved load transient characteristics than conventional LDO regulator. Compared to the conventional LDO regulator, it has an improved response speed of approximately 244 ns at rising time and approximately 90 ns at falling time. The proposed circuit was simulated by the samsung 0.13um process using Cadence's Specter and Virtuoso simulator.

A Study on the Design of ESD Protection Circuit for Prevention of Destruction and Efficiency of LDO Regulator (LDO 레귤레이터의 파괴방지 및 효율성을 위한 ESD 보호회로 설계에 대한 연구)

  • Jeong-Min Lee;Sang-Wook Kwon;Seung-Hwan Baek;Yong-Seo Koo
    • Journal of IKEEE
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    • v.27 no.3
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    • pp.258-264
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    • 2023
  • This paper proposes an LDO regulator with a built-in ESD (Electro Static Discharge) protection circuit to effectively operate and prevent destruction of the LDO (Low Drop Out) regulator according to the load current. The proposed LDO regulator can more effectively adjust the gate node voltage of the pass transistor according to the output voltage of the LDO regulator by using an additional feedback current circuit structure. In addition, it is expected to have high reliability for the ESD situation by embedding a new structure that increases the holding voltage by about 2V by reducing the current gain on the SCR loop by adding a P+ bridge to the existing ESD protection device.

LDO Regulator with Improved Transient Response Characteristics and Load Transient Detection Structure (Load Transient Detection 구조 및 개선된 과도응답 특성을 갖는 LDO regulator)

  • Park, Tae-Ryong
    • Journal of IKEEE
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    • v.26 no.1
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    • pp.124-128
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    • 2022
  • Conventional LDO regulator external capacitors can reduce transient response characteristics such as overshoot and undershoot. However, the capacitorless LDO regulator proposed in this study applied body technology to the pass transistor to improve the transient response and provide excellent current drive capability. The operating conditions of the proposed LDO regulator are set to an input voltage that varies from 3.3V to 4.5V, a maximum load current of 200mA, and an output voltage of 3V. As a result of the measurement, it was found that when the load current was 100 mA, the voltage was 95 mV in the undershoot state and 105 mV in the overshoot state.

Design of Low-Noise and High-Reliability Differential Paired eFuse OTP Memory (저잡음 · 고신뢰성 Differential Paired eFuse OTP 메모리 설계)

  • Kim, Min-Sung;Jin, Liyan;Hao, Wenchao;Ha, Pan-Bong;Kim, Young-Hee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.17 no.10
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    • pp.2359-2368
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    • 2013
  • In this paper, an IRD (internal read data) circuit preventing the reentry into the read mode while keeping the read-out DOUT datum at power-up even if noise such as glitches occurs at signal ports such as an input signal port RD (read) when a power IC is on, is proposed. Also, a pulsed WL (word line) driving method is used to prevent a DC current of several tens of micro amperes from flowing into the read transistor of a differential paired eFuse OTP cell. Thus, reliability is secured by preventing non-blown eFuse links from being blown by the EM (electro-migration). Furthermore, a compared output between a programmed datum and a read-out datum is outputted to the PFb (pass fail bar) pin while performing a sensing margin test with a variable pull-up load in consideration of resistance variation of a programmed eFuse in the program-verify-read mode. The layout size of the 8-bit eFuse OTP IP with a $0.18{\mu}m$ process is $189.625{\mu}m{\times}138.850{\mu}m(=0.0263mm^2)$.

Design and Implementation of a Fault Simulation System for Mixed-level Combinational Logic Circuits (혼합형 조합 회로용 고장 시뮬레이션 시스템의 설계 및 구현)

  • Park, Yeong-Ho;Son, Jin-U;Park, Eun-Se
    • The Transactions of the Korea Information Processing Society
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    • v.4 no.1
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    • pp.311-323
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    • 1997
  • This paper presents a fast fault simulation system for detecting stuck-at faults in mixed-level combinational logic circuits with gale level and switch -level primitives. For a practical fault simulator, the types are not restricted to static switch-level and/or gate-level circuits, but include dynamic switch-level circuits. To efficiently handle the multiple signal contention problems at wired logic elements, we propose a six-valued logic system and its logic calculus which are used together with signal strength information. As a basic algorithm for the fault simulation process, a well -known gate-level parallel pattern single fault propagation(PPSFP) technique is extended to switch-level circuits in order to handle pass-transistor circuits and precharged logic circuits as well as static CMOS circuits. Finally, we demonstrate the efficiency of our system through the experimental results for switch-level ISCAS85 benchmark combinational circuits and various industrial mixed-level circuits.

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Implementation of Down Converter for Ku-Band Application (Ku 대역용 주파수변환기의 구현)

  • 정동근;김상태;하천수
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.4 no.3
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    • pp.527-536
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    • 2000
  • This paper discusses the design of self-oscillating mixer type low noise down converter using the microwave field effect transistor. The mixer is consists of local oscillator in which high stability dielectric resonator and band pass filter to get rid of spurious oscillation at intermediate frequency stage. The microstrip antenna was integrated in the same substrate which generate 12.3GHz and low noise amplifier was also added after antenna using 3 stage of high electron mobility transistors. The output frequency from the local oscillator was chosen as 11.3GHz for the Ku-band application. The measured phase noise was -804dBc/Hz at 100kHz offset frequency, and the gain was 7~12dB in frequency range from 12.0GHz to 12.7GHz. The noise figure at intermediate frequency stage was 64H. The designed model shows less conversion loss than previous diode type mixer. The proposed mixer can be used in digital satellite broadcasting and communication system and expected to use in next generation low noise block design.

