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Accelerated Degradation Stress of High Power Phosphor Converted LED Package  

Chan, Sung-Il (Reliability Physics Research Center, Korea Electronic Technology Institute)
Jang, Joong-Soon (Division of Industrial and Information System Engineering, Ajou University)
Publication Information
Journal of the Microelectronics and Packaging Society / v.17, no.4, 2010 , pp. 19-26 More about this Journal
Abstract
We found that saturated water vapor pressure is the most dominant stress factor for the degradation phenomenon in the package for high-power phosphor-converted white light emitting diode (high power LED). Also, we proved that saturated water vapor pressure is effective acceleration stress of LED package degradation from an acceleration life test. Test conditions were $121^{\circ}C$, 100% R.H., and max. 168 h storage with and without 350 mA. The accelerating tests in both conditions cause optical power loss, reduction of spectrum intensity, device leakage current, and thermal resistance in the package. Also, dark brown color and pore induced by hygro-mechanical stress partially contribute to the degradation of LED package. From these results, we have known that the saturated water vapor pressure stress is adequate as the acceleration stress for shortening life test time of LED packages.
Keywords
LED; Degradation; Stress factor;
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Times Cited By KSCI : 2  (Citation Analysis)
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