• 마이크로전자및패키징학회지
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• 제17권4호
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• pp.19-26
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• 2010

포화 수증기압이 고출력 형광체 변환 백색 LED 패키지의 열화현상에 미치는 주요 스트레스 인자임을 확인하였다. 또한 LED 패키지의 가속 수명시험을 통하여 포화 수증기압이 효과적인 가속 스트레스 인자임을 확인하였다. 실험조건은 350 mA 전류를 인가한 것과 인가하지 않은 2가지 조건에 대해 $121^{\circ}C$, 100% R.H. 환경에서 최대 168 시간동안 진행하였다. 실험결과 두 실험 모두 광 출력 감소, 스펙트럼 세기의 감소, 누설전류 및 열 저항이 증가하였다. 고장분석 결과 광 특성의 열화는 봉지재의 변색과 기포에 의해 발생한 것으로 나타났다. LED 패키지의 변색과 흡습에 의해 유발되는 기계적 (hygro-mechanical) 스트레스에 의한 기포 발생은 패키지 열화의 중요한 인자로써, 포화 수증기압이 고출력 LED의 수명시험 시간을 단축하기 위한 스트레스 인자로 적합함을 알 수 있었다.

• 한국전기전자재료학회논문지
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• 제31권2호
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• pp.122-127
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• 2018

In an attempt to estimate the life projection of LED packages, IESNA published a paper regarding an LED package measurement test method in 2008, and a life projection technical document in 2011, to be used for LED life estimation. IESNA's publications regarding LED package measurement methods were functional, but they were not internationally standardized before 2017. In order to develop a standardized method, the International Standard chose to use the LM-80 as a measurement method for LED life projection in their publication in 2017. Many projection methods have been discussed by the IEC Technical Committee 34 working group, including the method using an exponential function, which reflects lumen degradation characteristics well. This study is designed to explore alternative LED package life estimation methods using an exponential function with statistical analysis, other than the one suggested by the International Standard.

• 대한산업공학회지
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• 제40권3호
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• pp.257-266
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• 2014

The semiconductor manufacturing industry is managed by a number of parameters from the FAB which is the initial step of production to package test which is the final step of production. Various methods for prediction for the quality and yield are required to reduce the production costs caused by a complicated manufacturing process. In order to increase the accuracy of quality prediction, we have to extract the significant features from the large amount of data. In this study, we propose the method for extracting feature from the cell level data of probe test process using OPTICS which is one of the density-based clustering to improve the prediction accuracy of the quality of the assembled chips that will be placed in a package test. Two features extracted by using OPTICS are used as input variables of quality prediction model because of having position information of the cell defect. The package test progress for chips classified to the correct quality grade by performing the improved prediction method is expected to bring the effect of reducing production costs.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2006년도 SMT/PCB 기술세미나
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• pp.139-151
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• 2006

[ $\bullet$ ] 3D is proliferating in all package types $\bullet$ Thin packages challenge all assembly technologies $\bullet$ Package assembly and test are closely coupled and design for testability is imperative to success

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2007년도 SMT/PCB 기술세미나
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• pp.37-47
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• 2007

Factor : Structure Metal pad & SMO size Board level TC test : - Large SMO size better Board level Drop test : - Large SMO size better Factor : Structure Substrate thickness Board level TC test : - Thick substrate better Board level Drop test : - Substrate thickness is not a significant factor for drop test Factor : Material Solder alloy Board level TC test : - Not so big differences over Pb-free solder and NiAu, OSP finish Board level Drop test : - Ni/Au+SAC105, CuOSP+LF35 are better Factor : Material Pad finish Board level TC test : - NiAu/NiAu is best Board livel Drop test : - CuOSP is best Factor : Material Underfill Board level TC test - Several underfills (reworkable) are passed TCG x500 cycles Board level Drop test : - Underfill lots have better performance than non-underfill lots Factor : Process Multiple reflow Board level TC test : - Multiple reflow is not a significant actor for TC test Board level Drop test : N/A Factor : Process Peak temp Board level TC test : - Higher peak temperature is worse than STD Board level Drop test : N/A Factor : Process Stack method Board level TC test : - No big difference between pre-stack and SMT stack Board level Drop test : - Flux dipping is better than paste dipping but failure rate is more faster