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Implementation of a 13.56 MHz 5kW RF Generator for ISM Band Applications (ISM 대역 응용분야에 사용되는 13.56 MHz 5kW RF 제너레이터 구현)

  • Yoon, Young-Chul;Kim, Young
    • Journal of Advanced Navigation Technology
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    • v.20 no.6
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    • pp.556-561
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    • 2016
  • This paper describes implementation of a 13.56 MHz, 5 kW RF high power generator for ISM band applications. This RF generator consists of four LDMOS modules of 1.25kW class-AB push-pull power amplifier with drive amplifier and its outputs are combined by using Wilkinson type transmission-line transformers. Its generator has a high efficiency and output power better than linearity. In order to discharge power transistor heats, we used on water cooled copper plate. Also, these have a composite circuit of combiner and low-pass filter and safety circuit to detector over and reflected power. The RF generator has achieved a efficiency of 79 % at 5.33 kW of saturated power level experimentally.

A Design of Wide-Bandwidth LDO Regulator with High Robustness ESD Protection Circuit

  • Cho, Han-Hee;Koo, Yong-Seo
    • Journal of Power Electronics
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    • v.15 no.6
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    • pp.1673-1681
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    • 2015
  • A low dropout (LDO) regulator with a wide-bandwidth is proposed in this paper. The regulator features a Human Body Model (HBM) 8kV-class high robustness ElectroStatic Discharge (ESD) protection circuit, and two error amplifiers (one with low gain and wide bandwidth, and the other with high gain and narrow bandwidth). The dual error amplifiers are located within the feedback loop of the LDO regulator, and they selectively amplify the signal according to its ripples. The proposed LDO regulator is more efficient in its regulation process because of its selective amplification according to frequency and bandwidth. Furthermore, the proposed regulator has the same gain as a conventional LDO at 62 dB with a 130 kHz-wide bandwidth, which is approximately 3.5 times that of a conventional LDO. The proposed device presents a fast response with improved load and line regulation characteristics. In addition, to prevent an increase in the area of the circuit, a body-driven fabrication technique was used for the error amplifier and the pass transistor. The proposed LDO regulator has an input voltage range of 2.5 V to 4.5 V, and it provides a load current of 100 mA in an output voltage range of 1.2 V to 4.1 V. In addition, to prevent damage in the Integrated Circuit (IC) as a result of static electricity, the reliability of IC was improved by embedding a self-produced 8 kV-class (Chip level) ESD protection circuit of a P-substrate-Triggered Silicon Controlled Rectifier (PTSCR) type with high robustness characteristics.

A New Design of High-Speed 1-Bit Full Adder Cell Using 0.18${\mu}m$ CMOS Process (0.18${\mu}m$ CMOS 공정을 이용한 새로운 고속 1-비트 전가산기 회로설계)

  • Kim, Young-Woon;Seo, Hea-Jun;Cho, Tae-Won
    • Journal of IKEEE
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    • v.12 no.1
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    • pp.1-7
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    • 2008
  • With the recent development of portable system such as mobile communication and multimedia. Full adders are important components in applications such as digital signal processors and microprocessors. Thus It is important to improve the power dissipation and operating speed for designing a full adder. We propose a new adder with modified version of conventional Ratioed logic and Pass Transistor logic. The proposed adder has the advantages over the conventional CMOS, TGA, 14T logic. The delay time is improved by 13% comparing to the average value and PDP(Power Delay Product) is improved by 9% comparing to the average value. Layouts have been carried out using a 0.18um CMOS design rule for evaluation purposes. The physical design has been evaluated using HSPICE.

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Differential LC VCO with Enhanced Tank Structure and LC Filtering Techniques in InGaP/GaAs HBT Technology (InGaP/GaAs HBT 공정을 이용하여 향상된 탱크 구조와 LC 필터링 기술을 적용한 차동 LC 전압 제어 발진기 설계)

  • Lee, Sang-Yeol;Kim, Nam-Young
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.18 no.2 s.117
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    • pp.177-182
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    • 2007
  • This paper presents the InGaP/GaAs HBT differential LC VCO with low phase noise performance for adaptive feedback interference cancellation system(AF-lCS). The VCO is verified with enhanced tank structure including filtering technique. The output tuning range for proposed VCO using asymmetric inductor and symmetric capacitors withlow pass filtering technique is 207 MHz. The output powers are -6.68 including balun and cable loss. The phase noise of this VCO at 10 kHz, 100 kHz and 1 MHz are -102.02 dBc/Hz, -112.04 dBc/Hz and -130.40 dBc/Hz. The VCO is designed within total size of $0.9{\times}0.9mm^2$.