Nanotopography Simulation of Shallow Trench Isolation Chemical Mechanical Polishing Using Nano Ceria Slurry (나노 세리아 슬러리를 이용한 STI CMP에서 나노토포그라피 시뮬레이션)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2004.07a
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- pp.239-242
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- 2004