• 대한금속재료학회지
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• 제46권5호
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• pp.310-314
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• 2008

Electromigration test of flip chip solder bump is performed at $140^{\circ}C$ C and $4.6{\times}10^4A/cm^2$ conditions in order to compare electromigration with thermomigration behaviors by using electroplated Sn-3.5Ag solder bump with Cu under-bump-metallurgy. As a result of measuring resistance with stressing time, failure mechanism of solder bump was evaluated to have four steps by the fail time. Discrete steps of resistance change during electromigration test are directly compared with microstructural evolution of cross-sectioned solder bump at each step. Thermal gradient in solder bump is very high and the contribution of thermomigration to atomic flux is comparable with pure electromigration effect.

• 소음진동
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• 제4권3호
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• pp.345-352
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• 1994

Electronic products can be subjected to many different forms of shock. These shocks are usually experienced during transporting the electronic products from a manufacturer to customers. Drop tests are performed to test the product fragility before shipment. Package cushioning materials are often used to protect electronic products from severs shock environments. In the present paper, an algorithm to predict the shock responses of the main mechanical parts is developed by use of the shock analysis in which the modal parameters extracted from vibration test are used. These results are in good agreement with the results of drop test. By use of the shock response prediction algorithm developed herein, it is possible to predict the results of drop test at various drop directions and also to select the optimal package cushioning materials.

• 산업기술연구
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• 제24권A호
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• pp.9-15
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• 2004

The flexural strength from 3-point bend test and fatigue properties were measured to evaluate mechanical properties of metal/ceramic interface of the multilayer ceramic package produced through tape casting. From the results, the specimens with three electrode layers showed the highest strength. The temperature distribution with time during thermal cycle and thermal stresses with the change of electrode's shape have been estimated by mathematical modelling. Specimen affected by thermal shock, produced microcracks by the difference of thermal expansion coefficient. The results of tensile test and fatigue test showed the rupture at pin. The fact that the pin brazed specimens were always fractured at the pin proved the good bonding condition between pin and electrode.

• 마이크로전자및패키징학회지
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• 제15권1호
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• pp.7-18
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• 2008

This paper reviews the current development of an ultra-slim SiP for Radio Frequency (RF) application, in which three flip chips, additional passive components and Surface Acoustic Wave (SAW) filters are integrated side-by-side. A systematic investigation is carried out for the design optimization, process and reliability improvement of the package, which comprises several aspects: a design study based on the 3D thermo-mechanical finite element analysis of the packaging, the determination of stress, warpage distribution, critical failure zones, and the figuration of the effects of material properties, process conditions on the reliability of package. The optimized material sets for manufacturing process were determined which can reduce the number of testing samples from 75 to 2. In addition the molded underfilling (MUF) process is proposed which not only saves one manufacturing process, but also improves the thermo-mechanical performance of the package compared with conventional epoxy underfilling process. In the end, JEDEC's moisture sensitivity test, thermal cycle test and pressure cooker tests have also been carried out for reliability evaluation. The test results show that the optimized ultra-slim SiP has a good reliability performance.

• Journal of the Korean Data and Information Science Society
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• 제25권5호
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• pp.1039-1055
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• 2014

검정통계량의 영가설 분포는 모집단 분포에 의존하는데 모집단의 분포를 모를 때 영가설 분포를 검정통계량의 조건부 분포로 대체하여 검정하는 방법을 순열 검정이라고 한다. Strasser와 Weber (1999)는 순열 검정을 통합하는 이론을 마련하였고, Hothorn 등 (2006, 2008)은 그 이론을 R에 내장된 coin 패키지에 구현하였다. coin 패키지에서 조건부 독립성 검정은 총괄적인 형태의 함수인 independence test를 통해서 할 수 있지만 대표적인 독립성 검정은 사용자가 편리하도록 간편한 함수를 별도로 제공하고 있다. 본 논문에서는 Strasser와 Weber (1999)의 순열 검정 방법에 대해 소개하고, coin 패키지에 내장된 15개의 간편 함수에 대해 independence test 함수로 변환하는 절차를 설명하고자 한다. 또한, 정의한 independence test 함수를 써서 실제 자료의 점근 분포와 순열 검정, 정확 검정에 기초한 p-값을 서로 비교하고자 한다.